1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Page 2, 1.4, add IVR test conditions. Page 4, table I, IIBand IOS, add footnote to guarantee subgroup 3. For IOS, change unit from pA to nA. For VO, add subgroup 6. Editorial changes throughout. 88-07-19 M. A. FRYE B Add device type 02 and case o
2、utline, F-4. Editorial changes throughout. 91-03-07 M. A. FRYE C Change boilerplate to add one-part part numbers. Add delta test limits. 96-11-13 R. MONNIN D Make changes to table IIA. - ro 02-01-07 R. MONNIN E Make change to the first condition of the AVOtest in table I from RL= 1 k to RL= 10 k. -r
3、rp 02-07-23 R. MONNIN F Drawing updated to reflect current requirements. -rrp 09-03-09 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV F F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY MARCIA B. KELLEHER DEFENSE S
4、UPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCENZO COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY ROBERT P. EVANS MICROCIRCUIT, LINEAR, HIGH SPEED, FAST SETTLING, PRECISION OPERATIONAL AMPLIFIER, MONOLITHIC
5、SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-11-27 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-88513 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E534-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
6、OCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (devi
7、ce class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes
8、 M and Q: 5962 - 88513 01 G X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Case outline (see 1.2.4)Lead finish (see 1.2.5) / / Drawing number For device class V: 5962 - 88513 01 V G X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2
9、)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices me
10、et the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 OP-42A High speed, fast s
11、ettling, precision operational amplifier 02 OP-42B High speed, fast settling, precision operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designator has been added after
12、the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuit
13、s in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218
14、-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line
15、 2 CQCC1-N20 20 Square lead less chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS) . 20 V Input voltage (VIN) . 20 V 2/ Differential input v
16、oltage 40 V 2/ Output short-circuit duration Indefinite Storage temperature range . -65C to +150C Lead temperature (soldering, 60 seconds). +300C Power dissipation (PD) 500 mW 3/ Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G . 150C/W
17、Cases H and P . 119C/W Case 2 120C/W 1.4 Recommended operating conditions. Supply voltage (VS) 15 V Source resistance (RS) 50 Common mode voltage (VCM) . 0 V Input voltage range (VINR) . 11 V Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification,
18、 standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. 1/ Unless otherwise specified, TA= +25C. 2/ For supp
19、ly voltages less than 20 V, the absolute maximum input voltage is equal to the supply voltage. 3/ Must withstand the added PDdue to short circuit test, e.g., ISC. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59
20、62-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Micro
21、circuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksear
22、ch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this documen
23、t, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manu
24、facturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein
25、. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accor
26、dance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and post irradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and post irradiation parame
27、ter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The
28、part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product u
29、sing this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q
30、 and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-885
31、13 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput offset voltage VOS1 01
32、 1.0 mV 02 1.5 2,3 All 2.0 Input bias current IIB1 All 200 pA 2,3 2/ 20 nA Input offset current IOS1 All 40 pA 2,3 2/ 1 nA Common mode 3/ rejection CMR VCM= IVR = 11 V 1 All 86 dB 2,3 80 Power supply rejection ratio PSRR VS= 10 V to 20 V 1 All 40 V/V 2,3 50 Short circuit output current ISCOutput sho
33、rted to ground 1 All 20 60 mA 2,3 8 60 Supply current ISYVO= 0 V, no load 1,2,3 All 6.0 mA External VOStrim range VOSRPOT= 10 k, TA= +25C 1 All 2.5 10 mV Output voltage swing VORL= 1 k 4 All 11.5 V RL= 2 k 5,6 11.0 Large signal voltage gain AVORL= 10 k, VO= 10 V 4 All 500 V/mV 5,6 160 RL= 2 k, VO= 1
34、0 V 4 200 5,6 80 RL= 1 k, VO= 10 V, TA= +25C 4 100 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL
35、F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Slew rate 4/ SR AVCL= +1, RL= 2 k 7 All 45 V/s 8 40 Input offset voltage temperature coeffic
36、ient TCVOSTA= -55C, +125C 8 All 10 V/C Settling time tSSee figure 2, TA= +25C, 0.1 % for 10 V step 9 All 1.0 s 1/ Unless otherwise specified, VS= 15 V, VCM= 0 V, RS= 50 , and TA= TJ. 2/ Subgroup 3, if not tested, shall be guaranteed to the limits specified in table I herein. 3/ IVR is defined as the
37、 VCMrange used for the CMR test. 4/ Slew rate may be specified separately for positive and negative going changes. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of t
38、his drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of
39、 supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as requir
40、ed for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herei
41、n) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documen
42、tation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleN
43、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 7 DSCC FORM 2234 APR 97 Device types 01 02 Case outlines G and P 2 H Terminal number Terminal symbol 1 N
44、ULL NC NC 2 -INPUT NULL NULL 3 +INPUT NC -INPUT 4 -V NC +INPUT 5 NULL -INPUT -V 6 OUTPUT NC NULL 7 +V +INPUT OUTPUT 8 NC NC +V 9 - NC NC 10 - -V NC 11 - NC - 12 - NULL - 13 - NC - 14 - NC - 15 - OUTPUT - 16 - NC - 17 - +V - 18 - NC - 19 - NC - 20 - NC - NC = No connection FIGURE 1. Terminal connecti
45、ons. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 8 DSCC FORM 2234 APR 97 NOTES: Schottky diodes D1 D4 are HP5082-2835
46、or equivalent. IC1 is CLC200A1 or equivalent. IC2 is OP41EJ or equivalent. FIGURE 2. Settling-time test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88513 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
47、OHIO 43218-3990 REVISION LEVEL F SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modificati
48、on in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance ins
