1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added radiation hardness assurance requirements. Table I: sheet 6, under the Group A subgroups column added footnote 4 for the Address input currents and Enable input current tests. Table I: sheet 7, under the Group A subgroups column added footn
2、ote 4 for all current tests. Updated drawing paragraphs. -sld 13-05-06 Charles F. Saffle REV SHEET REV A A A A A SHEET 15 16 17 18 19 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 432
3、18-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, 16 CHANNEL, ANALOG MULTIPLEXER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DA
4、TE 10-03-02 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-09229 SHEET 1 OF 19 DSCC FORM 2233 APR 97 5962-E399-13Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIME COLUMBUS, OH
5、IO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number
6、(PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 F 09229 01 K X C Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2)
7、designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device typ
8、e(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 MUX8520 16 channel analog multiplexer, high impedance analog input, single output with ESD protection 02 MUX8521 16 channel analog multiplexer, high impedance analog input, kelvin measur
9、ement configuration with ESD protection 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E)
10、 or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applicat
11、ions where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarant
12、ees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; ther
13、efore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIM
14、E COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designat
15、ed in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 56 Ceramic quad flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage between +VEEand GND +16.5 V dc
16、 Negative supply voltage between -VEEand GND -16.5 V dc VREFto GND +16.5 V dc Digital input overvoltage range: VEN (pin 13) ( GND - 4)V VA(pins 14, 15, 16, and 17) . ( GND - 4)V Analog input overvoltage range -18 V dc VIN +18 V dc Power dissipation (PD), TC = -55nullC to +125C: Device type 01 . 16.5
17、 mW Device type 02 . 33 mW Thermal resistance junction-to-case (JC) . 10C/W 2/ Storage temperature . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C 1.4 Recommended operating conditions. Positive supply voltage (+VEE) +15 V dc 3/ Negative supply voltage (-VEE) -15 V dc 3/ VREF. +5 V d
18、c 3/ Logic low level voltage (VAL) . +0.8 V dc Logic high level voltage (VAH) . +4.0 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. 4/ Maximum Total Ionizing Dose (TID) (dose rate = 50 - 300 rad(Si)/s) . 300 krad(Si) 5/ 6/ Enhanced Low Dose Rate Sensitvity (ELDRS) 1
19、50 krad(Si) 5/ Single Event Phenomenon (SEP) effective linear energy transfer (LET): Single Event Latchup (SEL) Immune 5/ Single Event Upset (SEU) . 86 MeV-cm2/mg 7/ Single Event Transient (SET) 86 MeV-cm2/mg 7/ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device.
20、 Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Based on the maximum power dissipation spread over the multiplexer die. 3/ Recommended power supply turn on sequence : +VEE, -VEE, followed by VREF. 4/ See section 4.3.5 for the manufacturers radiation hardn
21、ess assurance analysis and testing. 5/ The only active element in these devices are purchased as SMD 5962F9563002V9A which assures TID, ELDRS, and SEL. 6/ The package in this drawing is a larger version of the same type (flat package) as the one in SMD 5962-95630, the lid underside is nickel plate (
22、no gold), and RGA data shows negligible amounts of hydrogen. 7/ SEU and SET testing performed at 86 MeV-cm2/mg with no upsets or single event transients. These devices will be re-tested after design or process changes that can affect RHA response of these devices. Provided by IHSNot for ResaleNo rep
23、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following
24、specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specificat
25、ion for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copi
26、es of these documents are available online at http:/quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein
27、, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be
28、in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests a
29、nd inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and
30、physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on fi
31、gure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Switching waveform(s). The switching waveform(s) shall be as specified on figure 4. 3.2.5 Block diagram. The block diagram shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless o
32、therwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests
33、 for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking of d
34、evice(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufactur
35、er of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any,
36、 are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order
37、 to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL
38、-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SH
39、EET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC +125C unless otherwise specified Group A subgroups Device types Limits Unit Min Max Supply currents +IEEVEN(0-15)= VA(0-3)= 0 1,2,3 01 0.05 0.5 mA 02 0.1 1 -IEE VEN(0-15)= VA(0-3)= 0 1,2
40、,3 01 -0.5 -0.05 mA 02 -1 -0.1 +ISBY VEN(0-15)= 4 V, VA(0-3)= 0 3/ 1,2,3 01 0.05 0.5 mA 02 0.1 1 -ISBY VEN(0-15)= 4 V, VA(0-3)= 0 3/ 1,2,3 01 -0.5 -0.05 mA 02 -1 -0.1 Address input current IAL(0-3)AVA= 0 V 1,2,3 4/ 01 -1 1 A 02 -2 2 IAH(0-3)A VA= 5 V 1,2,3 4/ 01 -1 1 A 02 -2 2 Enable input current I
41、ENL(0-15) VEN(0-15)= 0 V 1,2,3 4/ 01 -1 1 A 02 -2 2 IENH(0-15)VEN(0-15)= 5 V 1,2,3 4/ 01 -1 1 A 02 -2 2 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITI
42、ME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C unless otherwise specified Group A subgroups Device types Limits Unit Min Max Positive input leakage current (CH0-CH15)
43、+ISOFFOUTPUT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 5/ 6/ 1,2,3 4/ All -100 +700 nA +ISOFFCURRENT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 5/ 6/ 1,2,3 4/ 02 -100 +700 nA Negative input leakage current (CH0-CH15) -ISOFFOUTPUT(ALL) VIN= -10 V, VEN= 4 V,
44、output and all unused inputs = +10 V 5/ 6/ 1,2,3 4/ All -100 +700 nA -ISOFFCURRENT(ALL) VIN= -10 V, VEN= 4 V, output and all unused inputs = +10 V 5/ 6/ 1,2,3 4/ 02 -100 +700 nA Output leakage current outputs (pin 12) for device types 01 and 02, and Currents (pin 45) for device type 02 only) +IDOFFO
45、UTPUT(ALL) VOUT= +10 V, VEN= 4 V, output and all unused inputs = -10 V 6/ 7/ 1,2,3 4/ All -100 +100 nA +IDOFFCURRENT(ALL) VOUT= +10 V, VEN= 4 V, output and all unused inputs = -10 V 6/ 7/ 1,2,3 4/ 02 -100 +100 nA -IDOFFOUTPUT(ALL) VOUT= -10 V, VEN= 4 V, output and all unused inputs = +10 V 6/ 7/ 1,2
46、,3 4/ All -100 +100 nA -IDOFFCURRENT(ALL) VOUT= -10 V, VEN= 4 V, output and all unused inputs = +10 V 6/ 7/ 1,2,3 4/ 02 -100 +100 nA Input clamped voltage (CH0-CH15) +VCLMP VEN= 4 V, all unused inputs are open 6/ 1 All 18.0 23.0 V 2 18.0 23.5 3 17.5 22.5 -VCLMP VEN= 4 V, all unused inputs are open 6
47、/ 1 All -23.0 -18.0 V 2 -23.5 -18.0 3 -22.5 -17.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09229 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8
48、DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55C TC +125C unless otherwise specified Group A subgroups Device types Limits Unit Min Max Switch ON resistance outputs (pin 12) for device type 01 and (pins 12 and 45) for device type 02 RDS(ON)(0-15)AVIN= +15 V, VEN= 0.8 V, IOUT= -1 mA 5/ 6/ 8/ 1,2,3 All 500 3000 RDS(ON)(0-15)BVIN= +5 V, VEN= 0.8 V, IOUT= -1 mA 5/ 6
