1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 15 16 17 REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Greg Cecil DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.landandmariti
2、me.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, SINGLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 11-10-25 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-11219 SHEET 1 OF 1
3、7 DSCC FORM 2233 APR 97 5962-E501-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This
4、 drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected
5、in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 P 11219 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation har
6、dness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generi
7、c number Circuit function 01 SVSA283R3S DC-DC Converter, 4 W, +3.3 V Output 02 SVSA2805S DC-DC Converter, 5 W, +5 V Output 03 SVSA2812S DC-DC Converter, 6 W, +12 V Output 04 SVSA2815S DC-DC Converter, 6 W, +15 V Output 1.2.3 Device class designator. This device class designator shall be a single let
8、ter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentati
9、on K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality cl
10、ass. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based
11、upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system
12、performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT
13、DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Dual-in-l
14、ine 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input Voltage (Continuous) . +50 V dc Input Voltage (Transient, 1 second) +80 V dc Power Dissipation (PD, Full Load, TCASE= +125C) . 2.7 W Output Power (Dependant on Output Voltage) . 6 W
15、Junction Temperature Rise to Case . +10C Storage Temperature -65C to +150C Lead Solder Temperature (10 seconds) . +270C 1.4 Recommended operating conditions. Input Voltage Range +15 V dc to +50 V dc Case Operating Temperature Range (TC) . -55C to +125C 1.5 Radiation features. Maximum total dose avai
16、lable (dose rate = 30 - 300 rad(Si)/s) . 30 krad (Si) 3/ Maximum total dose available (dose rate 10 mrad(Si)/s) LDR: Components: 30 krad (Si) 3/ 4/ Hybrid: 5/ Single event phenomenon (SEP) effective linear energy threshold (LET): SEL, SEB, SEGR, SEFI . 44 MeV-cm2/mg 2/ 6/ 2. APPLICABLE DOCUMENTS 2.1
17、 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPEC
18、IFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent da
19、mage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Single event performance is tested with minor transients only; no dropouts, shutdowns, latch up or burn out. 3/ Bipolar device types may degrade from displacement damage from radiation whi
20、ch could affect RHA levels. These device types have not been characterized for displacement damage. 4/ Components: The bipolar, BiCMOS linear and mixed signal semiconductor components have been tested to High Dose Rate (HDR) Condition C (30-300 rad(Si)/s) and Low Dose Rate (LDR) per condition D of M
21、IL-STD-883, method 1019. The difference between HDR and LDR test results has been compared to determine if the semiconductors exhibit ELDRS effect. Low dose rate sensitivity was not demonstrated. 5/ Hybrid: Hybrid devices have been tested at HDR. LDR testing on the device has not been completed. 6/
22、See table IB. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 -
23、List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Go
24、vernment publications. The following documents form a part of this document to the extent specified herein. AMERICAN SOCIETY FOR TESTING AND MATERIALS (ASTM) ASTM F 1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices. 2.
25、3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS
26、3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan
27、or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not
28、 affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance
29、with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein,
30、 the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are def
31、ined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements
32、 of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tes
33、ted, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be requi
34、red from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of
35、 conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO
36、 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect
37、 the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer
38、under document revision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015
39、of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. PIN
40、D testing, method 2020, condition A, of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 TABLE IA
41、. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ 4/ 5/ 6/-55C TC+125C VIN= +28 V dc 5% Full Load unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output Voltage VOUTIOUT= 1.21 A 1 01 3.267 3.333 V dc 2,3 3.25 3.351,2,3 7/ 3.244 3.35 IOUT= 1 A 1 02
42、 4.95 5.05 2,3 4.925 5.0751,2,3 7/ 4.89 5.10 IOUT= 0.5 A 1 03 11.88 12.12 2,3 11.82 12.181,2,3 7/ 11.66 12.3 IOUT= 0.4 A 1 04 14.85 15.15 2,3 14.775 15.2251,2,3 7/ 14.565 15.4 Output Current 7/ 8/ IOUTVIN= 15 V dc to 50 V dc 1,2,3 01 1.21 A 02 1 03 0.5 04 0.4 VOUTRipple Voltage VRIP BW = 20 Hz to 10
43、 MHz 1,2,3 All 30 mVp-p VOUTLine Regulation VRLINEVIN= 15 V dc to 50 V dc 1,2,3 All 15 mV VOUTLoad Regulation VRLOADNo Load to Full Load 1,2,3 All 50 mV Input Current IINIOUT= 0, Inhibit (Pin 5) = 0 1,2,3 All 6 mA IOUT= 0, Inhibit (Pin 5) = open 60 IINRipple Current IRIPBW = 20 Hz to 10 MHz 1,2,3 Al
44、l 50 mAp-p 1,2,3 7/ 100 Efficiency Eff IOUT= 1.21 A 1,2,3 01 62 % IOUT= 1 A 02 65 IOUT= 0.5 A 03 71 OUT= 0.4 A 04 72 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LA
45、ND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 TABLE IA. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ 4/ 5/ 6/-55C TC+125C VIN= +28 V dc 5% Full Load unless otherwise specified Group A subgroups Device type Limits Unit Mi
46、n Max Isolation ISO 500 V dc, TC= +25C 1 All 100 M Capacitive Load 10/ CLNo effect on DC performance, TC= +25C 1 01,02 1000 F 03,04 500 Short Circuit Power Dissipation PDShort Circuit 1,2,3 All 3 W Switching Frequency FS1,2,3 All 350 500 kHz VOUTStep Load Transient VTLOAD50% Load to 100% Load 4,5,6
47、01 300 mV pk 02 500 03,04 700 VOUTStep Load Transient Recovery 11/ TTLOAD50% Load to 100% Load 4,5,6 01,02 700 s 03,04 400 VOUTStep Line Transient 4/ 10/ VTLINEVIN= 16 V dc to 40 V dc 4,5,6 01 500 mV pk 02 700 03 1200 04 1300 VOUTStep Line Transient Recovery 10/ 11/ TTLINEVIN= 16 V dc to 40 V dc 4,5
48、,6 01,02 1200 s 03,04 600 Start Up Overshoot VtonOSVIN= 0 V dc to 28 V dc 4,5,6 01 15 mV pk 02 25 03,04 50 Start Up Delay 11/ TonDVIN= 0 V dc to 28 V dc 4,5,6 All 20 ms See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11219 DLA LAND AND MARITIME COLUMBUS, OHIO 4
