1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to military drawing format. Add vendor CAGE 23223. Pages 6 and 7, table I: Guarantee Delta VIO/Delta P, RIN, and PC. 88-06-21 M. A. Frye B Add vendor CAGE 27014. Editorial changes throughout. Changed to MIL-H-38534 format. 91-02-06 W. Heck
2、man C Changes in accordance with NOR 5962-R058-92. 91-11-19 Gregory Lude D Changes in accordance with NOR 5962-R105-92. 92-01-06 Alan BaroneE Changes in accordance with NOR 5962-R078-96. 96-03-12 K. A. CottongimF Remove CAGE codes 23223, 27014, and 64762. Changes to table I. 98-07-01 K. A. Cottongim
3、G Figure 1, correct the upper measurement point for lead length from on top of the flange to the bottom side of the flange. Table I, Output voltage swing test, subgroups column, change subgroups 1, 2, 3, and 1 (both test conditions) to 4, 5, 6, and 4. Table I, Output short circuit current test, corr
4、ect min/max limits from -0.8 and +1.6 to 0.8 and 1.6. 05-06-02 Raymond Monnin H Updated drawing paragraphs. -sld 11-01-13 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS REV H H H H H H H H H OF SHEETS SHEET 1 2 3 4
5、 5 6 7 8 9 PMIC N/A PREPARED BY Donald R. Osborne DLA LAND AMD MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, HYBRID, LINEAR, 1-AMPERE, POWER,
6、OPERATIONAL AMPLIFIER, THICK FILM AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 85-11-04 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 14933 85088 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E115-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
7、IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines and lead finishes are ava
8、ilable and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 85088 01 Y C Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3)1.2.1 Device type(s). The device type(s) shall identify the circuit funct
9、ion as follows: Device type Generic number Circuit function 01 LH0021, MSK 0021B High power operational amplifier (1-ampere output) externally compensated 1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals
10、 Package style Y See figure 1 8 Metal base flange mount (TO-3) 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Supply voltage (VS) . 18 V dc Input voltage range 15 V dc 1/ Power dissipation (PD) . 6 W 2/ Differential input voltage 30 V dc Peak
11、 output current . 2 A 3/ Output short circuit duration Continuous 4/ Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance: Junction-to-case (JC) 2C/W Junction-to-ambient (JA) . 25C/W Junction temperature (TJ) +150C 1.4 Recommended operating cond
12、itions. Ambient operating temperature range (TA) -55C to +125C 1/ Rating applies for supply voltage above 15 V. For supplies less than 15 V, rating is equal to the supply voltage. 2/ Rating applies at TA= +25C without a heat sink. 3/ Rating applies for RSC= 0 ohms. 4/ Rating applies as long as packa
13、ge power rating is not exceeded. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Gov
14、ernment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFIC
15、ATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcirc
16、uit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the even
17、t of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individ
18、ual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for applicable device class. The ma
19、nufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the
20、 applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1. 3.2.2 Terminal connectio
21、ns. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical te
22、st requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1
23、.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC
24、FORM 2234 APR 97 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed
25、herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon req
26、uest. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requiremen
27、ts of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance
28、 with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall ap
29、ply: a. Pre-seal burn-in test, method 1030 of MIL-STD-883. (optional for class H) (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon r
30、equest. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1030 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-
31、883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, bias
32、es, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim elect
33、rical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHE
34、ET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIO RS 100 2/ 1 01 3 mV 2,3 5 Offset voltage change with output power PVIOPVVPVIO2IO1IO
35、 3/ 4/ P = 13.5 watts 1,2,3 01 15 V/W Input offset current IIO 2/ 1 01 100 nA 2,3 300 Input bias current IIB 2/ 1 01 300 nA 2,3 1 A Input resistance RINTA= +25C 4/ 1 01 0.3 M Common mode rejection ratio CMRR RS 100, VCM= 10 V 5/ 4,5,6 01 70 dB Input voltage range VINCM4/ 1,2,3 01 12 V Power supply r
36、ejection ratio PSRR RS= 100, VS= 5 V to 15 V 1,2,3 01 80 dB Voltage gain 6/ AV VO= 10 V, RL= 1 k, TA= +25C 4 01 100 V/mV VO= 10 V, RL= 100, 4/ 5/ 4,5,6 01 25 Output voltage swing VORL= 100 4,5,6 01 13.5 V RL= 10TA= +25C 4 01 11 Output short circuit current ISC RSC= 0.5, TA= +25C 1 01 0.8 1.6 A See f
37、ootnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance charac
38、teristics - Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Supply current ICCVOUT= 0 V 1,2,3 01 3.5 mA Power consumption PCVOUT= 0 V 4/ 1,2,3 01 105 mW Slew rate SR AV= 1, RL= 100, TA= +25C4 01 1.5 V/s Small signal rise
39、time tr TA= +25C 9 01 1 s Small signal fall time tf TA= +25C 9 01 1 s Small signal overshoot TA= +25C4 01 20 % 1/ Unless otherwise specified, VS= 15 V, CC= 3000 pF. 2/ Specifications apply for 5 V VS 18 V. 3/ VIO1= VIOat VS= 15 V, VO= 0 V, IO= 100 mA. VIO2= VIOat VS= 15 V, VO= 0 V, IO= 1 A for 5 ms.
40、 4/ Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 5/ Subgroups 5 and 6 shall be tested as part of device characterization and after design and process changes. Parameter shall be guaranteed to the limits specified for subgroups 5 and 6 for all
41、 lots not specifically tested. 6/ The amplifier has a “dead band“ when VOUTis near zero volts. Typical values for the “dead band“ are in the 50 to 200 V range. Open-loop gain is measured at VOUTfrom 0.5 V dc to 10 V dc which is out of the range of the “dead band“. Provided by IHSNot for ResaleNo rep
42、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 Case outline Y. Inches mm 0.036 0.92 0.044 1.120.085 2.16 0.105 2.670.153 3.89 0.159 4.040.166 4.22
43、 0.176 4.470.220 5.59 0.260 6.600.280 7.11 0.395 10.030.495 12.57 0.505 12.830.589 14.96 0.599 15.220.760 19.30 0.775 19.690.900 22.86 0.925 23.500.980 24.89 1.020 25.911.177 29.90 1.197 30.401.509 38.33 1.594 39.35NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general infor
44、mation only. FIGURE 1. Case outline(s). FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85088 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 8 DSCC FORM 2234
45、 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3, 4, 5, 6, 9 Group A test requirements 1, 2, 3, 4, 9 Group C end-point electrical param
46、eters 1, 2, 3 * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534
47、 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534
48、 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipa
