1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes to table I: Change ICLconditions from 40 V to 30 V; Rise time delay, inverting and non-inverting, change max limits from 150 to 205; Fall time delay, change non-inverting input to output, max limit from 80 to 145; Analog shutdown delay ti
2、me, change max limit from 200 to 230. 87-12-10 M. A. FRYE B Changes in accordance with NOR 5962-R056-92. 91-11-27 M. A. FRYE C Changes in accordance with NOR 5962-R234-92. 92-08-10 M. A. FRYE D Changes in accordance with NOR 5962-R122-93. 93-04-02 M. A. FRYE E Update boilerplate to add device class
3、N. Add case outline X. Editorial changes throughout. Redrawn. - rrp 97-09-30 R. MONNIN F Add case outline Y. Changes to 1.2.4, 1.3, and figure 1. - rrp 99-02-23 R. MONNIN G Drawing updated to reflect current requirements. - ro 02-11-07 R. MONNIN H Add device type 03. Add case outline F. Changes to 1
4、.2.2, 1.2.4, 1.3, 1.4, Table I, figure 1, figure 2, Table IIA. Add table IIB. -rrp 11-03-22 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY MARCIA B.
5、KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, POWER DRIVER, DUAL CHANN
6、EL, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-07-13 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 67268 5962-87619 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E285-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59
7、62-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional perf
8、ormance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class N, the user is cautioned to assur
9、e that the device is appropriate for the application environment. 1.2 PIN. The PIN is as shown in the following example: For device classes M and Q: 5962 - 87619 01 E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish (see 1.2.5)
10、/ / Drawing number For device classes N or V: 5962 - 87619 03 V E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes N, Q, and
11、 V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1
12、.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 UC1707 Dual-channel power driver 02 UC2707 Dual-channel power driver 03 UC1707-SP Dual-channel power driver Provided by IHSNot for ResaleNo reproduction or networking perm
13、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as f
14、ollows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A N Certification and qualification to MIL-PRF-38535 with a nontraditional performance envi
15、ronment (encapsulated in plastic) Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835, JEDEC Publication 95, and as follows: Outline letter Descriptive designator Terminals Package style Document E GDIP1-T16 or CDIP2-T1
16、6 16 Dual-in-line MIL-STD-1835 F GDFP2-F16 or CDFP3-F16 16 Flat pack MIL-STD-1835 2 CQCC1-N20 20 Square leadless chip carrier MIL-STD-1835 X MS-001 BB 16 Plastic dual-in-line JEDEC Publication 95 Y MS-013 AA 16 Plastic SOIC JEDEC Publication 95 1.2.5 Lead finish. The lead finish is as specified in M
17、IL-PRF-38535 for device classes N, Q, and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Supply voltage (VIN) +40 V dc Collector supply voltage (VC) +40 V dc Output current (each output, source or sink): Steady state . 500 mA Peak transient 1.0 A (for cases E, F,
18、 and 2) 1.5 A (for cases X and Y) Capacitive discharge energy . 15 J (for cases E, F, and 2) 20 J (for cases X and Y) Digital inputs +5.5 V dc 2/ Analog stop inputs . VINV dc Power dissipation (PD): TA= +25C 1 W (for cases E, F, and 2) 3/ 2 W ( for cases X and Y) TC= +25C 2 W (for cases E, F, and 2)
19、 4/ 5 W (for cases X and Y) Storage temperature range (TS) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC): Cases E, F, and 2 See MIL-STD-1835 _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended o
20、peration at the maximum levels may degrade performance and affect reliability. 2/ Digital drive can exceed 5.5 V if input current is limited to 10 mA. 3/ Derate at 10 mW/C above TA= +50C. 4/ Derate at 16 mW/C above TC= +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted withou
21、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage (VIN) +5 V to +40 V Collector supply voltage (VC) . +5 V to +40 V Digital inputs
22、0 V to 5 V Analog inputs 0 V to VINAmbient operating temperature range (TA): Device types 01 and 03 . -55C to +125C Device type 02 . -25C to +85C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this
23、drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-ST
24、D-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at h
25、ttps:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein. Unless otherwise specified, the
26、 issues of these documents are those cited in the solicitation or contract. ELECTRONICS INDUSTRIES ALLIANCE (EIA) JEP 95 - Registered and Standard Outlines for Semiconductor Devices (Copies of this document are available online at www.jedec.org/ or from the JEDEC Office, 3103 North 10thStreet, Suite
27、 240-S, Arlington, VA 22201-2107). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemptio
28、n has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes N, Q, and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall
29、 not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction
30、, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes N, Q, and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein . Provided by IHSNot for ResaleNo reproduction or net
31、working permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. Th
32、e truth tables shall be as specified on figure 2 . 3.2.4 Block diagram. The block diagram shall be as specified on figure 3 . 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradia
33、tion parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Ma
34、rking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RH
35、A product using this option, the RHA designator shall still be marked. Marking for device classes N, Q, and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for d
36、evice classes N, Q, and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes N, Q, and V, a certificate of compliance shall be required from a QML-3853
37、5 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of complian
38、ce submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes N, Q, and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, append
39、ix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes N, Q, and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for devi
40、ce class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime,
41、DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device
42、class M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 432
43、18-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C VIN= VC= 20 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max VINsupply current ICC(IN)VIN= 40 V 1, 2, 3 All 15 mA VCsupply cur
44、rent ICC(C)VC= 40 V, outputs low 1,2,3 All 7.5 mA VCleakage current ICLVIO= 0 V, VC= 30 V 1,2,3 All 0.1 mA Digital input low level voltage VIL1,2,3 All 0.8 V Digital input high level voltage VIH1,2,3 All 2.2 V Input current IIVI= 0 V 1,2,3 All -1.0 mA Input leakage current IILVI= 5 V 1,2,3 All 0.1 m
45、A Output high saturation voltage, (VC VO) VCO(SAT)IO= -50 mA 1,2,3 All 2.0 V IO= -500 mA 2.5 Output low saturation voltage VO(SAT)IO= 50 mA 1,2,3 All 0.4 V IO= 500 mA 2.5 Analog threshold voltage VAT0 V VCM 15 V 1,2,3 01, 02 100 150 mV 03 90 150 Input bias current IIBVCM= 0 V 1,2,3 All -20 A Shutdow
46、n threshold voltage VSHUTDOWNSHUTDOWN pin input 1,2,3 All 0.4 2.2 V Latch disable threshold voltage VDISABLELATCH DISABLE pin input 1,2,3 All 0.8 2.2 V Rise time delay 2/ tr(delay)Inverting input to output 9,10,11 01, 03 145 ns Non-inverting input to output 205 Fall time delay 2/ tf(delay)Inverting
47、input to output 9,10,11 01, 03 80 ns Non-inverting input to output 145 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87619 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVI
48、SION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions 1/ -55C TA +125C VIN= VC= 20 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Rise time trInverting input to output, CL= 2.2 nF 9,10,11 01, 03 70 ns Non-inverting input to output, CL= 2.2 nF 70 Fall time tfInverting input to output, CL= 2.2 nF 9,10,11 01, 03 70 ns Non-inverting input to output, CL= 2.2 nF 70 Analog shutdown delay time tshut(
