1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 10. Table I: Dropout voltage test, conditions column, change IOUT= 7.5 A to IOUT= 7.0 A. Load regulation test, conditions column, change 10 mA IOUT7.5 A to 10 mA IOUT7.0 A. Ground current, delete note 4 from test and table I and m
2、aximum limits column change 75 mA to 85 mA. 05-10-05 Raymond Monnin B Update drawing to the latest requirements. -sld 08-05-20 Robert M. Heber C Correct title block from ”MICROCIRCUIT, LINEAR, HIGH CURRENT, LOW DROPOUT, VOLTAGE REGULATOR, MONOLITHIC SILICON” to “MICROCIRCUIT, HYBRID, LINEAR, HIGH CU
3、RRENT, LOW DROPOUT, VOLTAGE REGULATOR” Added footnote 1 to table II, under group C end-point electricals. Update drawing paragraphs. -gc 12-12-11 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME
4、COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, LINEAR, HIGH CURRENT, LOW DROPOUT, VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT O
5、F DEFENSE DRAWING APPROVAL DATE 03-11-26 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-03232 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E090-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME C
6、OLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in th
7、e Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 03232 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish design
8、ator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non
9、-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MSK 5275-1.5H High current, low dropout, +1.5 V voltage regulator 02 MSK 5275-1.7H High current, low dropout, +1.7 V voltage regulator 03 MSK 5275-1.8H High
10、current, low dropout, +1.8 V voltage regulator 04 MSK 5275-1.9H High current, low dropout, +1.9 V voltage regulator 05 MSK 5275-2.5H High current, low dropout, +2.5 V voltage regulator 06 MSK 5275-3.3H High current, low dropout, +3.3 V voltage regulator 07 MSK 5275-3.4H High current, low dropout, +3
11、.4 V voltage regulator 08 MSK 5275-5.0H High current, low dropout, +5.0 V voltage regulator 09 MSK 5275-12H High current, low dropout, +12.0 V voltage regulator 10 MSK 5275-2.0H High current, low dropout, +2.0 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a
12、 single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance
13、documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military
14、 quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which
15、 are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely aff
16、ect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MI
17、CROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure
18、1 3 Bottom terminal chip carrier, ceramic 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VINP) (100 ms 1% duty cycle) -20 V dc to +60 V dc Input voltage (VIN) 26 V dc Enable voltage -0.3 V dc to 26 V dc Output current (IOUT)
19、 8 A Power dissipation (PD) . Internally limited Thermal resistance junction-to-case (JC) 1.2C/W Junction temperature (TJ= TC) +125C Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Case operating temperature range (TC) -55C to +1
20、25C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contr
21、act. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-
22、103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order
23、 of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the a
24、bsolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARI
25、TIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may includ
26、e the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MI
27、L-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall
28、 be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline and terminal connections. The case outline and terminal connections shall be in accordance with 1.2.4 herein and figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance charac
29、teristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of de
30、vice(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacture
31、r of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any,
32、are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order t
33、o supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PR
34、F-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in t
35、he QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be main
36、tained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the inten
37、t specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion
38、of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charac
39、teristics. Test Symbol Conditions 1/ 2/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage tolerance VOTOLIOUT= 10 mA, VIN= VOUT= +1 V 1 All 1.0 % 2,3 2.0 Dropout voltage 3/ VODOPVOUT= -1%, IOUT= 250 mA, TC= +25C 1 All 200 mV VOUT= -1%, IOUT= 7.
40、0 A, TC= +25C 600 Load regulation VRLOADVIN= VOUT+ 1 V 10 mA IOUT 7.0 A 1 All 1.0 % 2,3 2.0 Line regulation VRLINE(VOUT+ 1 V) VIN 26 V, IOUT= 10 mA 1 All 0.5 % 2,3 1.0 Output current limit 3/ IOUTLIMVOUT= 0 V, VIN= VOUT+ 1 V All 15 A Ground current 3/ IGNDVIN= VOUT+ 1 V, IOUT= 4 A All 85 mA 1/ TC= +
41、25C, TJ= +125C, and TA= -55C. Output decoupled to ground using 33 F capacitor minimum, unless otherwise specified. 2/ All parameters are tested using a low duty cycle pulse to maintain TJ= TC. 3/ Parameter is guaranteed by design but need not be tested. Provided by IHSNot for ResaleNo reproduction o
42、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Case outline X and terminal connections. Symbol Inches Millimeters Min Max Min Max A .130 3.30 A1 .005 .0
43、25 0.13 0.64 b .365 .385 9.27 9.78 b1 .405 .425 10.29 10.80 b2 .130 .150 3.30 3.81 b3 .147 .167 3.73 4.24 D .615 .635 15.62 16.13 D1 .030 0.76 E .440 .460 11.18 11.68 e .035 0.89 S1 .027 .047 0.69 1.19 S2 .040 .060 1.02 1.52 NOTES: 1. The U.S. government preferred system of measurement is the metric
44、 SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch- pound units shall rule. 2. Lead identification for reference only. 3. Terminal 1 is input (VIN). Terminal 2 is output (VOUT). Terminal 3 is gr
45、ound (GND). FIGURE 1. Case outline and terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 5962-03232 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 9
46、7 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1* 2, 3 Group A test requirements 1, 2, 3 Group C end-point electrical Parameters 1/ 1, 2, 3 End-poin
47、t electrical parameters for radiation hardness assurance (RHA) devices Not applicable 1/ As a minimum, for all Group C testing performed after (12-12-11) manufacturers shall perform subgroups 1, 2, and 3 from the Group A electrical test table (Table C-Xa of MIL-PRF-38534). * PDA applies to subgroup
48、1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspect
