DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf

上传人:eastlab115 文档编号:699032 上传时间:2019-01-01 格式:PDF 页数:10 大小:101.32KB
下载 相关 举报
DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf_第1页
第1页 / 共10页
DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf_第2页
第2页 / 共10页
DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf_第3页
第3页 / 共10页
DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf_第4页
第4页 / 共10页
DLA SMD-5962-87606 REV C-2010 MICROCIRCUIT LINEAR VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf_第5页
第5页 / 共10页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete CINtest from table I. Editorial changes throughout. Change large signal voltage gain test conditions. Change power supply current test limit for subgroup 3. 90-01-16 M. A. FRYE B Drawing updated to reflect current requirements. - ro 05-05-

2、17 R. MONNIN C Update drawing as part of 5 year review. - jt 10-11-10 C. SAFFLE THE ORGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OH

3、IO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D.A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, VOLTAGE FOLLOWER OPERATIONAL AMPLIFIERS,MONOLITHIC SILICON DRAWING A

4、PPROVAL DATE 87-08-03 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-87606 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E046-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME CO

5、LUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is

6、 as shown in the following example: 5962-87606 01 C A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 LM110 Voltage follower, high speed

7、 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified i

8、n MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) 18 V dc Input voltage (VIN) 15 V dc 1/ Storage temperature range . -65C to +150C Output short circuit duration Indefinite 2/ Lead temperature (soldering, 60 seconds) . +300C Junction temperature (TJ) . +150C Power dissip

9、ation (PD) . 500 mW Thermal resistance, junction-to-ambient (JA): Cases C and P 100C/W Case G 150C/W Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) 5 V dc to 18 V dc Ambient operating temperature range (TA) . -55C to +125

10、C _ 1/ For supply voltages less than 15 V dc, the absolute maximum input voltage is equal to the supply voltage. 2/ Continuous short circuit is allowed for case temperatures to +125C and ambient temperatures to +70C. It is necessary to insert a resistor greater than 2 k in series with the input when

11、 the amplifier is driven from low impedance sources to prevent damage when the output is shorted. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION

12、 LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those

13、 cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Out

14、lines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue,

15、 Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific

16、 exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (Q

17、ML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as d

18、ocumented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-3

19、8535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2

20、herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Schematic diagram. The schematic diagram shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics

21、are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall

22、be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not

23、 marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PR

24、F-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE

25、 I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VCC= 15 V, RS= 3 k, Group A subgroups Device type Limits Unit VIN= 0 V unless otherwise specified Min Max Input offset voltage VIOR1-8 = 1 k 1 01 4 mV 2,3 6 VCC= 18 V, R1-8 = 1 k 1 4 2,3 6 VCC= 5 V, R1-8 = 1 k 1 4 2,3 6

26、 Input bias current IIBVIN= 10 V 1 01 3 nA 2,3 10 VCC= 18 V, VIN= 10 V 1 3 2,3 10 VCC= 5 V, VIN= 2 V 1 3 2,3 10 Large signal voltage gain AVVOUT= 10 V, RL= 8 k 4 01 .999 V/V VOUT= 10 V, RL= 10 k 5,6 .999 Supply voltage rejection ration VSRR5 V VCC 18 V, R1-8 = 1 k 4,5,6 01 70 dB Output voltage swing

27、 VOUTRL= 10 k, VIN= 15 V 4,5,6 01 10 V Power supply current ICCVCC= 18 V 1 01 5.5 mA 2 4 3 7.5 Output resistance 1/ ROUTTA= +25C 1 01 2.5 Input resistance 1/ RINTA= +25C 1 01 1010 1/ Parameter tested go-no-go only. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

28、from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 FIGURE 1. Terminal connections. (Internal) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA

29、NDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 FIGURE 1. Terminal connections - Continued. (Internal) Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

30、D MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 FIGURE 2. Schematic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

31、5962-87606 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certi

32、ficate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as re

33、quired in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Mariti

34、me, DLA Land and Maritime agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and in

35、spection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, m

36、ethod 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and

37、 power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the d

38、iscretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 4, 5, 6 Group A test requiremen

39、ts (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3, 4, 5, 6 * PDA applies to subgroup 1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87606 DLA LAND AND

40、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSCC FORM 2234 APR 97 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.

41、1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test

42、conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs

43、, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging sh

44、all be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this

45、drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD

46、Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and this list will be us

47、ed for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-0547. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 4

48、3218-3990, or telephone (614) 692-0540. 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DLA Land and Maritime -VA. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 10-11-10 Approved sources of suppl

展开阅读全文
相关资源
猜你喜欢
  • ASTM E396-2005 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf ASTM E396-2005 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf
  • ASTM E396-2005(2011) 8750 Standard Test Methods for Chemical Analysis of Cadmium《镉的化学分析标准试验方法》.pdf ASTM E396-2005(2011) 8750 Standard Test Methods for Chemical Analysis of Cadmium《镉的化学分析标准试验方法》.pdf
  • ASTM E396-2012 red 2500 Standard Test Methods for Chemical Analysis of Cadmium《镉的化学分析标准试验方法》.pdf ASTM E396-2012 red 2500 Standard Test Methods for Chemical Analysis of Cadmium《镉的化学分析标准试验方法》.pdf
  • ASTM E396-2012e1 6250 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf ASTM E396-2012e1 6250 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf
  • ASTM E396-2017 red 9375 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf ASTM E396-2017 red 9375 Standard Test Methods for Chemical Analysis of Cadmium《镉化学分析的标准试验方法》.pdf
  • ASTM E398-2003 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量法测定薄板材料中水蒸气透过率的标准试验方法》.pdf ASTM E398-2003 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量法测定薄板材料中水蒸气透过率的标准试验方法》.pdf
  • ASTM E398-2003(2009)e1 516 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量法测定薄板材料中水蒸气透过率的标准试验方法》.pdf ASTM E398-2003(2009)e1 516 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量法测定薄板材料中水蒸气透过率的标准试验方法》.pdf
  • ASTM E398-2013 red 6823 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量测定薄片材料的水蒸气透过率的标准试验方法》.pdf ASTM E398-2013 red 6823 Standard Test Method for Water Vapor Transmission Rate of Sheet Materials Using Dynamic Relative Humidity Measurement《用动态相对湿度测量测定薄片材料的水蒸气透过率的标准试验方法》.pdf
  • ASTM E399-2006e1 Standard Test Method for Linear-Elastic Plane-Strain Fracture Toughness KIc of Metallic Materials《金属材料的线性弹性平面变形断裂韧度KIc的标准试验方法》.pdf ASTM E399-2006e1 Standard Test Method for Linear-Elastic Plane-Strain Fracture Toughness KIc of Metallic Materials《金属材料的线性弹性平面变形断裂韧度KIc的标准试验方法》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1