DLA QPL-28803-10 NOTICE 1-2008 Display Optoelectronic Readouts Back Lighted Segmented General Specification for《反光分段读出光电子显示器的通用规范》.pdf

上传人:appealoxygen216 文档编号:698022 上传时间:2019-01-02 格式:PDF 页数:1 大小:10.05KB
下载 相关 举报
DLA QPL-28803-10 NOTICE 1-2008 Display Optoelectronic Readouts Back Lighted Segmented General Specification for《反光分段读出光电子显示器的通用规范》.pdf_第1页
第1页 / 共1页
亲,该文档总共1页,全部预览完了,如果喜欢就下载吧!
资源描述

1、QUALIFIED PRODUCTS LIST (MILITARY)Display, Optoelectronic, Readouts, Back Lighted Segmented,General Specification forQPL-28803-10, which identified products qualified under therequirements specified in MIL-DTL-28803, has been transformed toan equivalent qualification data set (QDS). Qualificationinf

2、ormation previously provided in this List is now availablefrom the Qualified Products Database (QPD).For additional information in locating products or sourcesqualified under MIL-DTL-28803, please link to the following helppage at http:/assist.daps.dla.mil/online/help/qds_pub.cfm.NOTICE OFTRANSFORMA

3、TIONQPL-28803-10NOTICE 117 April 2008NOTE: The preparing activity above was responsible for thisdocument as of the date shown above. Since organizations andresponsibilities can change, you should verify the currency ofthe information above using the ASSIST Online database athttp:/assist.daps.dla.mil.AMSC N/A FSC 5980Preparing Activity:DLA - CCProvided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

展开阅读全文
相关资源
猜你喜欢
  • BS EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件 机械和气候试验方法 带存储器的半导体器件用软.pdf BS EN 60749-38-2008 Semiconductor devices - Mechanical and climatic test methods - Part 38 Soft error test method for semiconductor devices with memory《半导体器件 机械和气候试验方法 带存储器的半导体器件用软.pdf
  • BS EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconduc.pdf BS EN 60749-39-2006 Semiconductor devices - Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconduc.pdf
  • BS EN 60749-4-2002 Semiconductor devices - Mechanical and climatic test methods - Damp heat steady state highly accelerated stress test (HAST)《半导体器件 机械和气候试验方法 湿热、稳态态、高加速应力试验(HAST)》.pdf BS EN 60749-4-2002 Semiconductor devices - Mechanical and climatic test methods - Damp heat steady state highly accelerated stress test (HAST)《半导体器件 机械和气候试验方法 湿热、稳态态、高加速应力试验(HAST)》.pdf
  • BS EN 60749-40-2011 Semiconductor devices Mechanical and climatic test methods Board level drop test method using a strain gauge《半导体装置 机械和气候试验方法 利用变形测量器进行的板级落锤试验法》.pdf BS EN 60749-40-2011 Semiconductor devices Mechanical and climatic test methods Board level drop test method using a strain gauge《半导体装置 机械和气候试验方法 利用变形测量器进行的板级落锤试验法》.pdf
  • BS EN 60749-42-2014 Semiconductor devices Mechanical and climatic test methods Temperature and humidity storage《半导体器件 机械和气候试验方法 温度和湿度存储》.pdf BS EN 60749-42-2014 Semiconductor devices Mechanical and climatic test methods Temperature and humidity storage《半导体器件 机械和气候试验方法 温度和湿度存储》.pdf
  • BS EN 60749-44-2016 Semiconductor devices Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices《半导体器件 机械和气候试验.pdf BS EN 60749-44-2016 Semiconductor devices Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices《半导体器件 机械和气候试验.pdf
  • BS EN 60749-5-2017 Semiconductor devices Mechanical and climatic test methods Steady-state temperature humidity bias life test《半导体器件 机械和气候试验方法 稳态温度湿度偏差寿命试验》.pdf BS EN 60749-5-2017 Semiconductor devices Mechanical and climatic test methods Steady-state temperature humidity bias life test《半导体器件 机械和气候试验方法 稳态温度湿度偏差寿命试验》.pdf
  • BS EN 60749-6-2002 Semiconductor devices - Mechanical and climatic test methods - Storage at high temperature《半导体器件 机械和气候试验方法 高温下储存》.pdf BS EN 60749-6-2002 Semiconductor devices - Mechanical and climatic test methods - Storage at high temperature《半导体器件 机械和气候试验方法 高温下储存》.pdf
  • BS EN 60749-7-2011 Semiconductor devices Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases《半导体装置 机械和气候耐受性试验方法 其他残余.pdf BS EN 60749-7-2011 Semiconductor devices Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases《半导体装置 机械和气候耐受性试验方法 其他残余.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1