1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 4. Change IIHand IIL. Change in terminal connections. Add subgroup 8 to table II. Change vendor part number for case outline 2. Editorial changes throughout. Technical changes to table I and footnotes. 89-03-15 M. A. Frye B Changes in
2、accordance with NOR 5962-R031-92. 91-11-27 Monica L. Poelking C Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - gap 07-05-02 Robert M. Heber The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C
3、C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Ray Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A.
4、Frye MICROCIRCUIT, DIGITAL, ECL, 2-3-2 INPUT AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-11-17 OR/NOR GATE, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87507 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E168-07 Provided by IHSNot for ResaleNo reproduct
5、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, n
6、on-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87507 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). T
7、he device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10H505 Triple 2-3-2 input OR/NOR gate 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style
8、E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -8.0 V to 0.0 V Input voltage range . -5.2 V
9、to 0.0 V Storage temperature range . -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 171 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46
10、V minimum to -4.94 V maximum Supply voltage range (VCC) . -0.02 V to +0.02V or 1.98 V to 2.02 V Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) . -1.950 V P
11、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specificatio
12、n, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535
13、- Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawin
14、gs. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of prece
15、dence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item require
16、ments. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who
17、 has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modific
18、ations to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used.
19、 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections s
20、hall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics
21、are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for Resa
22、leNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. T
23、he part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certific
24、ation/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is us
25、ed. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affir
26、m that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Noti
27、fication of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore document
28、ation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be co
29、nducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be ma
30、de available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test para
31、meters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-
32、87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent tests 1/ VI
33、HVIL-0.780 -1.950 1 -1.010 -0.780 -0.650 -1.950 2 -0.860 -0.650 High level output voltage VOH-0.840 -1.950 3 -1.060 -0.840 V -0.780 -1.950 1 -1.950 -1.580 -0.650 -1.950 2 -1.950 -1.565 Low level output voltage VOL-0.840 -1.950 3 -1.950 -1.610 V -1.110 -1.480 1 -1.010 -0.780 -0.960 -1.465 2 -0.860 -0
34、.650 High level threshold output voltage VOHA-1.160 -1.510 3 -1.060 -0.840 V -1.110 -1.480 1 -1.950 -1.580 -0.960 -1.465 2 -1.950 -1.565 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.160 -1.510 3 -1.950 -1.610 V 1 -21 Power supply drain
35、3/ current IEE2, 3 -23 mA 1, 2 265 High level input current IIHVEE= -5.46 V VCC= 0.0 V VIH= -0.780 V at +25C -0.650 V at +125C -0.840 V at -55C 3 425 A 1, 3 0.5 Low level input current IILVEE= -4.95 V 3/ VIL= -1.950 V VCC= 0.0 V 2 0.3 A Functional tests See 4.3.1c 7, 8 See footnotes at end of table.
36、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics -
37、 Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E and F Rapid tests 4/ VIHVIL-0.788 -1.950 1 -1.017 -0.788 -0.658 -1.950 2 -0.868 -0.658 High level output voltage VOH-0.848 -1.950 3 -1.068 -0.848 V -0.788 -1.950 1 -1.950 -1.582
38、-0.658 -1.950 2 -1.950 -1.568 Low level output voltage VOL-0.848 -1.950 3 -1.950 -1.613 V -1.117 -1.482 1 -1.017 -0.788 -0.968 -1.468 2 -0.868 -0.658 High level threshold output voltage VOHA-1.168 -1.513 3 -1.068 -0.848 V -1.117 -1.482 1 -1.950 -1.582 -0.968 -1.468 2 -1.950 -1.568 Low level threshol
39、d output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.168 -1.513 3 -1.950 -1.613 V 1 -20 Power supply drain 3/ current IEE2, 3 -22 mA 1, 2 250 High level input current IIHVEE= -5.46 V VCC= 0.0 V VIH= -0.799 V at +25C -0.670 V at +125C -0.860 V at -55C 3 410 A 1,
40、3 0.5 Low level input current IILVEE= -4.94 V 3/ VIL= -1.950 VCC= 0.0 V 2 0.3 A Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SU
41、PPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Case 2 Rapid tests 4/ VIHVIL-0.793 -1.950 1
42、 -1.022 -0.793 -0.664 -1.950 2 -0.873 -0.664 High level output voltage VOH-0.854 -1.950 3 -1.073 -0.854 V -0.793 -1.950 1 -1.950 -1.584 -0.664 -1.950 2 -1.950 -1.569 Low level output voltage VOL-0.854 -1.950 3 -1.950 -1.614 V -1.122 -1.484 1 -1.022 -0.793 -0.973 -1.469 2 -0.873 -0.664 High level thr
43、eshold output voltage VOHA-1.173 -1.514 3 -1.073 -0.854 V -1.122 -1.484 1 -1.950 -1.584 -0.973 -1.469 2 -1.950 -1.569 Low level threshold output voltage VOLAOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 2/ -1.173 -1.514 3 -1.950 -1.614 V 1 -20 Power supply drain 3/ current IEE2, 3
44、-22 mA 1, 2 250 High level input current IIHVEE= -5.46 V VCC= 0.0 V VIH= -0.807 V at +25C -0.680 V at +125C -0.870 V at -55C 3 410 A 1, 3 0.5 Low level input current IILVEE= -4.94 V 3/ VCB= -1.950 V VCC= 0.0 V 2 0.3 A Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot
45、 for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87507 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits
46、Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 AC test conditions 9 0.50 1.40 10 0.65 1.50 Transition time tTLH, tTHL11 0.40 1.30 ns 9 0.45 1.40 10 0.45 1.60 Propagation delay time, A, B, C to Y tPHH11 0.45 1.50 ns 9 0.40 1.40 10 0.40
47、 1.50 tPLLVEE= -2.94 V VCC= 2.0 V CL 5 pF Load all outputs through 100 to ground See figure 4 11 0.40 1.30 ns 9 0.45 1.60 10 0.45 1.60 tPHL11 0.45 1.50 ns 9 0.40 1.40 10 0.40 1.60 tPLH11 0.40 1.20 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defin
48、ed as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level output current varies with tem
