1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 4. Technical changes to 1.3, 1.4, table I, and table II. Change in terminal connections. Change VSPN for case outline 2. Editorial changes throughout. 89-08-21 M. A. Frye B Changes in accordance with NOR 5962-R064-92. 91-12-09 Monica L
2、 Poelking C Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - gap 09-10-09 Charles F. Saffle The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMI
3、C N/A PREPARED BY Monica L. Grosel DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCenzo APPROVED BY N. A. Hauck MICROCIRCUI
4、T, DIGITAL, ECL, BINARY TO 1-4 DECODER, LOW, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-07-13 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87568 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E312-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
5、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with M
6、IL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87568 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as foll
7、ows: Device type Generic number Circuit function 01 10H571 Binary to 1-4 decoder, (low) 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F GDFP2-
8、F16 or CDFP3-F16 16 Flat pack package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) -8.0 V dc to 0.0 V dc Input voltage range -5.2 V dc to 0.0 V dc Storage temperat
9、ure range -65C to +165C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) . 441 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) -5.46 V dc to -4.94 V dc Supply
10、 voltage range (VCC) -0.02 V dc to +0.02 V dc or +1.98 V dc to +2.02 V dc Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V TA= +125C -0.650 V TA= -55C . -0.840 V Maximum low level input voltage (VIL) -1.950 V Provided by IHSNot for Resa
11、leNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook
12、s. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Man
13、ufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standar
14、d Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of t
15、his drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in acc
16、ordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF
17、-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications
18、shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The
19、 design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. Th
20、e truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherw
21、ise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for ea
22、ch subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking.
23、 Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has th
24、e option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accorda
25、nce with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSC
26、C-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided w
27、ith each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers
28、facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall
29、be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the m
30、anufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.
31、(2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted withou
32、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions Group A subgroups Limits Unit -55C TA +125C unless ot
33、herwise specified Min Max Cases E, F, and 2 Quiescent conditions 1/ VIHVILHigh level output voltage VOHOutputs -0.780 -1.950 1 -1.010 -0.780 V terminated through -0.650 -1.950 2 -0.860 -0.650100 to -2 V -0.840 -1.950 3 -1.060 -0.840 Low level output voltage VOLVCC= 0.0 V -0.780 -1.950 1 -1.950 -1.58
34、0 V EE= -5.2 V -0.650 -1.950 2 -1.950 -1.363 2/ -0.840 -1.950 3 -1.950 -1.610High level threshold VOHA-1.110 -1.480 1 -1.010 -0.780 V output voltage -0.960 -1.465 2 -0.860 -0.650 -1.160 -1.510 3 -1.060 -0.840Low level threshold VOLA-1.110 -1.480 1 -1.950 -1.580 V output voltage -0.960 -1.465 2 -1.95
35、0 -1.363 -1.160 -1.510 3 -1.950 -1.610Power supply drain current IEEVEE= -5.46 V 1 -77 mA 3/ VCC= 0.0 V 2, 3 -85 High level input current IIHVIH: +25C = -0.780 V 1 275 A +125C = -0.650 V 2, 3 465 -55C = -0.840 V Low level input current IILVEE= -4.94 V, VCC= 0.0 V 3/ 1, 3 0.5 A VIL= -1.950 V 2 0.3 Fu
36、nctional tests See paragraph 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6
37、DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions Group A subgroups Limits Unit -55C TA +125C unless otherwise specified Min Max Cases E and F DC rapid test conditions 4/ VIHVILHigh level output voltage VOHOutputs -0.802 -1.950 1 -1.031 -0.802
38、V terminated through -0.674 -1.950 2 -0.882 -0.674100 to -2 V -0.864 -1.950 3 -1.082 -0.864 Low level output voltage VOLVCC= 0.0 V -0.802 -1.950 1 -1.950 -1.587 V EE= -5.2 V -0.674 -1.950 2 -1.950 -1.572 2/ -0.864 -1.950 3 -1.950 -1.617High level threshold VOHA-1.131 -1.487 1 -1.031 -0.802 V output
39、voltage -0.982 -1.472 2 -0.882 -0.674 -1.182 -1.517 3 -1.082 -0.864Low level threshold VOLA-1.310 -1.487 1 -1.950 -1.587 V output voltage -0.982 -1.472 2 -1.950 -1.572 -1.820 -1.517 3 -1.950 -1.617Power supply drain current IEEVEE= -5.46 V 1 -76 mA 3/ VCC= 0.0 V 2, 3 -84 High level input current IIH
40、VIH: +25C = -0.802 V 1 260 A +125C = -0.674 V 2, 3 450 -55C = -0.864 V Low level input current IILVEE= -4.94 V, VCC= 0.0 V 3/ 1, 3 0.5 A VIL= -1.950 V 2 0.3 Functional tests See paragraph 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted
41、without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions Group A subgroups Limits Unit -55C
42、TA +125C unless otherwise specified Min Max Case 2 DC rapid test conditions 4/ VIHVILHigh level output voltage VOHOutputs -0.809 -1.950 1 -1.037 -0.809 V terminated through -0.682 -1.950 2 -0.889 -0.682100 to -2 V -0.872 -1.950 3 -1.089 -0.872 Low level output voltage VOLVCC= 0.0 V -0.809 -1.950 1 -
43、1.950 -1.589 V EE= -5.2 V -0.682 -1.950 2 -1.950 -1.575 2/ -0.872 -1.950 3 -1.950 -1.620High level threshold VOHA-1.137 -1.489 1 -1.037 -0.809 V output voltage -0.989 -1.475 2 -0.889 -0.682 -1.189 -1.520 3 -1.089 -0.872Low level threshold VOLA-1.137 -1.489 1 -1.950 -1.589 V output voltage -0.989 -1.
44、475 2 -1.950 -1.575 -1.189 -1.520 3 -1.950 -1.620Power supply drain current IEEVEE= -5.46 V 1 -76 mA 3/ VCC= 0.0 V 2, 3 -84 High level input current IIHVIH: +25C = -0.809 V 1 260 A +125C = -0.682 V 2, 3 450 -55C = -0.872 V Low level input current IILVEE= -4.94 V, VCC= 0.0 V 3/ 1, 3 0.5 A VIL= -1.950
45、 V 2 0.3 Functional tests See paragraph 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87568 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
46、 C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions Group A subgroups Limits Unit -55C TA +125C unless otherwise specified Min Max Case E, F, and 2 AC rapid test conditions Transition time tTLH,VEE= -2.94 9 0.50 2.00 ns tTHLVCC= 2.0 V
47、10 0.60 2.20 CL 5 pF 11 0.40 2.20 Propagation delay time tPHH,Load all outputs through 9 0.50 3.00 ns PLL,100 to ground 10 0.50 3.20 tPHL,See figure 4 11 0.50 3.20 PLH1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the
48、device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least four minutes before the reading is taken. This method was used for theoretical limit establishment only. All devices shall be tested to the delta V (rapid test) conditions specified herein. The rapid test method is an equivalent method of testing quiescent conditions. 2/ The high and low level output current varies with
