DLA SMD-5962-87732 REV B-1991 MICROCIRCUITS DIGITAL HIGH SPEED CMOS J-K FLIP-FLOP WITH PRESET AND CLEAR MONOLITHIC SILICON《硅单片J-K触发器与预设和明确高速互补型金属氧化物半导体数字微电路》.pdf

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1、 - SND-5962-87732 REV B 59 W 7999996 0006833 4 W b. ACTIVITY AUTHORIZED TO APPROVE CHANGE FOR GOVERNMENT DESC-ECC 12. ACTIVITY ACCQQLISIIIYU REVISIOY DESC-ECC E - i! SIGNATURE AND TITLE DATE (YYWD) add IlBIl Revisions description colum; add Changes in accordencc with NOR 5962- RO 10-92“. Revisions d

2、ate colum; edd 91-10-21w. In the recoinnended operating conditions for min. clock pike uidth (tul) change Iirnit for VCC 6.0 V at -55.C and +125*C from 20 ns to 21 ns. For mimm frequency (fw) change limits for VCC = 2.0 V It +25*C from 5.4 MHz to 5 MHz and VCC = 6.0 V at +25*C from 32 MHz to 31 MHz.

3、 Change (fmx) at +125*C Mid -55C for VCC = 2.0 V from 3.6 MHz to 3 HHz and at +125*C and -55.C for VCC = 6.0 V from 21 HHz to 20 MHz. Sheet 7: Change propagation delay tim (tPHL2,tPLH2) at +125*C and -55C, for VCC = 6.0 V from 43 ns to 40 ns. Change propegation delay time (tPHL3, tPLH3) at +125*C an

4、d -55*C, for VCC = 6.0 V from 43 ns to 40 ns. Sheet 3: v Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-57bZ-fl7732 REV B 59 9 797779b 0006832 b W I REVISIONS STANDARDIZED AND AGENCIES OF THE DEPAFiTMENT OF DEFENSE ii US. GVTNhWl PRINTING OFFKI:

5、 1987 - 748-119/6091 I DESC FORM 193 SEP a1 DISTRiBUTION STATEMENT A. Approved for public release; distribution Is unlimited. 5902-El760 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1 1.2.1 Device type. The device type shall identify the

6、circuit function as follows: 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.mf MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“. I o1 54HC76 J-K flip-flop with preset and clear I I 1.2 Part number

7、. The complete part number shall be as shown In the following example: 1 1.2.2 Case outlines. The case outlines shall be as designated in appendix C OP MIL-M-38510, and las follows: 5962-87732 o1 E X I T I- I Outline letter I Lead ti ni sn per I tase outline I Uevice rype I m“awi ng numDer (1.2.1) (

8、1.2.2) MI L-M-385 10 STANDARDIZED SIZE 5962-87732 SHEET A MILITARY DRAWING MFENSE ELECTRONICS SUPPLY CENTER REVISION LEVEL i DAYTON, OHIO 45444 A 2 Device type Generic number Circuit function Case owtl ine E 2 D-2 (16-lead, .840“ x .310“ x .200“), dud-in-line package C-2 (20-terminal, .358“ x .358“

9、x .loo“), square chip carrier package 1.3 Absolute maximum ratings. l./ Supply voltage range - - - - - - - - - - - - - - - - OC input voltage - - - - - - - - - - - - - - - - DC output voltage - - - - - - - - - - - - - - - - - Clamp diode current - - - - - - - - - - - - - - - - OC output current (per

10、 pin) - - - - - - - - - - - - OC Vcc or GND current (per pin) - - - - - - - - - - Storage temperature range - - - - - - - - - - - - - Maximum power dissipation fP1 i/ - - - - - - - - - Lead temperature (soldering, 10 seconds) - - - - - - Thermal resfstance, Junction-to-case (eJC) - - - - - Junction

11、temperature (TJ) - - - - - - - - - - - - - -0.5 V -0.5 V dc to VCC * 0.5 V dc -0.5 V dc to Vcc + 0.5 V dc t20 mA *25 mA *50 mA -656 to +15OoC 500 mW +26OoC See VIL-M-38510, appendix C +175 C dc to +7.0 V dC 1.4 Recommended operating conditions, ess otherwise specified, all voltages are referenced to

12、 ground. Tr. = +lOOC to +125C, derate Itnearly at 12 mW/ C. * U. S. QOVERNMENT PRINTING OFFICE: 1888-549.904 DESC FORM 19317 SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-* SMD-5962-B7732 REV B 59 m 9999996 0006834 T m w- ii u. s. GOVERNMENT

13、 PRINTING OFFICE 1988-549.m DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-2 APPLICABLE DOCUNENTS 2.1 Government specification, standard, and bulletin. Unless otherwise specifjed, the following specification, stdndard, and bull

14、etin of the issue listed in that Sssue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SP KIF ICATI ON MI LITA RY MI L-M-bb510 - Microcircuits, tieneral Speclfication for. STANDARD MI LITARY

15、 MI L-STD-883 - Test Methods and Procedures for Microelectronics. BULLETIN MILITAkY MI L-BUL-103 - List of Standardized Military Drawings (SbIDs). (Copies of the specification, standard, and bulletin required by manufacturers in connection with specific acquisition functions should be obtained from

16、the contracting activity or as directed by the Contracting activity. 1 references cited herein, the text of this drawing shall take precedence. 2.2 Order of precedence, 5. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of BIIL-STD-883, “Provisi

17、ons for the use of MIL-STD-883 in conjunction with cmpl iant non-JAN devices“ and as specified herein. In the event of a conflict between the text of this drawing and the 3.2 Desi yn, constructi.on, and physical dimensions. The design, construction, and pwsical dimensions shall be as specified in MI

18、L-M-38510 and herein. 3.2.1 Terminal connections. 3.2.2 Truth table. The truth table shall be as specified on figure 2. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.4 Case outline. The case outline shall be in accordance witti 1.2.2 herein. 3.3 Electrlcal perfomance

19、characteri stics. Unless otherwise specified, the electrical The teminal connections shall be as specified on figure 1. performance characteristics are as specified in table I and apply over the full recommended case operdting temperature range. SIZE A 5962-87732 STANDARDIZED MILITARY DRAWING I DEFE

20、NSE UECTRONICS SUPPLY CENTER )AYTON. OH0 45444 I REVISION LEVEL I SHEET A 4 h U. C. QOVERNUEHT PRINTING OFFICE 1088-540-904 ESC FORt.1 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- SMD-5762-87732 REV B 59 W 9999996 0006836 3 STANDARDIZ

21、ED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 TABLE I. Electrical performance characteristics. SIZE 5962-87732 A SHEET REVISION LEVEL A 5 I I I I I I I I I I I Min I Max I I I I I I I I I nimum or I I I I I I I VIL maximum I I 1-1 I I I vcc = 4.5 v 1 I 4.4 I 1 I II01 5 20

22、PA I I I I I I I I I m I I I I Vcc = 6.0 V I I 5.9 I I I l I I I I I - I I 1101 4.0 fl I Vcc = 4.5 V I I 3.7 I I I I I I I I I I I I I I I 1-1 I I 1101 5 5.2 RA I Vcc = 6.0 V I I 5.2 I I I I I I I I l 1 I I I I I I vcc = 2.0 v I 1, 2, 3 I I minimum or I I I I I I VIL maximum I I - l 0.1 I I I I I I

23、vcc = 4.5 v I I I I 1101 5 20 UA I I I I I I I - I I VCC = 6.0 V I I I I I I I I I I I I m I I 1101 5 4.0 m9 I VCC = 4.5 V I I I 0.4 I I I I I I I I I I I m I I IIoI 5 5.2 IA I VCC = 6.0 V I I I 0.4 I I I I I I I I I I I I I I I I I I I I I I m I m I I I I I I I I I I I VCC = 6.0 V I I 4.2 I I I I I

24、 I I I I I I I I I I I I I I I I I I I I III I I 0.9 I I I I vcc = 4.5 v I I I I I I I I I I I I 1-1 I 1 I VCC = 6.0 V I I 1 1.2 1 I I I I I I I I Uni Conditions IGroup A I Limits I subgroupsl I-l-I I -55OC TC 5 +125“C i/ - - I Test High level output voltage IVOH ,I IJN = VIH I I vcc = 2.0 v I 1, 2,

25、 3 I 1.9 I IV I o*1 I I Low levei output voltaye !VOL I VIN = VIH High level input voltage /YIH I :/ 1 Vcc = 2.0 V I 1, 2, 3 1.5 I IV I I 3.151 I I I vcc = 4*5 Low level input voltage I 21 I vcc = 2.0 v I 1, 2, 3 I I 0.3 I V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction

26、 or networking permitted without license from IHS-,-,-. _. SND-5762-87732 REY B 59 9999996 0006837 5 I 1 TABLE 1. Electrical performance characteristics - Continued. 1 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-L STANDARDIZED MILITARY DRAWING 1

27、SIZE A 5962-87732 TABLE I. Electrical performance characteristics - Continued. Test Propagation delay time Reset to Q or 0 - 3/ Propagation delay time Set to Q or Q - 3/ I I I Symbol I Conditions IGroup A I Limits I -55C 5 TC 5 +125OC L/ I subgroups1 IiI I I I I I Unit I Min I Max I I I I I tpHL2, i

28、 TC = +25OC, i vcc = 2.0 v i 9i i165 i ns l See fiaure 4 I I I li PLHZ I CL = 50 PF, I I I I I i- “ I I i I vcc = 4.5 v I I I I 133 I I I I i28 I I I I ! I I I I i i I i Vcc = 6.0 V i I TC = -55C, +125OC Vcc = 2.0 V j 10, 11 j I je50 i ns I III I I I I 43 I I I I I I I I I I I I See figure 4 I I III

29、 i I I vcc = 4*5 CL = 50 pF, I I I VCC = 6.0 V I I 150 I I 133 I I See figure I VCc = 2.0 V I 9 I I165 I ns I I vcc = 4.5 v I I I tpHL33 i TC = 25OCs tpLH3 CL = 50 PF, I I I I I I i 28 I I I I I I VCC = 6.0 V I I I I I I TC = -55OC, +125OC Vcc = 2.0 V i 10, 11 I 1250 1 ns 1 CL = 50 pF, I I I 150 I I

30、 VCC = 6.0 V I I I 43 I I See figure 4 I I III I vcc = 4.5 v I I I I I III I I I I I I I I I I I I I I I I I ee footnotes at end of table. I DEFENSE ELECTRONICS SUPPLY CENTER DAYTON. OHIO 45444 I REVISION LEVEL 1 I SHEET I I n I 7 t U. C. GOVERNMENT PAIHTINQ OFFICE: 1838-549-94 DESC FORM 193A SEP 87

31、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE I. Electrical performance characteristics - Continued. I I I - Test Symbol i Conditions Group A I I I -55C TC +125OC 1/ (subgroups I - - Transition tirne 4/ ItTHL, I TC = +25OC I vcc = 2.0 v I 9

32、I 1 I I See fisure 4 I t - ItTLH I CL = 50 PF - I vcc = 4.5 v i I I I I i I i i i i I I VCC = 6.0 V I I I I I I TC = -55“C, +125CI VCC = 2.0 V I I CL = 50 pF I I I See figure 4 l I I vcc = 4.5 v t I I 10, 11 I I i i i i I YCC = 6.0 V I I I I I I I Limits I Unit I -l-i Min I Max I - I 75 I ns I I il

33、1 15 i I I il 1 13 I I I - Il10 1 ns I F -7k 1 22 I I 1 -r-t I 19 I I t - For a power supply of 5 V *30 percent the worst case output voltage (VOH and VOL) occur for HC at 4.5 V. Thus the 4.5 V values should be used when designing with this supply. case VIH and VIL occur at Vcc = 5.5 V and 4.5 V res

34、pectively. (The VIH value at 5.5 V is 3.85 Y). The worst case leakage current (IIN, Icc, and Ioz) occur for CMOS at the higher voltage and so the 6.0 Y values should be used. Power dissipation capacitance (CPD), typically 100 pF, determines the no load dynamic power consumption, Pg = CPD Vcc2 f + IC

35、C Vcc, ana the no load dynamic current consumption, IS = CPD Vcc f + Icc. VIH ana VIL tests are not required if applied as forcing functions for VOH or VOL tests. AC tesziiig at Vcc = 2.0 V ana Ycc = 6.0 V shall be guaranteed, if not tested, ta the specified limits in table I. Worst Transition time

36、(tTLH, tTHL), if not tested, shall be guaranteed to the specified limits in table i. SIZE A 596 2- 8 7732 STANDARDIZED MILiTARY DRAWING I DEFENSE ELECTRONICS SUPPLY CENTER DAYION. OHIO 45444 I SHEET I REVISIONLEVEL n A t U. S.GOVERHMENT PI1ItilIRG OFFICE. lOBB-549-QCI ESC FORM 193A SEP 87 Provided b

37、y IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- CLOCK I SET 1 RESET 1 J1 “cc CLOCK 2 SET 2 RESET 2 SMD-5762-87732 REV I3 57 = 9999996 0006840 5 I i d K1 d Q1 Case 2 rl GND K2 i: 1: “cc 7 17 GND 16 1 NC 15 K2 Q2 (u t;l v) FIGURE 1. Terminal connections. 1 Inpu

38、ts I outputs i I I- !2 ?I$ W u) W 4 * This is an unstable condition, and is not guaranteed. FIGURE 2. Truth table. . SIZE 5962-87732 STANDARDIZED MILITARY DRAWING A SHEET 9 DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL I I I * U. S. GOVERNMEIIT PRINTIIB OFFICE; 1989-749.033 DES

39、C FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. FIGURE 3. Logic diagram. MILITARY DRAWING fi U S GOVERNhtENT PRINTISG OFFICP I96G9-745 U33 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted

40、 without license from IHS-,-,-c SMD-5762-87732 REV B 59 9797796 0006842 9 m VALID + vcc I J OR K 50% GND vcc GND CLOCK vcc GND Q OR I FIGURE 4. Switching time waveforms. STANDARDIZED SIZE MILITARY DRAWING A 5962-87732 SHEET DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL * A 11 i

41、t U. S. GOVERNMENT PRI:llhG OFFICE 1989-749.033 DESC FORM 193A SEP 87 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SET OR RESET tPH12, Q ORT tPLH2 Q ORQ CLOCK vcc GND Von VOL VOH 3- I3 - ,-I- “cc GND 50% DEVICE Q OR i UNDER F1-1 CL = 50 pF NOTE: C

42、L includes probe and jig capacitance FIGURE 4. Switching time waveforms - Continued. SIZE A 5962-87732 STANDARDIZED MILITARY DRAWING SHEET REVISION LEVEL DEFENSE ELECTRONICS SUPPLY CENTER C DAYTON, OHIO 45444 A 12 ri U S GOVERNMENT PRlNflN9 OFFIGF lG89-74gU33 DESC FORE4 193A SEP 87 Provided by IHSNo

43、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-. STANDARDIZED SIZE MILITARY DRAWING A SMD-5962-87732 REV 6 59 = 9999496 ClClOb8114 2 W 5962-87732 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups 3.5 Marking. Marking shall be

44、in accordance with MIL-STD-883 (see 3.1 herein). The part shall In addition, the manufacturers part number ipecified in table II. ,e markZTF5 the part number listed in 1.2 herein. iay also be markea as listed in MIL-BUL-103 (see 6.6 herein). 3.6 in order to be listed as an approved source of supply

45、in MIL-BUL-103 (see 6.6 herein). The :ertificate of compliance submitted to DESC-ECS prior to listing as an approved source of supply ihall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) rnd the requi rements herein. ierein) shall be provided with each l

46、ot of microcircuits delivered to this drawing. The electrical tests for each subgroup are described in table I. Lertificate of compliance. A certificate of compliance shall be required from a manufacturer 3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.

47、1 3.8 Notification of change. Notification of change to DESC-ECS shall be required in accordance tith CIIL-STU-883 (see 3.1 herein), 3.5 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to wi ew the manutacturer s faci 1 i ty and applicable required documentat

48、ion. ;hall be made available onshore at the option of the reviewer. Off shore documentation 4. QUALITY ASSUKANCE PRGVISIONS 4.1 Sanipl ing and inspection. Sampling and inspection procedures chal 1 be in accordance with 4.2 Screeniny. Screening shall be in accordance with method 5004 of MIL-STO-883, and shall be ;ection 4 of taL-FI-38510 t o th-e extent specified in MIL-STD-883 (see 3.1 herein). :onducted on all devices prior to quality conformance inspection. The following additional criteria ,hdll apply: a. Burn-in test (method 1015 of MIL-STD-883). (i) Te

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