1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Greg Cecil DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAW
2、ING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, 15 VOLT, DUAL CHANNEL, DC/DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 10-03-23 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-10216 SHEET 1 OF 11 DSCC FORM 2233 APR 9
3、7 5962-E188-10Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-10216 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing docum
4、ents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.
5、2 PIN. The PIN shall be as shown in the following example: 5962 - 10216 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assuranc
6、e (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circu
7、it function 01 M3G2815D/CK DC/DC converter, 40 W, 15 V Outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualificat
8、ion (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is inten
9、ded for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and t
10、he manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acq
11、uisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a lim
12、ited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 13 Straight leads with side mounting tabs 1.2.5 Lead finish. The lead finish shall be as specified in MIL-
13、PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-10216 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input vo
14、ltage range -0.5 V dc to +80 V dc Lead temperature (soldering, 10 seconds). +300C Storage temperature -55C to +135C 1.4 Recommended operating conditions. Input voltage range +18 V dc to +50 V dc Output power 2/ 3/ . 40 W Case operating temperature range (TC) 4/ . -55C to +125C 2. APPLICABLE DOCUMENT
15、S 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE
16、 SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard
17、Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In
18、 the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. Th
19、e individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the
20、applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall b
21、e met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum le
22、vels may degrade performance and affect reliability. 2/ Derate output power linearly above case temperature +125C to 0 at +135C. 3/ Limit represent 80 percent of total rated output current. To achieve rated output power, the remaining 20 percent of the total rated output current must be provided by
23、the other output. 4/ For operation at temperatures between +85C and +125C, derate the maximum input voltage linearly from 60 V dc to 40 V dc and the maximum output power linearly from 100 percent to 75 percent. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
24、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-10216 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 a
25、nd herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performan
26、ce characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Mark
27、ing of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the ma
28、nufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which,
29、 if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply
30、 to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided
31、 with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affe
32、ct the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacture
33、r under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.
34、 (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot fo
35、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-10216 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1
36、/ -55C TC+85C VIN= 28 V dc 5%, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage 2/ VOUTIOUT= 1.333 A 1 01 +14.94 +15.06 V 2,3 +14.80 +15.20 Output current 3/ IOUTVIN = 18, 28, 50 V dcEither output 1,2,3 01 2.14 A Output ripple voltage 2/ 4/ VRIPVIN =
37、1.333 A Both outputs. 1,2,3 01 60 mV p-p Line regulation 2/ VRLINEVIN = 18, 28, 40 V dc, IOUT= 0, 50%, 100% rated load both outputs. 1,2,3 01 -10 +10 mV Load regulation 2/ VRLOADVIN = 18, 28, and 50 V dc, IOUT= 0, 50%, and 100% rated load both outputs. 1,2,3 01 -0.5 +0.5 % Cross regulation 5/ VRCROS
38、SVIN = 18, 28, and 50 V dc, IOUT= 0, 50%, 100% rated load both outputs. 1,2,3 01 -3.0 +3.0 % Input current IINIOUT= 0, pin 3 open 1,2,3 01100 mAPin 3 shorted toInput return Pin 2 1,2,3 015.0 mAEfficiency 2/ EFFIOUT= 1.333 A 1,2,3 01 77 % Isolation ISO Input to output or any pin to case (except pin 6
39、) at 500 V dc1 01 100 M Maximum capacitive load 2/ 6/ 7/ CLIOUT= 1.333 ANo effect on dc performance, Each outputs of duals1 01 60 F Power dissipation load fault 8/ PD Short circuit 1,2,3 01 20 W Overload 1,2,3 0120Current limit point 8/ ICLVOUT= 90% of Nominal 1,2 01105 135 % 301105 150Switching fre
40、quency FSSync input (pin 4) openIOUT= 1.333 A 1,2,3 01 450 550 kHz Sync frequency range, 6/ FSYNCExternal clock on Sync input pin 4. IOUT= 1.333 A 1,2,3 01 450 600 kHz Output response to step load changes 2/ 7/ VTLOAD50% to/from 100% load 4,5,6 01 -300 +300 mV pk See footnotes at end of table. Provi
41、ded by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-10216 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continu
42、ed. Test Symbol Conditions 1/ -55C TC+85C VIN= 28 V dc 5%, CL= 0 unless otherwise specifiedGroup A subgroups Device type Limits Unit Min Max Recovery time, step load changes 2/ 9/ 10/ TTLOAD50% to/from 100% load 4,5,6 01 200 s Output response to step line changes 2/ 6/ 11/ VTLINEInput step, 18 V to/
43、from50 V IOUT = 1.333 A 4,5,6 01 -300 +300 mV pk Recovery time step transient line changes 2/ 6/ 10/ 11/ TTLINEInput step, 18 V to/from40 V IOUT = 1.333 A 4,5,6 01 200 s Turn on overshoot 2/ 12/ VTonOS0% load, 100% load Enable on. 4,5,6 01 10 % Turn on delay 12/ TonD 0% load, 100% load.Enable on. 4,
44、5,6 01 1.0 5.0 ms 1/ For operation at temperatures between +85C and +125C derate the maximum input voltage linearly from 60 VDCto 40 VDCand the maximum output power linearly from 100 percent to 75 percent. 2/ Load current is split equally between outputs. 3/ Limit represents 80 percent of total rate
45、d output current. To achieve rated output power, the remaining 20 percent of the total rated output current must be provided by the other output. 4/ Guaranteed for a DC to 20 MHz bandwidth. Tested using a 20 KHz to 10 MHz bandwidth. 5/ Cross regulation is measured with 20 percent rated load on outpu
46、t under test while changing the load on the other output from 20 percent to 80 percent of rated. 6/ Parameter is tested as part of design characterization or after design changes. Thereafter, parameter shall be guaranteed to the limits specified. 7/ Capacitive load may be any value from 0 to the max
47、imum limit without compromising dc performance. A capacitive load in excess of the maximum limit may interfere with the proper operation of the converters overload protection, causing erratic behavior during turn-on. 8/ Overload power dissipation is defined as the device power dissipation with the l
48、oad set such that VOUT= 90 percent of nominal. 9/ Load step transition time 10 s. 10/ Recovery time is measured from the initiation of the transient to where VOUThas returned to within 1% of its steady state value 11/ Line step transition time 10 s. 12/ Turn-on delay time is measured from either a step application of input power or a logic low to a logic high transition on the inhibit pin (pin 3) to the point where VOUT= 90 percent of nominal. Provided by IHSNot for ResaleNo reprodu
