1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Made change to the load regulation test, VRLOAD, in table I. Update drawing to reflect current requirements. rrp 06-06-07 R. MONNIN B Update drawing as part of 5 year review. -jt 12-02-16 C. SAFFLE REV SHEET REV SHEET REV STATUS REV B B B B B B B
2、 B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Glenn Traylor DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.Landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHEC
3、KED BY Rajesh R. Pithadia APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, ULTRA LOW DROPOUT, ADJUSTABLE POSITIVE LINEAR REGULATORS, MONOLITHIC SILICON DRAWING APPROVAL DATE 03-12-05 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-03238 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E147-12 Provided
4、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance cl
5、ass levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is ref
6、lected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 03238 01 M X X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designat
7、or. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indic
8、ates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 OM7764AS Ultra Low Dropout, Adjustable Positive Linear Regulators 1.2.3 Device class designator. The device class designator is a single letter identifyi
9、ng the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-3853
10、5 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 6 Power surface mount Y See figure 1 5 MO-078 Flange mount glass sealed 1.2.5 Lead finish. The lead finish is as specified in MIL-PR
11、F-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET
12、 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Output current (IO) 3 A Input voltage (VIN) +20 V Power dissipation (PD) (TC= 25C) 20 W Thermal resistance, junction-to-case (JC): Case X 5C/W Case Y 5C/W Operating temperature range (TJ) -55C to +125C Storage temperature range -65C to +150C
13、Lead temperature (TL) 300C 1.4 Recommended operating conditions. Input voltage range 2.7 V min to 20 V max Ambient operating temperature (TA).-55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a par
14、t of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDA
15、RDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available o
16、nline at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this draw
17、ing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performanc
18、e and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirem
19、ents. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein
20、. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF
21、-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrica
22、l performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test re
23、quirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where
24、 marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PR
25、F-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in
26、 MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall b
27、e required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product m
28、eets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M i
29、n MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is req
30、uired for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore d
31、ocumentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or
32、networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C unless otherwise spec
33、ified Group A subgroups Device type Limits Unit Min Max Minimum input voltage VINILOAD= 3A 1 01 2.7 V Line regulation VRLINEVIN= 2.21 V to 20 V, ILOAD= 1 mA 1/ 2, 3 01 10 mV Load regulation VRLOADVIN= 2.7 V, ILOAD= 1 mA to 3 A 1 01 15 mV VIN = 2.7 V, ILOAD= 1 mA to 3 A 1/ 2, 3 50 Adjust pin voltage
34、VADJVIN= 2.21 V, ILOAD= 1 mA 1 01 1.192 1.228 V 2.7 V VIN 20 V, 1 mA ILOAD 3 A 1, 2, 3 1.168 1.246 Dropout voltage VDOILOAD= 1 mA 1 01 0.05 V ILOAD = 1 mA 2, 3 0.10 ILOAD = 100 mA 1 0.13 ILOAD = 100 mA 2, 3 0.18 ILOAD = 500 mA 1 0.20 ILOAD = 500 mA 2, 3 0.27 ILOAD = 1.5 A 1 0.33 ILOAD = 1.5 A 2, 3 0
35、.40 ILOAD = 3 A 1 0.54 ILOAD = 3 A 2, 3 0.66 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC
36、FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Ground pin current VIN= VOUT(NOMINAL)+1 IGNDILOAD= 0 mA 1, 2, 3 01 1.5 mA ILOAD = 1 mA 1.6 ILOAD = 100 mA 5 IL
37、OAD = 500 mA 18 ILOAD = 1.5 A 75 ILOAD = 3 A 200 Ripple rejection OUTINVVVIN- VOUT= 1.5 V(AVERAGE), VRIPPLE= 0.5 VP-P, fRIPPLE= 120 Hz, ILOAD= 1.5 A 1 01 55 dB Current limit IL VIN= 2.7 V, VOUT= -0.1 V 1, 2, 3 01 3.1 A Input reverse leakage current IIRLVIN= -20 V, VOUT= 0 V 1, 2, 3 01 1 mA Reverse o
38、utput current IRO VOUT = 1.21 V, VIN -1.21 V 1 01 600 A 1/ Tested and specified for these conditions with the ADJ pin connected to the OUT pin. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND A
39、ND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Case X Symbol Inches Millimeters Min Max Min Max A .155 .165 3.94 4.19 A2.075 .085 1.91 2.16 b .030 .040 0.76 1.02 C .015 .025 0.38 0.64 D .420 .430 10.67 10.92 E .420 .430 10.67 10.92 e .195 .205 4.95 5.21 e1.095 .
40、105 2.41 2.67 L .350 - 8.89 - L1.095 .135 2.41 3.43 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-po
41、und units shall take precedence. FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Ca
42、se Y Symbol Inches Millimeters Min Max Min Max A .240 .270 6.10 6.86 A1.035 .045 0.89 1.14 A2.135 .145 3.43 3.68 b .025 .035 0.64 0.89 D .815 .835 20.70 21.21 D1.530 .550 13.46 13.97 D2- .092 - 2.34 E .685 .695 17.40 17.65 e .095 .105 2.41 2.67 L .500 .750 12.70 19.05 L1.697 .707 17.70 17.96 P .155
43、.165 3.94 4.19 NOTE: The U.S. government preferred system of measurement is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGU
44、RE 1. Case outline continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 Device types 01 Case outline
45、X Y Terminal number Terminal symbol 1 Input Shutdown 2 Ground Input 3 Output Ground 4 Adjust Output 5 N/C Adjust 6 Shutdown - FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03
46、238 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality
47、 Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accor
48、dance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D.
