1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add figure 3. Technical changes in 1.3, 1.4, and tables I and II. Change terminal connections. Editorial changes throughout. 89-08-28 M. A. Frye B Changes in accordance with NOR 5962-R069-92. 91-12-09 Monica L. Poelking C Redrawn with changes. Up
2、date drawing to current requirements. Editorial changes throughout. - gap 07-06-14 Robert M. Heber The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Monica L. Poelk
3、ing DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Monica L. Poelking COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, BINARY AND AGENCIES OF THE DEPARTMENT OF DEFENS
4、E DRAWING APPROVAL DATE 88-03-11 COUNTER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87590 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E249-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
5、ZE A 5962-87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part
6、 or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87590 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Ci
7、rcuit function 01 10H416 4-binary counter 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat pack 2 CQCC1-N20 20 leadless
8、square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VEE) . -8.0 V dc to 0.0 V dc Input voltage range . -5.2 V dc to 0.0 V dc Storage temperature range . -65C to +165C Lead temperature (soldering, 10
9、seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) 718 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Supply voltage range (VCC) . -0.02 V dc to +0.02
10、V dc or +1.98 V dc to +2.02 V dc Ambient operating temperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C -0.780 V dc TA= +125C -0.650 V dc TA= -55C . -0.840 V dc Maximum low level input voltage (VIL) . -1.950 V dc Provided by IHSNot for ResaleNo reproduction or netw
11、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specific
12、ation, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Speci
13、fication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings.
14、(Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text
15、of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in
16、 accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL
17、-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modificati
18、ons shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions.
19、 The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table
20、s. The truth tables shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
21、 as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleN
22、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The
23、part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certificati
24、on/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used.
25、 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm t
26、hat the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notific
27、ation of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentati
28、on shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be condu
29、cted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made
30、available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test paramet
31、ers shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-875
32、90 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 Quiescent conditions 1/
33、VIHVILHigh level output voltage VOHOutputs terminated -0.780 -1.950 1 -1.010 -0.780 V through 100 to -2 V -0.650 -1.950 2 -0.860 -0.650 VCC= 0.0 V -0.840 -1.950 3 -1.060 -0.840 Low level output voltage VOLVEE= -5.2 V -0.780 -1.950 1 -1.950 -1.580 V 2/ -0.650 -1.950 2 -1.950 -1.565 -0.840 -1.950 3 -1
34、.950 -1.610 High level threshold output VOHA-1.110 -1.480 1 -1.010 -0.780 V voltage -0.960 -1.465 2 -0.860 -0.650 -1.160 -1.510 3 -1.060 -0.840 Low level threshold output VOLA-1.110 -1.480 1 -1.950 -1.580 voltage -0.960 -1.465 2 -1.950 -1.565 V -1.160 -1.510 3 -1.950 -1.610 Power supply drain curren
35、t IEEVEE= -5.46 V 1 -115 mA 3/ VCC= 0.0 V 2, 3 -126 High level input current IIH1VIH= -0.780 V at +25C Master reset 1 700 A -0.650 V at +125C 2, 3 1190 IIH2-0.840 V at -55C All other inputs 1 265 2, 3 450 Low level input current IILVEE= -4.94 V 3/ 1, 3 0.5 A VCC= 0.0 V 2 0.3 IL= -1.950 V Functional
36、tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR
37、97 TABLE I. Electrical performance characteristics - Continued. Limits Unit Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Cases E and F DC rapid test conditions 4/ VIHVILHigh level output voltage VOHOutputs terminated -0.810 -1.950 1 -1.037 -0.810 V throug
38、h 100 to -2 V -0.682 -1.950 2 -0.890 -0.682 VCC= 0.0 V -0.872 -1.950 3 -1.090 -0.872 Low level output voltage VOLVEE= -5.2 V -0.810 -1.950 1 -1.950 -1.589 V 2/ -0.682 -1.950 2 -1.950 -1.575 -0.872 -1.950 3 -1.950 -1.620 High level threshold output VOHA-1.137 -1.489 1 -1.037 -0.810 V voltage -0.990 -
39、1.475 2 -0.890 -0.682 -1.190 -1.520 3 -1.090 -0.872 Low level threshold output VOLA-1.137 -1.489 1 -1.950 -1.589 V voltage -0.990 -1.475 2 -1.950 -1.575 -1.190 -1.520 3 -1.950 -1.620 Power supply drain current IEEVEE= -5.46 V 1 -114 mA 3/ VCC= 0.0 V 2,3 -125 High level input current IIH1VIH= -0.810
40、V at +25C Master reset 1 685 A -0.682 V at +125C 2, 3 1175 IIH2-0.872 V at -55C All other 1 250 inputs 2, 3 435 Low level input current IILVEE= -4.94 V 3/ 1, 3 0.5 A VCC= 0.0 V 2 0.3 IL= -1.950 V Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduc
41、tion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions
42、 -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Case 2 DC rapid test conditions 4/ VIHVILHigh level output voltage VOHOutputs terminated -0.809 -1.950 1 -1.037 -0.809 V through 100 to -2 V -0.682 -1.950 2 -0.889 -0.682 CC= 0.0 V -0.872 -1.950 3 -1.089 -0.872 Low level output
43、 voltage VOLVEE= -5.2 V -0.809 -1.950 1 -1.950 -1.589 V 2/ -0.682 -1.950 2 -1.950 -1.575 -0.872 -1.950 3 -1.950 -1.620 High level threshold output VOHA-1.137 -1.489 1 -1.037 -0.809 V voltage -0.989 -1.475 2 -0.889 -0.682 -1.189 -1.520 3 -1.089 -0.872 Low level threshold output VOLA-1.137 -1.489 1 -1
44、.950 -1.589 V voltage -0.989 -1.475 2 -1.950 -1.575 -1.189 -1.520 3 -1.950 -1.620 Power supply drain current IEEVEE= -5.46 V 1 -114 mA 3/ VCC= 0.0 V 2, 3 -125 High level input current IIH1VIH= -0.809 V at +25C Master reset 1 685 A -0.682 V at +125C 2, 3 1175 IIH2-0.872 V at -55C All other 1 250 inpu
45、ts 2, 3 435 Low level input current IILVEE= -4.94 V 3/ 1, 3 0.5 A VCC= 0.0 V 2 0.3 IL= -1.950 V Functional tests See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-
46、87590 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C unless otherwise specified Group A subgroups Min Max Unit Cases E, F, and 2 AC test c
47、onditions Transition time tTLH,9 0.5 2.1 ns tTHLVEE= -2.94 V 10 0.5 2.2 VCC= +2.0 V 11 0.5 2.0 Propagation delay time, tPLHCL 5 pF 9 0.7 2.6 ns CP to Q, CP to TC , and RL= 100 10 0.7 2.9 MR to Q See figure 3 11 0.7 2.5 tPHL9 0.7 2.6 ns 10 0.7 2.9 11 0.7 2.5 Maximum clock frequency fMAX9 200 MHz 10 2
48、00 11 200 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with power applied for at least 4 minutes before the reading is taken. This method was used for theoretical limit establishment only. All
