1、 PERFORMANCE SPECIFICATION CAPACITORS, FIXED, ELECTROLYTIC (ALUMINUM OXIDE), ESTABLISHED RELIABILITY AND NON-ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1. SCOPE. This specification
2、 covers the general requirements for established reliability (ER) and non-ER, aluminum oxide, electrolytic, fixed capacitors (see 6.1). Capacitors meeting the ER requirements of this specification have reliability established on the basis of life tests performed at rated voltage at 85C for failure r
3、ate (FR) levels ranging from 1.0 percent to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FR levels are established at a 60-percent confidence level and are maintained at a 10 percent producers risk. The level of reliability is identified by the following FR level symbols: Symb
4、ol FR Level (percent/1,000 hr) M 1.0 P 0.1 R 0.01 S 0.001 1.2 Classification. Capacitors covered by this specification are classified by the style, as specified (see 3.1). 1.2.1 Part of Identification Number (PIN) The PIN should be in the following form and as specified (see 3.1). M39018 /01 - 0001
5、M Performance Specification (see 1.2.1.1) Non-significant failure rate specification sheet dash number level/high number number freq vibration option (see 1.2.1.2) 1.2.1.1 Dash. Use “-“ for standard product or replace with “R“ for random vibration option (CUR13 and CUR17 only). 1.2.1.2 Failure Rate
6、Level or High Frequency Vibration. The failure rate level is identified by a single letter (M,P,R or S) as shown in scope (CUR styles only). An “H“ will indicate high frequency option for CU17 capacitors only or this character should be left blank. AMSC N/A FSC 5910 MIL-PRF-39018G 20 February 2009 S
7、UPERSEDING MIL-PRF-39018F 22 March 2006 INCH-POUND Comments, suggestions, or questions on this document should be addressed to: Defense Supply Center, Columbus, DSCC-VAT, Post Office Box 3990, Columbus, OH 43218-3990 or e-mailed to capacitorfilterdscc.dla.mil. Since contact information can change, y
8、ou may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil/quicksearch or http:/assist.daps.dla.mil . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-39018G 2 2. APPLICABLE DOC
9、UMENTS 2.1 General. The documents listed in this section are specified in sections 3 and 4 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure
10、 the completeness of this list, document users are cautioned that they must meet all specified requirements documents cited in sections 3 and 4 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks(Copies of these documents ar
11、e available online at . The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDI
12、SS) and supplement thereto, cited in the solicitation (see 6.2). DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-DTL-39028 - Capacitors, Packaging of. (See supplement 1 for list of associated specification sheets.) FEDERAL STANDARDS FED-STD-H28 - Screw-Thread Standards for Federal Services. DEPARTMENT OF D
13、EFENSE STANDARDS MIL-STD-202 - Test Method Standard, Electronic and Electrical Component Parts. MIL-STD-690 - Failure Rate Sampling Plans and Procedures. MIL-STD-790 - Standard Practice for Established Reliability and High Reliability Qualified Products List (QPL) Systems for Electrical, Electronic
14、and Fiber Optic Parts Specification. MIL-STD-810 - Environmental Engineering Considerations and Laboratory Tests. MIL-STD-1276 - Leads for Electronic Component Parts. MIL-STD-1285 - Marking of Electrical and Electronic Parts. http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or fro
15、m the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Non-Government publications(Application for copies can be found online at . The following documents form a part of this document to the extent specified herein. Unless otherwise specified, t
16、he issues of these documents are those cited in the solicitation or contract. ELECTRONIC INDUSTRIES ALLIANCE (EIA) EIA-554-1 - Assessment of Average Outgoing Quality Levels in Parts Per Million (PPM). EIA-557 - Statistical Process Control Systems. http:/www.eia.org/ or should be addressed to the Ele
17、ctronic Industries Alliance (EIA), 2500 Wilson Boulevard, Arlington VA 22201-3834.) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-39018G 3 2.4 Order of precedence. In the event of a conflict between the text of this document and the referen
18、ces cited herein (except for related associated specifications, specification sheets, or MS standards), the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Specifi
19、cation sheets. The individual item requirements shall be as specified herein and in accordance with the applicable specification sheets. In the event of any conflict between requirements of this specification and the specification sheet, the latter shall govern (see 6.2). 3.2 Qualification. Capacito
20、rs furnished under this specification shall be products that are authorized by the qualifying activity for listing on the applicable qualified products list (QPL) before contract award. In addition, the manufacturer shall obtain certification from the qualifying activity that the QPL system requirem
21、ents of 3.3 and 4.4 have been met and are being maintained. Authorized distributors who are approved to MIL-STD-790 distributor requirements by the QPL manufacturer are listed in the QPL. 3.3 Qualified Products List (QPL) system. The manufacturer shall establish and maintain a QPL system for parts c
22、overed by this specification. Requirements for this system are specified in MIL-STD-790. In addition, the manufacturer shall establish a Statistical Process Control (SPC) system, which meets the requirements of 3.3.1 and 3.3.2 respectively. 3.3.1 SPC system. As part of the overall MIL-STD-790 QPL sy
23、stem, the manufacturer shall establish an SPC system that meets the requirements of EIA-557. Typical manufacturing processes for application of SPC include: foil classification, rolling, impregnation, cover assembly, and encapsulation. 3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system,
24、 the manufacturer shall establish a PPM system for assessing the average outgoing quality of lots in accordance with EIA-554-1. Data exclusion, in accordance with EIA-554-1 may be used with approval of the qualifying activity. The PPM system shall identify the PPM rate at the end of each month and s
25、hall be based on a 6-month moving average. Style reporting may include both non-ER and ER style combinations. 3.4 Materials. Materials shall be as specified herein. However, when a definite material is not specified, a material shall be used which will enable the capacitors to meet the performance r
26、equirements of this specification. Acceptance or approval of any constituent material shall not be construed as a guarantee of the acceptance of the finished product. 3.4.1 Case insulation (insulated capacitors only). Case insulation shall not soften, creep, or shrink to a point where a part of the
27、cylindrical case is left uncovered at the high operating temperature. Capacitor bodies shall not be free to turn within the sleeving (except for CU13, CUR13, CU15, CU17, CUR17, CU71, CUR71, CUR91 and CUR92 Insulated styles). The use of exterior cardboard sleeves for insulating purposes shall not be
28、permitted. 3.4.2 Internal examination. When capacitors are examined as specified in 4.6.2.1, there shall be no visible evidence of corrosion. * 3.4.3 Pure tin. The use of pure tin, as an undercoat or final finish, is prohibited both internally and externally. Tin content of capacitor components and
29、solder shall not exceed 97 percent, by mass. Tin shall be alloyed with a minimum of 3 percent lead, by mass (see 6.8) 3.5 Interface and physical dimensions. Capacitors shall meet the interface and physical dimensions specified (see 3.1). 3.5.1 Case. Each capacitor shall be enclosed in a metal case,
30、and shall be effectively sealed against the entry of contaminants, and leakage or evaporation of the electrolyte. The element shall be secured so that there will be no movement in the case. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-3901
31、8G 4 3.5.2 Terminals. All terminals shall be permanently secured internally and externally, as applicable, so that normal handling of the terminals will not result in wear, damage, or excessive strain to the capacitor element, case, or case insulation. Wire-lead terminals shall be hot solder dipped
32、or electroplated with solder having a tin content of at least 40 percent. Threaded portions of screw thread terminals shall be in accordance with FED-STD-H28 as specified (see 3.1). 3.5.3 Terminal lead finish. The terminal lead finish shall be in accordance with code 52 of MIL-STD-1276 (NOTE: The 20
33、0 microinch maximum dimension for code 52 is not applicable). 3.5.3.1 Solder dip (retinning). The manufacturer may solder dip/retin the leads of capacitors supplied to this specification provided the solder dip process (see appendix A) has been approved by the qualifying activity. 3.5.3.2 Tin plated
34、 finishes. Tin plating is prohibited as a final finish or as an undercoat. Tin-lead (Sn-Pb) finishes are acceptable provided that the minimum lead content is 3 percent (see 6.6). 3.6 Burn-in (ER styles only). When capacitors are tested as specified in 4.6.3, there shall be no evidence of damage, arc
35、ing, or breakdown. After burn-in, capacitors shall meet the following requirements: DC leakage: Shall not exceed the initial requirement specified (see 3.1). Capacitance: Within the tolerance specified (see 3.1). ESR: Shall not exceed the initial requirement specified (see 3.1). 3.7 DC leakage. When
36、 measured as specified in 4.6.4, the dc leakage shall not exceed the applicable value specified (see 3.1). For nonpolarized style capacitors, the limits apply to measurements in both directions, except that after environmental tests involving one directional polarization greater than 30 minutes, the
37、 limits shall apply to the last polarized direction only. 3.8 Capacitance. When measured as specified in 4.6.5, the capacitance shall be within tolerance of the nominal value specified (see 3.1). 3.9 Equivalent series resistance (ESR). When measured as specified in 4.6.6, the ESR (in ohms) shall not
38、 exceed the value specified (see 3.1). 3.10 Low temperature exposure. When tested as specified in 4.6.7, capacitors shall meet the following requirements: DC leakage: Shall not exceed the initial requirement specified (see 3.1). Capacitance: Within the tolerance specified (see 3.1). ESR: Shall not e
39、xceed the initial requirement specified (see 3.1). 3.11 Solderability (capacitors with wire-lead terminals only). When capacitors are tested as specified in 4.6.8, the dipped surface of the capacitor leads shall be at least 95-percent covered with a new continuous, solder coating. The remaining 5 pe
40、rcent of the lead surface shall show only small pinholes or voids. These shall not be concentrated in one area. Bare base metal and areas where the solder dip failed to cover the original coating are indications of poor solderability, and shall be cause for failure. In case of dispute, the percentag
41、e of area covered by pinholes or voids shall be determined by actual measurement of these areas, as compared to the total area. 3.12 Terminal strength. When capacitors are tested as specified in 4.6.9, there shall be no loosening of terminals or permanent damage to the terminal weld, or terminal sol
42、der, as applicable. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-39018G 5 3.13 Stability at reduced and high temperatures. When tested as specified in 4.6.10, capacitors shall meet the following requirements: Step 1: DC leakage: Shall not
43、exceed the initial requirement specified (see 3.1). Capacitance: Within the tolerance specified (see 3.1). ESR: Shall not exceed the initial requirement specified (see 3.1). Step 2: Impedance: Shall not exceed the value specified (see 3.1). Capacitance: Change not more than the value specified (see
44、3.1). Steps 3 through 5: DC leakage: Shall not exceed the value specified (see 3.1). Capacitance: Change not more than the value specified (see 3.1). ESR: Shall not exceed the value specified (see 3.1). 3.14 Life. When tested as specified in 4.6.11, capacitors shall meet the following requirements:
45、DC leakage: Shall not exceed the value specified (see 3.1). Capacitance: Change not more than the value specified (see 3.1). ESR: Shall not exceed the value specified (see 3.1). Visual examination: There shall be no leakage of electrolyte or evidence of mechanical damage, and the marking shall remai
46、n legible. 3.15 Case insulation (insulated capacitors only). 3.15.1 Dielectric withstanding voltage. When capacitors are tested as specified in 4.6.12.1, there shall be no breakdown of the insulation. 3.15.2 Insulation resistance. When capacitors are tested as specified in 4.6.12.2, there shall be n
47、o breakdown of the insulation, and the insulation resistance shall not be less than 100 megohms. 3.16 Shock (specified pulse). When capacitors are tested as specified in 4.6.13, there shall be no intermittent contacts of 0.5 millisecond (ms) or greater duration, arcing, or open- or short-circuiting,
48、 nor shall there be any evidence of mechanical damage or leakage of electrolyte. 3.17 Vibration. When capacitors are tested as specified in 4.6.14, there shall be no intermittent contacts of 0.5 ms or greater duration, or open- or short-circuiting, nor shall there be any evidence of mechanical damag
49、e or leakage of electrolyte. 3.18 Salt spray (corrosion). When capacitors are tested as specified in 4.6.15, there shall be no harmful corrosion and at least 90 percent of any exposed metal surface of the capacitor shall be unaffected. In addition, there shall be no more than 10-percent corrosion of the terminal surface. Harmful corrosion shall be construed as any type of corrosion which in any way interferes with mechanical or electrical performance. There sha
