1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED C Add device type 02. Electrical changes to table I. Convert to latest boilerplate. Editorial changes throughout. 93-01-15 Monica L. Poelking D Changes in accordance with NOR 5962-R046-99. 99-04-01 Monica L. Poelking E Update boilerplate to MIL-PRF
2、-38535 requirements. - CFS 05-03-17 Thomas M. Hess THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV E SHEET 15 REV E E E E E E E E E E E E E E REV STATUS OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Greg A. Pitz CHECKED BY D. A. DiCenzo DEFENSE SUPPL
3、Y CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY N. A. Hauck DRAWING APPROVAL DATE 85-05-08 MICROCIRCUIT, DIGITAL, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON SIZE A CAGE CODE 67268 84065 STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL D
4、EPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REVISION LEVEL E SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E208-05 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS
5、COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN
6、is as shown in the following example: 84065 01 J A Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Frequency Circuit function 01 82C54 8 MHz CMOS mono
7、lithic programmable interval timer 02 82C54-12 12 MHz CMOS monolithic programmable interval timer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style J GDIP1-T24 or CDIP2-T24 24 Dual-in-line 3 CQCC
8、1-N28 28 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) (referenced to ground) +8.0 V dc maximum Input, output, or I/O voltage applied . GND 0.5 V dc to VCC+ 0.5 V dc Storage temperature
9、 range -65C to +150C Maximum power dissipation (PD) 1 W Lead temperature (soldering, 10 seconds). +275C Maximum junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC): Case outlines J and 3 . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) 4.5 V
10、 dc to 5.5 V dc Frequency of operation (Device 01) . 8 MHz maximum Frequency of operation (Device 02) . 12.5 MHz maximum Case operating temperature range (TC) . -55C to +125C Clock rise time (tR) . 25 ns maximum Clock falle (tF). 25 ns maximum RD to data floating (tDF) (Device 01). 5 ns minimum to 9
11、0 ns maximum 1/ RD to data floating (tDF) (Device 02). 5 ns minimum to 90 ns maximum 1/ _ 1/ See reference number 7 of figure 3 and test condition 2 of figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWI
12、NG DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein.
13、 Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircu
14、its. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ o
15、r http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.
16、 Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specifi
17、ed herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved pr
18、ogram plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not af
19、fect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535,
20、appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Functional diagram. The functional diagram shall be as specified on figure 2. 3.2.4 Timing waveforms.
21、The timing waveforms shall be as specified on figure 3. 3.2.5 AC test circuit and waveform. The AC test circuit and waveform shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING
22、 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating
23、temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked wi
24、th the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q” o
25、r “QML” certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. For product built in accordance with A.3.2.2 of MIL-PRF-38535, or as modified in the manufacturers QM plan, the “QD” certification mark shall be used in place of the “Q” or “QML” certification m
26、ark. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affi
27、rm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Not
28、ification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documen
29、tation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FO
30、RM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions 1/ 4.5 V VCC 5.5 V, -55C TC +125C unless otherwise specified Device type Group A subgroups Min Max Unit Input high voltage VIHVCC= 5.5 V All 1, 2, 3 2.2 V Input low voltage VILVCC= 4.5 V All 1, 2, 3 0.8 V V
31、OH1VCC= 4.5 V, IOH= -2.5 mA 2/ All 1, 2, 3 3.0 Output high voltage VOH2VCC= 4.5 V, IOH= -100 A 2/ All 1, 2, 3 VCC 0.4 V Output low voltage VOLVCC= 4.5 V, IOL= +2.5 mA 2/ All 1, 2, 3 0.4 V Input leakage current IILVCC= 5.5 V, VIN= 0 V or VCCAll 1, 2, 3 -2.0 2.0 A Output leakage current IOVCC= 5.5 V,
32、VOUT= 0 V or VCCAll 1, 2, 3 -10.0 10.0 A Standby power supply current ICCSBVCC = 5.5 V, VIN = VCC, Inputs low, outputs open. All 1, 2, 3 10 A Operating power supply current ICCOPVCC = 5.5 V, CLK FREQ = 8 MHz, Outputs open. All 1, 2, 3 10 mA 01 10 Input capacitance CINFREQ = 1 MHz, TC= 25C, All measu
33、rements referenced to device ground See 4.3.1c. 02 4 15 pF Output capacitance COUTAll measurements referenced to device ground See 4.3.1c. All 4 20 pF I/O capacitance CI/OAll measurements referenced to device ground See 4.3.1c All 4 20 pF Functional test See 4.3.1d. 3/ All 7, 8 See footnotes at end
34、of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristi
35、cs - Continued. Limits Test Symbol Conditions 1/ 4.5 V VCC 5.5 V, -55C TC +125C unless otherwise specified Ref. no. 4/ Device type Group A subgroups Min Max Unit 01 30 Address stable before RD tAR1(1) 02 9, 10, 11 15 ns CS stable before RD tSR2(1) All 9, 10, 11 0 ns Address hold time after RD tRA3(1
36、) All 9, 10, 11 0 ns 01 150 RD pulse width tRR4(1) 02 9, 10, 11 60 ns 01 120 Data delay from RD tRD5(1) 02 9, 10, 11 40 ns 01 210 Data delay from address tAD6(1) 02 9, 10, 11 60 ns 01 200 Command recovery time tRV8 02 9, 10, 11 60 ns Address stable before WR tAW9 All 9, 10, 11 0 ns CS stable before
37、WR tSW10 All 9, 10, 11 0 ns Address hold time WR tWA11 All 9, 10, 11 0 ns 01 95 WR pulse width tWW12 02 9, 10, 11 60 ns 01 140 Data setup time before WR tDW13 02 9, 10, 11 70 ns 01 25 Data hold time after WR tWD14 02 9, 10, 11 0 ns 01 125 Clock period tCLK15(1) 02 9, 10, 11 80 ns 01 60 High pulse wi
38、dth tPWH16(1) 02 9, 10, 11 30 ns 01 60 Low pulse width tPWL17(1) 02 9, 10, 11 35 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHI
39、O 43218-3990 REVISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 4.5 V VCC 5.5 V, -55C TC +125C unless otherwise specified Ref. no. 4/ Device type Group A subgroups Min Max Unit 01 50 Gate width high tGW20(1) 02
40、 9, 10, 11 20 ns 01 50 Gate width low tGL21(1) 02 9, 10, 11 20 ns 01 50 Gate setup time to CLK tGS22(1) 02 9, 10, 11 15 ns 01 50 Gate hold time after CLK tGH23(1) 02 9, 10, 11 15 ns 01 150 Output delay from CLK tOD24(1) 02 9, 10, 11 50 ns 01 120 Output delay from gate tODG25(1) 02 9, 10, 11 50 ns 01
41、 260 Output delay from mode tWO26(1) 02 9, 10, 11 130 ns 1/ All ac parameters as per circuit and waveform on figure 4 and tested at worse case, VCC= 4.5 V. 2/ Interchangeing of force and sense conditions is permitted. 3/ Tested as follows: f = 1 MHz, VIH= 2.6 V, VIL= 0.4 V, CL= 50 pF, VOH 1.5 V, and
42、 VOL 1.5 V. 4/ The reference number refers to the parameter being measured on figure 3 and the number identified in ( ) refers to the test condition on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWI
43、NG DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 Device types: 01 and 02 Case outlines: J 3 Terminal number Terminal symbol Terminal symbol 1 D7 NC 2 D6 D7 3 D5 D6 4 D4 D5 5 D3 D4 6 D2 D3 7 D1 D2 8 D0 D1 9 CLK 0 D0 10 OUT 0 CLK 0 11 GATE 0 NC
44、 12 GND OUT 0 13 OUT 1 GATE 0 14 GATE 1 GND 15 CLK 1 NC 16 GATE 2 OUT 1 17 OUT 2 GATE 1 18 CLK 2 CLK 1 19 A0 GATE 2 20 A1 OUT 2 21 CS CLK 2 22 RD A0 23 WR A1 24 VCCCS 25 NC 26 RD 27 WR 28 VCCNC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking
45、 permitted without license from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 FIGURE 2. Functional diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
46、e from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 10 DSCC FORM 2234 APR 97 FIGURE 3. Timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SIZE A 8406
47、5 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 11 DSCC FORM 2234 APR 97 NOTE: Last byte of count being written. FIGURE 3. Timing waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens
48、e from IHS-,-,-SIZE A 84065 STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 12 DSCC FORM 2234 APR 97 Test Condition Definition Table Test condition V1R1R2C11 1.7 V 523 Open 150 pF 2 VCC2 k 1.7 k 50 pF AC testing: All input signals must switch between VIL 0.4 V and VIH+ 0.4 V. Input rise and fall times are driven at 1 ns/V. NOTE: 1. Includes stray and jig capacitance. FIGURE 4. AC test circuit and waveform. Provided by IHSNot for ResaleNo reproduction or networking permitted with
