1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Paragraph 1.4; added Vcontrol range(Voltages are relative to VOUT) +2 V to +36 V. Figure 2; corrected the terminal symbol names. Figure 3; corrected the terminal symbol names and locations. -sld 13-03-06 Charles F. Saffle REV SHEET REV A A SHEET
2、15 16 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR
3、USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, VOLTAGE REGULATOR ULTRA LOW DROPOUT, POSITIVE, ADJUSTABLE DRAWING APPROVAL DATE 13-02-13 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-13203 SHEET 1 OF 16 DSCC FORM 2233 APR 9
4、7 5962-E285-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents f
5、ive product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN.
6、 The PIN shall be as shown in the following example: 5962 R 13203 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA
7、) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit fun
8、ction 01 8667, 8668 Voltage regulator, positive , low dropout, adjustable 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as
9、 qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This lev
10、el is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming
11、flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the
12、device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may
13、have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). Th
14、e case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 8 Thru-hole Z See figure 1 8 Surface Mount 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Inpu
15、t voltage range, Vcontrol (Voltages are relative to VOUT) +40 V dc, -0.3 V dc Output short circuit duration . Indefinite Input-Output differential voltage . 26 V dc Output voltage . 36 V dc Operating junction temperature range . -55C to +150C Thermal Resistance, Junction temperature (JC) 7C/W Lead t
16、emperature (soldering, 10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input voltage range (Voltages are relative to VOUT) . +1.0 V to +36 V dc Vcontrol range(Voltages are relative to VOUT) +2 V to +36 V Output voltage range 0 V to +36 V dc Input-Outpu
17、t differential voltage range .5 V to 26 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. 2/ Maximum total dose available (Dose rate = 50 - 300 rad(Si)/s) . 100 krad(Si) 3/ Enhanced Low Dose Rate Sensitvity (ELDRS): (dose rate 10 mrad(Si)/s) 50 krad(Si) 4/ 2. APPLICABL
18、E DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT
19、OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Bipolar device types may d
20、egrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 3/ The active elements that make up these devices on this drawing have been tested for Total Ionizing Dose (TID) in accordance with MIL-STD-883 test m
21、ethod 1019 condition A. RHA testing of the active elements covered on this SMD are tested in alternate package (TO3), not the packages as specified in paragraph 1.2.4. 4/ The active elments that make up this device has been tested to RHA designator level “R“ (100 krad(Si) of Method 1019, condition A
22、 of MIL-STD-883 and low dose rate tested to the requirements of Method 1019, condition D and paragraph 3.13.1 of MIL-STD-883 to 50 krad(Si) at +25C. No ELDRS effect was observed. The elements will be re-tested after design or process changes that can affect RHA response of these elements. RHA testin
23、g of the active elements covered on this SMD were done in alternate package (TO3), not the packages as specified in paragraph 1.2.4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME
24、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircu
25、it Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a
26、 conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual it
27、em performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable de
28、vice class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of
29、the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2
30、Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Maximum power dissipation verses case temperature chart. The maximum power dissipation verses case temperature is specified on figure 4. 3
31、.2.5 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herei
32、n, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are d
33、efined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requiremen
34、ts of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually t
35、ested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. Provided by IHSNot for ResaleNo reproduction or networking permitted w
36、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawi
37、ng. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be prov
38、ided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR
39、 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C VCONTROL = 2.0 V, P PMAX, unless otherwise specified Group A subgroups Device type Limits Unit Min Max Set pin current IREF11.0 mA IOUT 1.0 A, VIN - VOUT= 1.6 V 1,2,3 01 9.8 10.2 A IREF2VIN= 1 V, VCONTROL= 2.0 V
40、, 1/ IOUT= 1 mA Output offset voltage 1/ VOSVIN= 2 V, IOUT= 1 mA 1,2,3 01 -9.0 +9.0 mV Line regulation 1/ VOS2.0 V VCONTROL 26 V 1.6 V VIN- VOUT 25 V, ILOAD= 10 mA 1,2,3 01 -0.15 0.15 mV/V Load regulation 1/ VOS1.0 mA IOUT 1.0 A, (VIN - VOUT)= 3 V 1,2,3 01 -1.4 1.4 mV Thermal regulation 30 ms pulse,
41、 TC= +25C 1 01 0.03 %/W Dropout voltage VDROPIOUT= 1.0 A, VCONTROL = VIN1,2,3 01 1.60 V IOUT= 0.1 A, VCONTROL = VIN 1/ 2/ 1.60 IOUT= 1.0 A, VCONTROL 1.6 V 01 0.5 IOUT= 0.1 A, VCONTROL 1.6 V 1/ 2/ 0.25 Current limit IMAXVIN = VCONTROL= 26 V, VOUT= 0.1 V, TC= +25C 1 01 1.1 A Minimum load current 1/ 2/
42、 IMINVIN = VCONTROL= 26 V, VOUT= 0.1 V 1,2,3 01 0.9 mA Ripple rejection IOUT= 0.2 A, (VIN - VOUT)= 3 V, f = 120 Hz, COUT= 2.2 F, CSET= 0.1 f 1,2,3 01 60 dB 1/ The active elments that make up this device has been tested to RHA designator level “R“ (100 krad(Si) of Method 1019, condition A of MIL-STD-
43、883 and low dose rate tested to the requirements of Method 1019, condition D and paragraph 3.13.1 of MIL-STD-883 to 50 krad(Si) at +25C for these parameters and limits. No ELDRS effect was observed. The elements will be re-tested after design or process changes that can affect RHA response of these
44、elements. RHA testing of the active elements covered on this SMD were done in alternate package (TO3), not the packages as specified in paragraph 1.2.4. 2/ Not tested. Shall be guaranteed by design, characterization, or correlation to other tested parameters. Provided by IHSNot for ResaleNo reproduc
45、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case U FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permit
46、ted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-13203 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Case U - Continued. Symbol Inches Millimeters Min Max Min Max A .220 5.59 b .028 .032 0.71 0.81 b3 .085 .095 2.12 2.41 D .75
47、0 .760 19.05 19.30 D1 .510 .520 12.95 13.21 e .100 BSC 2.54 BSC e1 .300 BSC 7.62 BSC e2 .108 BSC 2.74 BSC eA .700 .740 17.78 18.80 E .410 .420 10.41 10.67 F .035 .045 0.90 1.14 G1 .632 BSC 16.05 BSC G2 .2025 .2125 5.144 5.408 L1 .230 5.84 L2 .150 REF 3.81 REF p .140 .150 3.56 3.81 Q .122 TYP 3.10 TY
48、P R .065 TYP 1.65 TYP S1 .028 0.71 NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. The package contains a BeO substrate. 3. The case is electrically isolated. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for R
