1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Page 6, table I: Delete input resistance (RIN). Page 4, table I: Corrected errors in conditions column. Editorial changes throughout. Page 5, table I. Changes in conditions columns. Page 6, table I. Changes in electrical limits. Add vendor CAGE 6
2、4155 to case G. 88-04-22 M. A. Frye B Page 6, table I, AVSHcorrect VOUTcondition. Add vendor CAGE 64155 to added case P. Update format. Editorial changes throughout. 90-01-17 M. A. Frye C Changes in accordance with NOR 5962-R269-94. 94-09-16 M. A. Frye D Update boilerplate to meet current requiremen
3、ts. rrp 00-11-07 R. MONNIN E Update boilerplate to reflect current requirements. Replaced reference to MIL-STD-973 with reference to MIL-PRF-38535. rrp 03-03-20 R. MONNIN F Update drawing as part of 5 year review. - jt 10-11-10 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. RE
4、V SHEET REV SHEET REV STATUS REV F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE D
5、EPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, OP AMP AND VOLTAGE REFERENCE,MONOLITHIC SILICON DRAWING APPROVAL DATE 87-06-24 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-87604 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E044-11 Provided by IHSNot fo
6、r ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 c
7、ompliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87604 01 G A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Dev
8、ice type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 LM10 Operational amplifier and voltage reference 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals
9、 Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) . 45 V dc Differential input voltage 40 V dc 1/ Power dissipation (PD) 160 mW 2/ Output short circu
10、it duration Indefinite Storage temperature range . -55C to +150C 3/ Lead temperature (soldering, 10 seconds) 300C Junction temperature (TJ) 150C Thermal resistance, junction-to-case (JC): Cases G and P See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 150C/W Case P . 100C/W 1.4 R
11、ecommended operating conditions. Ambient operating temperature range (TA) . -55C to +125C 1/ Unless otherwise specified, all voltages are references to ground. 2/ The maximum operating junction temperature is 150C for device 01. At elevated temperatures, devices must be derated based on package ther
12、mal resistance. 3/ Internal thermal limiting prevents excessive heating that could result in sudden failure, but the IC can be subjected to accelerated stress with a shorted output and worst-case conditions. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH
13、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of th
14、is drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL
15、-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online a
16、t https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing tak
17、es precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices
18、and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacture
19、rs approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modification
20、s shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in M
21、IL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical
22、performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I.
23、 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufa
24、cturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification ma
25、rk in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4
26、 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOIL= 0 mA 1 01 2 mV 2, 3 3 VS= 1.2 V, IL= 2 mA 1 3 VS= 1.3 V, IL= 2 mA 2, 3 4 VS= 4 V, IL
27、= 20 mA 1 3 VS= 4 V, IL= 15 mA 2, 3 4 Input offset current IIO1.2 V VS 45 V, 2/ V- VCM V+ - 0.85 V 1 01 0.7 nA 1.3 V VS 45 V, 2/ V- VCM V+ - 1.0 V 2, 3 1.5 Input bias current IIB1.2 V VS 45 V, V- VCM V+ - 0.85 V 1 01 20 nA 1.3 V VS 45 V, V- VCM V+ - 1.0 V 2, 3 30 Common mode rejection CMRR VS= 45 V,
28、 -20 V VCM 24.2 V 4 01 93 dB 5, 6 87 Supply voltage rejection PSRR V+ = 0.85 V, -0.35 V V- -44.2 V 4 01 90 dB V+ = 1 V, -0.3 V V- -44.2 V 5, 6 84 0.85 V V+ +44.6 V, V- -0.35 V 4 96 1 V V+ +44.6 V, V- -0.35 V 5, 6 90 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or netwo
29、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA+125C unless otherwi
30、se specified Group A subgroups Device type Limits Unit Min Max Line regulation VRLINEIREF= 1 mA 1.2 V VS 45 V 4 01 91 dB 1.3 V VS 45 V 5, 6 85 Load regulation VRLOAD0 IREF 1 mA VS = 1.2 V 4 01 60 dB VS= 1.3 V 5, 6 57 Supply current IS1 01 400 A 2, 3 500 Large signal voltage gain AVVS= 20 V, IOUT= 0
31、mA, VOUT= 19.95 V 4 01 120 V/mV 5, 6 80 VS= 2 V VOUT= 1.4 V IOUT= 18 mA 4 5 IOUT= 15 mA 5, 6 1.5 V+ = 0.85 V, V- = -0.35 V, IOUT= 2 mA, -0.15 V VOUT 0.65 V, VCM= -0.25 V 4 1.5 V+ = 1 V, V- = -0.3 V, IOUT= 2 mA, +0.05 V VOUT 0.65 V, VCM= -0.35 V 5, 6 0.5 See footnotes at end of table. Provided by IHS
32、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Con
33、ditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Shunt gain 3/ AVSH1.2 V VOUT 6.1 V, 0.1 mA IOUT 2 mA, RL= 1.1 k 4 01 14 V/mV 1.2 V VOUT 6.2 V, 0.1 mA IOUT 2 mA, RL= 1.1 k 5, 6 6 1.4 V VOUT 6.4 V, 0.1 mA IOUT 15 mA, RL= 250 4 8 1.4 V VOUT 6.4 V, 0.
34、1 mA IOUT 10 mA, RL= 250 5, 6 4 Amplifier gain AV0.2 V VREF 35 V, IREF= 1 mA 4 01 50 V/mV 5, 6 23 Feedback sense voltage VSENSE0.2 V VREF 35 V, 0 IREF 1 mA 1 01 195 205 mV 2, 3 194 206 Feedback current ISENSE1 01 50 nA 2, 3 65 Supply current change IS0.5 V VOUT 25 V 1.2 V VS 45 V 1 01 100 A 1.3 V VS
35、 45 V 2, 3 150 VS= 5 V, 4.5 V VOUT 5 V, TA= +25C 1 60 1/ At TA= +25C: (1.2 V VS 45 V, V- VCM V+ - 0.85 V), and at TA= +125C and -55C: (1.3 V VS 45 V, V- VCM V+ -1 V), unless otherwise specified. 2/ For TJ 90C, IOSmay exceed 1.5 nA for VCM= V-. With TJ= +125C and V- VCM V- +0.1 V, IOS 5 nA. 3/ This d
36、efines operation in floating applications such as the bootstrapped regulator or two-wire transmitter. Output is connected to the V+ terminal of the IC and input common mode is referred to V- (see typical applications). Effect of larger output voltage swings with higher load resistance can be account
37、ed for by adding the positive-supply rejection error. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Devic
38、e type 01 Case outlines G and P Terminal number Terminal symbol 1 Reference output 2 OP AMP input (-) 3 OP AMP input (+) 4 V- 5 Balance 6 OP AMP output 7 V+ 8 Reference feedback FIGURE 1. Terminal connections. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufa
39、cturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, ap
40、pendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shal
41、l be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made ava
42、ilable onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
43、prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the pre
44、paring or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as spec
45、ified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87604 DLA LAND AND MARI
46、TIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method
47、5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3, 4, 5, 6 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
