DLA MIL-PRF-19500 741 A VALID NOTICE 1-2013 Semiconductor Device Field Effect Radiation Hardened (Total Dose and Single Event Effects) Transistor Die N-Channel and PChannel Silicon.pdf

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1、PERFORMANCE SPECIFICATIONSemiconductor Device, Field Effect, Radiation Hardened (TotalDose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKCMIL-PRF-19500/741A, dated 30-Jan-2009, has been reviewed anddetermined to be valid for use in acquisiti

2、on.NOTICE OFVALIDATIONMETRICMIL-PRF-19500/741ANOTICE 106-Dec-2013NOTE: The activities above were interested in this document asof the date of this document. Since organizations andresponsibilities can change, you should verify the currency ofthe information above using the ASSIST Online database athttps:/assist.dla.mil.AMSC N/A FSC 5961Custodians:Army - CRNavy - ECAir Force - 85DLA - CCOther - NAPreparing Activity:DLA - CCProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

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