1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change vendor part number from 54F148/B2C to 54F148/B2A. Table I IILcolumn delete IE and substitute EI . Table I tPHL6maximum limits column delete 11 and substitute 13. Add figure 4 to document. Editorial changes throughout. -ljs 88-12-13 M. A. F
2、rye B Revise for “QD” certification. New boilerplate. -ljs 99-11-08 Raymond Monnin C Update to current requirements. Editorial changes throughout. - gap 06-01-04 Raymond Monnin D Update drawing as part of 5 year. - jt 13-01-08 C. SAFFLE The original first page of this drawing has been replaced. REV
3、SHEET REV SHEET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCI
4、ES OF THE DEPARTMENT OF DEFENSE CHECKED BY Ray Monnin APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL. 8-BIT IDENTITY COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-11-25 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-86070 SHEET 1 OF 10 DSCC FORM 22
5、33 APR 97 5962-E072-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing des
6、cribes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86070 01 E X Drawing number Device type (see 1.2.1) Case outline (
7、see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 54F148 8-line to 3-line priority encoder 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline let
8、ter Descriptive designator Terminals Package style E GDIP1T-16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or GDFP3-F16 16 flat package 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range
9、-0.5 V dc minimum to +7.0 V dc maximum Input voltage range . -1.5 V at -18 mA to +7.0 V dc Storage temperature range . -65C to +150C Maximum power dissipation (PD) 1/ 193 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperatu
10、re(TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V minimum to 5.5 V maximum Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) 0.8 V dc Case operating temperature (TC) -55C to +125C _ 1/ Maximum power dissipation is defined as VCC
11、x ICC, and must withstand the added PDdue to short circuit test, e.g. IOS Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FO
12、RM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitati
13、on or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEF
14、ENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, P
15、A 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
16、 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified m
17、anufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Mana
18、gement (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify
19、when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connec
20、tions. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagrams. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms sha
21、ll be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networ
22、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.
23、The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD
24、 PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indi
25、cator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. For product built in accordance with A.3.2.2 of MIL-PRF-38535, or as modified in the manufacturers QM plan, the “QD” certification mark shall be used in p
26、lace of the “Q“ or “QML“ certification mark. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA p
27、rior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with ea
28、ch lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity
29、retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-3853
30、5, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D.
31、The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the int
32、ent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleN
33、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C unle
34、ss otherwise specified Group A subgroups Limits Unit Min Max High level output voltage VOH VCC= 4.5 V, VIL= 0.8 V IOH= -1 mA, VIH= 2.0 V 1, 2, 3 2.5 V Low level output voltage VOL VCC= 4.5 V, VIL= 0.8 V IOL= 20 mA, VIH= 2.0 V 1, 2, 3 0.5 V Input clamp voltage VIC VCC= 4.5 V, IIN= -18 mA 1, 2, 3 -1.2
35、 V High level input current IIH1VCC= 5.5 V, VIN= 7.0 V 1, 2, 3 100 A IIH2VCC= 5.5 V, VIN= 2.7 V 1, 2, 3 20 A Low level input current IIL VCC= 5.5 V 0I , EI 1, 2, 3 -0.6 mA VIN= 0.5 V 1I , 7I 1, 2, 3 -1.2 mA Short circuit output current IOS VCC= 4.5 V, VOUT= 0.0 V 1/ 1, 2, 3 -60 -150 mA Supply curren
36、t ICCVCC= 5.5 V 1, 2, 3 35 mA Functional tests See 4.3.1c 7, 8 Propagation delay time, nI to nA tPLH1 VCC= 5.0 V RL= 500 9 9 ns 10, 11 12 tPHL1 CL= 50 pF 9 11 10, 11 15 Propagation delay time, nI to EO tPLH2 9 7 ns 10, 11 9 tPHL2 9 8 10, 11 11 Propagation delay time, Into GS tPLH3 9 11 ns 10, 11 15
37、tPHL3 9 11 10, 11 15 Propagation delay time, EI to nA tPLH4 9 9 ns 10, 11 12 tPHL4 9 8 10, 11 11 Propagation delay time, EI to GS tPLH5 9 7 ns 10, 11 9 tPHL5 9 11 10, 11 15 Propagation delay time, EI to EO tPLH6 9 7 ns 10, 11 9 tPHL6 9 11 10, 11 13 1/ Not more than one output should be shorted at a
38、time, and the duration of the short circuit condition should not exceed 1 second. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6
39、 DSCC FORM 2234 APR 97 Case outlines E and F 2 Terminal number Terminal symbol 1 4I NC 2 5I 4I 3 6I 5I 4 7I 6I 5 EI 7I 6 2A NC 7 1A EI 8 GND 2A 9 0A 1A 10 0I GND 11 1I NC 12 2I 0A 13 3I 0I 14 GS 1I 15 EO 2I 16VCC NC17 - 3I 18 - GS 19 - EO 20 - VCC NC = No connection FIGURE 1. Terminal connections. P
40、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Inputs Outputs EO 0I 1I 2I 3I 4I 5I 6I 7I GS 0A 1A 2A EO H X
41、 X X X X X X X H H H H H L H H H H H H H H H H H H L L X X X X X X X L L L L L H L X X X X X X L H L H L L H L X X X X X L H H L L H L H L X X X X L H H H L H H L H L X X X L H H H H L L L H H L X X L H H H H H L H L H H L X L H H H H H H L L H H H L L H H H H H H H L H H H H H -= High voltage level
42、 L = Low voltage level X = Irrelevant FIGURE 2. Truth table. FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHE
43、ET 8 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance 2. Input pulse requirements: PRR = 1 MHz, tTLH= tTHL= 2.5 ns, duty cycle = 50%. 3. RT= termination resistance is to ZOUTof pulse generator. FIGURE 4. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reprod
44、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86070 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance wi
45、th MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies
46、 to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II h
47、erein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initial test and after process or design changes which may affect input capacitance. 4.3.2 Groups C and D inspections. a. End-point electrical parame
48、ters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissip
