DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf

上传人:李朗 文档编号:699073 上传时间:2019-01-01 格式:PDF 页数:11 大小:74.90KB
下载 相关 举报
DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf_第1页
第1页 / 共11页
DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf_第2页
第2页 / 共11页
DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf_第3页
第3页 / 共11页
DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf_第4页
第4页 / 共11页
DLA SMD-5962-87659 REV D-2011 MICROCIRCUIT LINEAR QUAD DIFFERENTIAL COMPARATOR MONOLITHIC SILICON.pdf_第5页
第5页 / 共11页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device type 02. Technical and editorial changes throughout. 94-02-02 M. A. FRYE B Make change to supply voltage as specified under 1.4. Drawing updated to reflect current requirements. - ro 00-07-20 R. MONNIN C Replace reference to MIL-STD-97

2、3 with reference to MIL-PRF-38535. -rrp 03-04-14 R. MONNIN D Add device type 03. Add device type 01 limits to VICparameter under paragraph 1.3. - ro 11-04-12 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2

3、 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY MARCIA B. KELLEHER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY D. A. DiCENZO APPROVED BY N. A. HAU

4、CK MICROCIRCUIT, LINEAR, QUAD DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 87-09-14 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-87659 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E406-10 Provided by IHSNot for ResaleNo reproduction or networking permitted without license f

5、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with

6、MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-87659 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as fol

7、lows: Device type Generic number Circuit function 01 TLC374M Quadruple differential comparators 02 LC139M Quadrup differentia comparators 03 LC374M Quadruple differentia comparators 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptiv

8、e designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage (VDD): 2/ Device types 01 and 03 . 18 V dc Device

9、 type 02 (range) . -0.3 V dc to 18 V dc Differential input voltage (VID): 3/ Device types 01, 02 and 03 . 18 V dc Output voltage (VO): Device types 01 and 03 . 18 V dc Device type 02 (range) -0.3 V dc to VDDInput voltage (VI): Device types 01 and 03 . VDDDevice type 02 (range) -0.3 V dc to VDDInput

10、current (II): Device types 01, 02 and 03 . 5 mA Output current (IO): Device types 01 and 03 . 20 mA Device type 02 (each input) 20 mA _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect

11、reliability. 2/ All voltage values, except differential voltages, are with respect to network GND terminal. 3/ Differential voltages are at the noninverting input terminal with respect to the inverting input terminal. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen

12、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings - continued. 1/ Duration of output short circuit to GND: 4/ Device types 01 and 03 . Unlimited Total supply curr

13、ent into VDDterminal (IDD): Device type 02 40 mA Total current out of GND terminal (IGND): Device type 02 60 mA Storage temperature range . -65C to +150C Maximum power dissipation (PD): Device types 01 and 03 . 500 mW 5/ Continuous total power dissipation (PD): Device type 02 1375 mW 6/ Lead tempera

14、ture (soldering, 10 seconds): Device types 01 and 03 . 300C Lead temperature 1.6 mm (1/16 inch) from case for 60 seconds, (case outline C) Device type 02 . 300C Case temperature for 60 seconds (case outline 2) . +260C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC): Case

15、outlines C and 2 . See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C Supply voltage (VDD) 4 V dc to 16 V dc Common-mode input voltage (VIC) : Device types 01 and 03: VDD= 5 V 0 V to 3.5 V VDD= 10 V 0 V to 8.5 V Device type 02 0 V dc to VDD

16、1.5 V dc Low-level output current (IOL): Device type 02 20 mA _ 4/ Short circuits from outputs of VDDcan cause excessive heating and eventual destruction. 5/ For TA= +100C to +125C, derate linearly at 12.0 mW/C. 6/ For temperatures above +25C, derate at 11.0 mW/C. Provided by IHSNot for ResaleNo rep

17、roduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following

18、specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, Gener

19、al Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Dr

20、awings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and

21、the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL

22、-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be pr

23、ocessed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect

24、 form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, constru

25、ction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Logic diagram. The logic diagra

26、m shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electric

27、al test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers P

28、IN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

29、D MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max

30、 Input offset voltage 2/ VIOVDD= 5 V, 1 01 10 mV VIC= VICRmin 2,3 12 VDD= 5 V to 10 V, VIC= 0 V to VDD 1 V 1 02 5 VDD= 5 V to 10 V, VIC= 0 V to VDD 1.5 V 2,3 10 VDD= 5 V, 1 03 5 VIC= VICRmin 2,3 10 Input offset current IIOVDD= 5 V, TA= +125C 2 01,03 10 nA VIC= 2.5 V, TA= +125C 02 15 Input bias curre

31、nt IIBVDD= 5 V, TA= +125C 2 01,03 20 nA VIC= 2.5 V, TA= +125C 02 30 Common-mode input voltage range VICRVDD= 5 V 1 01 0 to VDD1.75 V 2,3 0 to VDD2.0 1 02 0 to VDD1 2,3 0 to VDD1.5 1 03 0 to VDD1.0 2,3 0 to VDD1.5 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networki

32、ng permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ 2/ -55C TA+125C unless otherwi

33、se specified Group A subgroups Device type Limits Unit Min Max High-level output current IOHVDD= 5 V, VID= 1 V, VOH= 15 V 2,3 01 2 A VDD= 5 V, VID= 1 V, 1 02 40 nA VOH= 5 V 2 1 A VDD= 5 V, VID= 1 V, VOH= 15 V 2,3 03 1 A Low-level output voltage VOLVDD= 5 V, VID= -1 V, 1 01,03 400 mV IOL= 4 mA 2,3 70

34、0 VDD= 5 V, VID= -1 V, 1 02 400 IOL= 6 mA 2 800 Low-level output current IOLVDD= 5 V, VID= -1 V, VOL= 1.5 V 1 01,03 6 mA Supply current (four comparators) IDDVDD= 5 V, VID= -1 V, no load 1 01 1 mA No load, outputs low 1 02 80 A 2,3 175 VDD= 5 V, VID= 1 V, 1 03 600 A no load 2,3 800 Response time 3/

35、TRESRLconnected to 5 V through 5.1 k, CL= 15 pF, 100 mV input step with 5 mV overdrive 9 01,03 1300 ns RLconnected to 5 V through 5.1 k, TTL-level input step, CL= 15 pF including probe and jig capacitance 900 1/ All characteristics are measured with zero common-mode input voltage unless otherwise sp

36、ecified. 2/ For device types 01 and 03, the offset limits given are the maximum values required to drive the output above 4 V or below 400 mV with a 10 k resistor between the outputs and VDD. They can be verified by applying the limit value to the input and checking for the appropriate output state.

37、 For device type 02, the offset voltage limits given are the maximum values required to drive the output up to 4.5 V or down to 0.3 V with a 2.5 k load VDD. 3/ The response time specified is the interval between the input step function and the instant when the output crosses 1.4 V. Provided by IHSNo

38、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device types 01, 02 and 03 Case outlines C 2 Terminal number Terminal symbol

39、 1 1 OUT NC 2 2 OUT 1 OUT 3 VDD2 OUT 4 2 IN- VDD5 2 IN+ NC6 1 IN- 2 IN- 7 1 IN+ NC 8 3 IN- 2 IN+ 9 3 IN+ 1 IN- 10 4 IN- 1 IN+ 11 4 IN+ NC12 GND 3 IN- 13 4 OUT 3 IN+ 14 3 OUT 4 IN- 15 - NC 16 - 4 IN+ 17 - NC 18 - GND 19 - 4 OUT 20 - 3 OUT NC = No connection. FIGURE 1. Terminal connections. FIGURE 2.

40、Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-87659 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 3.5.1 Certification/compliance mark. A compl

41、iance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of complia

42、nce. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the m

43、anufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of

44、change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable

45、required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with me

46、thod 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under docume

47、nt revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum.

48、b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II here

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1