1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update boilerplate paragraphs to current MIL-PRF-38535 requirements. Delete references to device class M requirements. - ro 13-02-06 C. SAFFLE REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 P
2、MIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY ROBERT M. HEBER MICRO
3、CIRCUIT, LINEAR, WIDEBAND OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 07-08-28 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-07219 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E138-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
4、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (de
5、vice class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 07219 01 V
6、H A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels an
7、d are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 THS4304M Wideband operational amplifier 1.2.3 Device class designator. The device
8、 class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter
9、Descriptive designator Terminals Package style H GDFP1-F10 or CDFP2-F10 10 Flat pack 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
10、 DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) . +6.0 V Input voltage (VIN) VSOutput current (IOUT) 150 mA Differential input voltage (VID) . 2 V Continuous power dissipati
11、on (PD) : 2/ TA +25C 661 mW TA= +85C 344 mW TA= +125C 132 mW Maximum junction temperature (TJ) (any condition) . +150C Storage temperature range (TSTG) . -65C to +150C Electrostatic discharge (ESD) ratings: Human body model (HBM) 1600 V Charge device model (CDM) . 1000 V Machine model (MM) . 100 V T
12、hermal resistance, junction-to-case (JC) . 14.7C/W Thermal resistance, junction-to-ambient (JA) 189C/W 1.4 Recommended operating conditions. Supply voltage ( +VSand VS): Dual supply voltage . 1.35 V to 2.5 V Single supply voltage . +2.7 V to +5 V Input common mode voltage range (VCM) -VS- 0.2 V to +
13、VS+ 0.2 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues
14、of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard E
15、lectronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order De
16、sk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Power rating determined for a maximum junction temp
17、erature of +150C. However, distortion starts to substantially increase above +125C. Thermal management of the final printed circuit board (PCB) should strive to keep the junction temperature at or below +125C for best performance and long term reliability. Provided by IHSNot for ResaleNo reproductio
18、n or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the reference
19、s cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accor
20、dance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and phy
21、sical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteris
22、tics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrica
23、l test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire S
24、MD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certifica
25、tion/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requir
26、ements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein
27、. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR
28、D MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C VS= 1.5 V Group A subgroups Device type Limits Unit unless otherwise specif
29、ied Min Max DC performance section. Open loop voltage gain AOLVO= 0.3 V 1 01 52 dB 2,3 50 Input offset voltage VIOVO= 0 V 1 01 4 mV 2,3 6 Input bias current IIBVO= 0 V 1 01 12 A 2,3 20 Input offset current IIOVO= 0 V 1 01 1 A 2,3 1.5 Input characteristics section. Common mode input range VCM1 01 1.3
30、 V 2,3 1 Common mode rejection ratio CMRR VO= 0 V, VCM= 0.3 V 1 01 62 dB 2,3 50 Output characteristics section. Output voltage swing RL= 100 1 01 0.3 V 2,3 0.2 RL= 1 k 1 0.4 2,3 0.3 Output current (sourcing) IOUTRL= 10 1 01 25 mA 2,3 20 Output current (sinking) IOUTRL= 10 1 01 27 mA 2,3 21 See footn
31、ote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charac
32、teristics Continued. Test Symbol Conditions 1/ -55C TA +125C VS= 1.5 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Power supply section. Maximum operating voltage VS1,2,3 01 2.75 V Minimum operating voltage VS1,2,3 01 1.35 V Quiescent current IQIO= 0 mA 1 01 16.5 17.
33、9 mA 2,3 15.0 18.6 Power supply rejection ratio +PSRR +VS= 1.8 V to 1.2 V, 1 01 60 dB -VS= -1.5 V 2,3 53 -PSRR -VS= -1.2 V to -1.8 V, 1 55 +VS= 1.5 V 2,3 52 See footnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC
34、IRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C VS= 2.5 V Group A subgroups Device type Limits Unit unless otherwise spec
35、ified Min Max DC performance section. Open loop voltage gain AOLVO= 0.8 V 1 01 54 dB 2,3 49 Input offset voltage VIOVO= 0 V 1 01 4 mV 2,3 6 Input bias current IIBVO= 0 V 1 01 12 A 2,3 20 Input offset current IIOVO= 0 V 1 01 1 A 2,3 1.5 Input characteristics section. Common mode input range VCM1 01 2
36、.3 V 2,3 2 Common mode rejection ratio CMRR VO= 0 V, VCM= 1 V 1 01 78 dB 2,3 52 Output characteristics section. Output voltage swing RL= 100 1 01 1.3 V 2,3 1.15 RL= 1 k 1 1.4 2,3 1.25 Output current (sourcing) IOUTRL= 10 1 01 80 mA 2,3 70 Output current (sinking) IOUTRL= 10 1 01 70 mA 2,3 55 See foo
37、tnote at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance char
38、acteristics Continued. Test Symbol Conditions 1/ -55C TA +125C VS= 2.5 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Power supply section. Maximum operating voltage VS1,2,3 01 2.75 V Minimum operating voltage VS1,2,3 01 1.35 V Quiescent current IQIO= 0 mA 1 01 17.5 1
39、8.9 mA 2,3 16.0 19.7 Power supply rejection ratio +PSRR +VS= 3 V to 2 V, 1 01 72 dB -VS= -2.5 V 2,3 64 -PSRR -VS= -2 V to -3 V, 1 57 +VS= 2.5 V 2,3 53 1/ Unless otherwise specified, input common mode voltage (VCM) = 0 V and load resistance (RL) = 500 . Provided by IHSNot for ResaleNo reproduction or
40、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outline H Terminal number Terminal symbol 1 NC 2 NC 3 -IN 4 +IN 5 -VS6 VOUT7 VOUT8 +VS
41、9 NC 10 NC NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR
42、 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or functi
43、on as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test durati
44、on, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) i
45、n accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and fin
46、al electrical test parameters shall be as specified in table IIA herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for devi
47、ce classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall b
48、e in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as spec
