1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Figure 1, corrected the A1 dimension for the case outlines X and Y. Updated drawing paragraphs. -sld 12-01-17 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY
2、Gary Zahn DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A APPROVED BY Raymond Monnin MICROCIRCUIT, LINEAR, CM
3、OS, RESOLVER TO DIGITAL CONVERTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 04-03-03 REVISION LEVEL A SIZE A CAGE CODE 67268 5962-03251 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E063-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIR
4、CUIT DRAWING SIZE A 5962-03251 DLA LAND AND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which a
5、re available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 03251 01 H X X Federal RHA Device Device Case Lead stock class designa
6、tor type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA de
7、signator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Accuracy 1 LSB 01 RDC-19220-113 R/D converter, 5 VCC2 min02 RDC-19222-113 R/D converter, +5 VCCor 5 VCC2 min 03 RDC-19220S-1
8、13 R/D converter, 5 VCC2 min04 RDC-19222S-113 R/D converter, +5 VCC or 5 VCC2 min 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as
9、 well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level.
10、This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified i
11、ncoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specifie
12、d in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This pro
13、duct may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 40 Dual-in-line, ceramic Y See figure 1 44 J lead, square, ceramic chip carrier 1.2.5 L
14、ead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03251 DLA LAND AND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 223
15、4 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (+VCC) . +7.0 V dc Negative supply voltage (-VCC) device types 01 and 03 . -7.0 V dc Reference input voltage . 25 V rms Continuous Digital input voltage range . -0.3 V dc to +VCCPower dissipation, TA= +125C (PD) . 170 mW Thermal resis
16、tance junction-to-case (JC): Case outline X 4.6C/W Case outline Y 2.4C/W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Positive supply voltage (+VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage (-VCC) -4.75 V dc to
17、 -5.25 V dc Reference input voltage range . 1.0 V to 5 V peak, single ended Reference input carrier frequency range: Device types 01 and 02 DC to 40 kHz Device types 03 and 04 DC to 10 kHz Signal input voltage range . 2 V rms 10% Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE D
18、OCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF
19、DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of St
20、andard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precede
21、nce. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute max
22、imum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03251 DLA LAND A
23、ND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the per
24、formance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-385
25、34 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as sp
26、ecified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein
27、, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are de
28、fined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirement
29、s of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually te
30、sted, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be req
31、uired from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate
32、 of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Manage
33、ment (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C,
34、 or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as ap
35、plicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to b
36、urn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03251 DLA LAND AND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97
37、TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution control 2/ RC A = B = 0.8 V 7,8A,8B All 10 10 Bits A = 2.0 V, B = 0.8 V 12 12 A = 0.8 V, B = 2.0 V 14 14 A = B = 2.0 V 16 16
38、 Accuracy repeatability AR 3/ 4/ 7,8A,8B All -1.0 +1.0 LSB Accuracy differential AD 3/ 4/ 7,8A,8B All -1.0 +1.0 LSB Output accuracy AOUT In 16-bit mode 3/ 7,8A,8B All -7 +7 LSB Reference input voltage range 4/ VIN1Single ended 4,5,6 All 1.0 5.0 VPeakDifferential 2.0 10 VP-PReference input impedance
39、4/ ZIN14,5,6 All 10 M Signal input impedance 4/ ZIN2 4,5,6 All 10 M Digital output low voltage 2/ VOLIOL-1.6 mA 1,2,3 All 0.4 V Digital output high voltage 2/ VOHIOH0.4 mA 1,2,3 All 2.8 V Output leakage current 4/ IOZ1,2,3 All -10 +10 A Digital input high voltage 2/ VIHDigital inputs A, B, INH, EL,
40、and EM. VIN= 2.0 V 1,2,3 All pass/ fail Digital input low voltage 2/ VILDigital inputs A, B, INH, EL, and EM. VIN= 0.8 V 1,2,3 All pass/ fail Digital input current 2/ IINEL, EM, INH, A, B, internal pull-up 4,5,6 All -10 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or
41、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03251 DLA LAND AND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless
42、 otherwise specified Group A subgroups Device type Limits Unit Min Max Inhibit voltage 2/ VINHNo digital angles change while INH is logic 0 and analog input is rotating 7,8A,8B All 0.8 V Enable voltage 2/ VEEM controls output bits 1 through 8 and EL controls output bits 9 through 16. 7,8A,8B All 0.8
43、 V Disable voltage 2/ (high impedance) VDEM controls output bits 1 through 8 and EL controls output bits 9 through 16. 7,8A,8B All 2.0 V Positive supply current +ICC+VCC= +5.25 V 1,2,3 All 22 mA Negative supply current -ICC-VCC= -5.25 V 1,2,3 All 22 mA 1/ +VCC= + 5.0 V dc for device types 01 through
44、 04, -VCC= -5.0 V dc for device types 01 and 03 only, unless otherwise specified. 2/ These parameters are tested on a go-no-go basis only or in conjunction with other measured parameters and are not directly testable. 3/ Output accuracy is measured at angles from 0, to 180, in 15 increments, and at
45、225, 270, and 315. 4/ Parameters shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 5/ Analog output voltage is tested at 8 revolutions per second. Pro
46、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-03251 DLA LAND AND MARITIME COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Device types 01 and 03. Symbol Millimeters Inc
47、hes Minimum Maximum Minimum Maximum A 2.16 2.67 .085 .105A1 2.67 3.18 .105 .125b 0.30 0.61 .012 .024b1 0.76 1.78 .030 .070c 0.20 0.41 .008 .016D 50.29 51.31 1.980 2.020E 14.73 15.24 .580 .600e 2.29 2.79 .090 .110eA 14.73 16.51 .580 .650L 2.67 3.68 .105 .145Q 1.02 1.52 .040 .060NOTES: 1. The U.S. gov
48、ernment preferred system of measurement is the metric SI. This case outline was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Pin numbers are for reference only. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo repro
