1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAW
2、ING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 09-10-19 LOW DROPOUT, FIXED VOLTAGE REGULATOR AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-09236 SHEET 1 OF 12 DSCC
3、 FORM 2233 APR 97 5962-E438-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. Th
4、is drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflecte
5、d in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 F 09236 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation h
6、ardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Gene
7、ric number Circuit function 01 MSK 5822-1.5RH Radiation hardened, 5.0 A, 1.5 V voltage regulator 02 MSK 5822-1.9RH Radiation hardened, 5.0 A, 1.9 V voltage regulator 03 MSK 5822-2.5RH Radiation hardened, 5.0 A, 2.5 V voltage regulator 04 MSK 5822-2.8RH Radiation hardened, 5.0 A, 2.8 V voltage regula
8、tor 05 MSK 5822-3.3RH Radiation hardened, 5.0 A, 3.3 V voltage regulator 06 MSK 5822-5.0RH Radiation hardened, 5.0 A, 5.0 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the re
9、quirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in s
10、pace applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a
11、possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the req
12、uirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined
13、 by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218
14、-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 5 TO-254 with tab, straight leads, glass sealed Y See figure 1 5 TO-254 with ta
15、b, leads formed up, glass sealed Z See figure 1 5 TO-254 with tab, leads formed down, glass sealed 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) +10.0 V dc Bias supply voltage (VBIAS) . +10.0 V dc Output current 5.0 A
16、2/ Junction temperature (TJ) +150C Thermal resistance, junction-to-case (JC) . 3.0/C 3/ Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Input voltage range (VIN) +2.0 V dc to +6.5 V dc Bias supply voltage (VBIAS) . +2.9 V dc to +
17、6.5 V dc Case operating temperature range (TC) . -55C to +125C 1.5 Radiation features. Maximum total dose available 300 krads(Si) 4/ 5/ 6/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing
18、 to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method S
19、tandard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output current limit i
20、s dependent on the value of VIN- VOUT. 3/ Junction to case at +125C, output device. 4/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as speci
21、fied in MIL-STD-883, method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A. 5/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damag
22、e. 6/ See figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS
23、MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-509
24、4.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIRE
25、MENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM)
26、 plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan sha
27、ll not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordanc
28、e with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herei
29、n, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are d
30、efined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements o
31、f MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually teste
32、d, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufact
33、urer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-
34、38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
35、SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxQuiescent current IQIIN+ IBIAS, VBIAS= VIN= 6.5 V 1,2,3 All 20 mA Bias current IBIASVBIAS= 6.5 V 1,2
36、,3 All 4 mA Output voltage tolerance VOUTTOL VIN= VOUT+ 1 V, IOUT= 1.0 A 1 All 1.0 % 2,3 2.5 M,D,P,L,R 1/ 1 All 1.5 M,D,P,L,R,F 1/ 1 All 2.75 Line regulation VRLINEIOUT= 50 mA, VOUT+ 0.4 V VIN 6.5 V 1 All 0.50 %VOUT2,3 2.5 Load regulation VRLOAD50 mA IOUT 3.0 A, VIN= VOUT+ 1 V 1 All 1.0 %VOUT2,3 2.5
37、 Dropout voltage VDODelta FB VOUT= 1%, IOUT= 2.5 A 1 All 0.45 V 2,3 0.50 M,D,P,L,R 1/ 1 All 0.50 M,D,P,L,R,F 1/ 1 All 0.53 Output current limit 4/ IOUTVIN= VOUT+ 1 V Over-current latch up 1,2,3 All 3.0 5.0 A 1/ Device types 01 through 06 have been characterized through all levels M, D, P, L, R, and
38、F of irradiation. However, device types 01 through 06 are tested at 1.5 times the F level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified, VIN= VO
39、UT+ 1 V, VBIAS= 5 V, and IOUT= 10 mA. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A.
40、 4/ Output current limit is dependent upon the values of VINand VOUT. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC
41、 FORM 2234 APR 97 Case outline X. Symbol Millimeters InchesMin Max Min Max A - 6.48 - .255A1 0.76 1.27 .030 .050A2 3.30 3.81 .130 .150b 0.71 0.81 .028 .032D 20.57 21.08 .810 .830E 17.27 17.78 .680 .700E1 8.51 9.02 .335 .355e 2.54 TYP .100 TYPe1 9.91 10.41 .390 .410L 12.70 - .500 -L1 13.34 13.84 .525
42、 .545L2 2.74 3.25 .108 .128P 3.81 4.31 .150 .170S1 3.68 REF .145 REFNOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch
43、-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline X weight: 7.7 grams typical. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE S
44、UPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 Case outline Y. Symbol Millimeters InchesMin Max Min Max A - 6.48 - .255 A1 0.76 1.27 .030 .050 A2 3.30 3.81 .130 .150 b 0.71 0.81 .028 .032 D 20.57 21.08 .810 .830 E 17.27 17.78 .680 .700 E1 8.51 9.02 .335
45、.355 e 2.54 TYP .100 TYP e1 9.91 10.41 .390 .410 L 4.70 5.46 .185 .215 L1 13.34 13.84 .525 .545L2 2.74 3.25 .108 .128L3 8.38 - .330 - P 3.81 4.31 .150 .170 S1 3.68 REF .145 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound un
46、its of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 2. Pin numbers are for reference only. 3. Case outline Y weight: 7.7 grams typical. FIGURE 1. Case outlines - Continued. Provided by IHSNot for ResaleNo re
47、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09236 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 Case outline Z. Symbol Millimeters InchesMin Max Min MaxA - 6.48 - .255A1 0.76 1.27 .0
48、30 .050A2 3.30 3.81 .130 .150b 0.71 0.81 .028 .032D 20.57 21.08 .810 .830E 17.27 17.78 .680 .700E1 8.51 9.02 .335 .355e 2.54 TYP .100 TYPe1 9.91 10.41 .390 .410L 4.70 5.46 .185 .215L1 13.34 13.84 .525 .545L2 2.74 3.25 .108 .128L3 8.38 - .330 -P 3.81 4.31 .150 .170S1 3.68 REF .145 REFNOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-p
