1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add new dose rate footnote to paragraph 1.5 and Table I. - ro 05-07-06 R. MONNIN B Correct paragraph 1.5, delete latch up and substitute Single event latchup limit. Update boilerplate paragraphs to current MIL-PRF-38535 requirements. Add paragrap
2、h 4.4.4.1.1. - ro 10-10-27 C. SAFFLE C Delete the words “Radiation hardened” from the title block, paragraphs 1.2.2, and A.1.2.2. Add “RHA” to foot note 2/ as specified under Table I. - ro 11-09-22 C. SAFFLE REV SHET REV C C C SHEET 15 16 17 REV STATUS REV C C C C C C C C C C C C C C OF SHEETS SHEET
3、 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADI
4、A APPROVED BY RAYMOND MONNIN MICROCIRCUIT, LINEAR, NEGATIVE LOW DROPOUT ADJUSTABLE VOLTAGE REGULATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 01-11-17 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-02503 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E528-11 Provided by IHSNot for ResaleNo reprodu
5、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high r
6、eliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The
7、 PIN is as shown in the following example: 5962 F 02503 01 V X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA mar
8、ked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Devic
9、e type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 ISL72991RH Dielectrically isolated negative low dropout adjustable voltage regulator 1.2.3 Device class designator. The device class designator is a single letter identifying the pr
10、oduct assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 C
11、ase outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X CDFP3-F28 28 Flat pack1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for
12、device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input volt
13、age range (VIN) -35 V dc to +0.3 V dc 2/ Maximum power dissipation (PD) Internally limited 3/ Maximum storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +265C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . 5C/W Thermal resistance, juncti
14、on-to-ambient (JA) . 60C/W 4/ 1.4 Recommended operating conditions. Maximum operational input voltage (VIN) . -30 V dc Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available: (dose rate = 50 300 rad(Si)/s) 300 krads(Si) 5/ Single event latch up
15、(SEL) . No latch up 6/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the so
16、licitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMEN
17、T OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Ph
18、iladelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Inputs must not go more positive than 0.3 V. 3/ The maximum power dissipation is a functio
19、n of TJMAX, JA, and TA. The maximum allowable power dissipation at any ambient temperature is PD= (TJMAX TA) / JA. If this dissipation is exceeded, the die temperature will rise above +125C and the device will eventually go into thermal shutdown at a TJof approximately +150C. 4/ JAis measured with t
20、he component mounted on an evaluation PC board in free air. 5/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, met
21、hod 1019, condition A. 6/ Devices use dielectrically isolated (DI) technology and latch-up is physically not possible. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHI
22、O 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations u
23、nless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification
24、 in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.1.1 Microcircuit die. For the requirements of microc
25、ircuit die, see appendix A to this document. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlin
26、e. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagram. The block diagram shall be as specified on figure 2. 3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be as
27、 specified on figure 3. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temp
28、erature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN
29、may also be marked. For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V sha
30、ll be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class
31、M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a ce
32、rtificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm t
33、hat the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PR
34、F-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices
35、acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable req
36、uired documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A). Provided by IHSNo
37、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -
38、55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Reference voltage VREF3 mA IO 1 A, 1 01 -1.279 -1.231 V VO 1.0 V VIN -30 V 2,3 -1.300 -1.210 M,D,P,L,R,F 2/ 3/ 1 -1.279 -1.231 Output voltage range VOVIN= -3.0 V, IO 100 mA 1,2,3 01 -2.25 V M,D,P,L,R,F 2/ 3/ 1 -
39、2.25 VIN= -30 V, IO 100 mA 1,2,3 -26.0 M,D,P,L,R,F 2/ 3/ 1 -26.0 Load regulation VLDR 3 mA IO 1 A, 1 01 -12 +12 mV VIN= -7 V, VO= -5 V 2,3 -15 +15 M,D,P,L,R,F 2/ 3/ 1 -12 +12 Line regulation VLNR IO= 100 mA, 1,2,3 01 -25 +25 mV VO 1.0 V VIN -30 V M,D,P,L,R,F 2/ 3/ 1 -25 +25 Dropout voltage VDO IO= 1
40、00 mA, 1 01 0.2 V VO 50 mV 2,3 0.3 M,D,P,L,R,F 2/ 3/ 1 0.2 IO= 1 A, VO 50 mV 1,2,3 1.0 M,D,P,L,R,F 2/ 3/ 1 1.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND
41、 MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Adjust current IADJIO 500 mA, VO1.0 V VIN
42、-30 V 1,2,3 01 5 A M,D,P,L,R,F 2/ 3/ 1 5 Dropout quiescent current IQDOIO 500 mA, VO VIN= 0.2 V 1 01 25 mA IO 500 mA, VO VIN= 0.3 V 2,3 25 M,D,P,L,R,F 2/ 3/ 1 25 SD input voltage VSDVO: ON 1,2,3 01 0.8 V M,D,P,L,R,F 2/ 3/ 1 0.8 VO: OFF 1,2,3 2.4 M,D,P,L,R,F 2/ 3/ 1 2.4 SD input current ISDVSD= 0.8 V
43、 1,2,3 01 50 A M,D,P,L,R,F 2/ 3/ 1 50 VSD= 2.4 V 1 100 2,3 150M,D,P,L,R,F 2/ 3/ 1 100 Current limit ICLRCL= 3.7 k 1,2,3 01 0.6 0.9 A M,D,P,L,R,F 2/ 3/ 1 0.6 0.9 1/ VO= -1.5 VIN, IO= 100 mA, CO= 47 F, SD = 0 V. 2/ The RHA devices supplied to this drawing meet all levels M, D, P, L, R, F of irradiatio
44、n (classes M, Q, and V). However, this device is only tested at the “F” level (classes M, Q, and V). Pre and Post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ These parts may be dose r
45、ate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permit
46、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 VIN2 VIN3 NC4 NC 5 NC6 NC 7 NC8 NC 9 NC10 NC 11 GND 12 ILIM1
47、3 VOUT14 VOUT15 VOUT16 VOUT17 SHUT DOWN 18 ADJUST 19 NC 20 NC21 NC 22 NC23 NC 24 NC25 NC 26 NC27 VIN28 VINNOTES: NC = No connection. All four VINpins are to be externally connected together. Al four VOUTpins are to be externally connected together. FIGURE 1. Terminal connections. Provided by IHSNot
48、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-02503 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR
