1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R021-92. -tvn 91-11-25 Monica L. Poelking B Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 01-06-06 Raymond Monnin C Update drawing to current requirements. Edit
2、orial changes throughout. - gap 08-11-21 Robert M. Heber The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT
3、DRAWING CHECKED BY Ray Monnin COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, ECL, 8-LINE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-08-26 MULTIPLEXER, MONOLITHIC SILICON
4、AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-88527 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E267-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO
5、 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in
6、 the following example: 5962-88527 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10564 8-line multiplexer 1.2.2 Case outline
7、(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat package 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is
8、 as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC= 0.0 V) . -8.0 V dc to 0.0 V dc Input voltage range (VCC= 0.0 V) 0.0 V dc to -5.2 V dc Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ)
9、+165C Maximum power dissipation (PD) 1/ . 319 mW Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VEE) +4.5 V dc to +5.5 V dc Ambient operating temperature range (TA) -55C to +125C Minimum high level input voltage (VIH): TA= +25
10、C . -0.780 V dc TA= +125C . -0.630 V dc TA= -55C -0.880 V dc Maximum low level input voltage (VIL): TA= +25C . -1.850 V dc TA= +125C . -1.820 V dc TA= -55C -1.920 V dc Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
11、 A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specif
12、ied herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard
13、 Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/qui
14、cksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this d
15、ocument, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product
16、 built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qua
17、lifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as de
18、scribed herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and her
19、ein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test cir
20、cuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test
21、 requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8
22、8527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked.
23、For packages where marking of the entire SMD PIN is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-3
24、8535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be liste
25、d as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Cer
26、tificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Ver
27、ification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Samplin
28、g and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in
29、 test, method 1015 of MIL-STD-883. (1) Test condition D or E. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, an
30、d power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the
31、discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrica
32、l performance characteristics. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max Cases E, F, and 2 Quiescent tests 1/ 2 VIHVIL-0.780 -1.850 1 -0.930 -0.780 -0.630 -1.820 2 -0.825 -0.630 High level output voltage VOHOutputs terminated through 100 to
33、-2 V, VCC= 0.0 V, VEE= -5.2 V -0.880 -1.920 3 -1.080 -0.880 V -0.780 -1.850 1 -1.850 -1.620 -0.630 -1.820 2 -1.820 -1.545 Low level output voltage VOL3/ -0.880 -1.920 3 -1.920 -1.655 V -1.105 -1.475 1 -0.950 -0.780 -1.000 -1.400 2 -0.845 -0.630 High level threshold / output voltage VOHA-1.255 -1.510
34、 3 -1.100 -0.880 V -1.105 -1.475 1 -1.850 -1.600 -1.000 -1.400 2 -1.820 -1.525 Low level threshold output voltage VOLA-1.255 -1.510 3 -1.920 -1.635 V 1 -75 Power supply drain current 4/ IEE2, 3 -83 mA 1 265 High level input current IIHVCC= 0.0 V, VEE= -5.46 V, VIH= -0.780 V at +25C -0.630 V at +125C
35、 -0.880 V at -55C 2, 3 450 A 1, 3 0.5 Low level input current IILVCC= 0.0 V, VEE= -4.94 V, VIL= -1.850 V at +25C -1.820 V at +125C -1.920 V at -55C 2 0.3 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC
36、IRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Limits Unit Min Max C
37、ases E, F, and 2 AC tests 9 1.1 3.3 10 0.9 3.4 Transition time tTLH,tTHLVEE= -3.2 V, VCC= +2.0 V, CL 5 pF, 11 0.9 3.3 ns 9 1.5 4.7 10 1.2 4.7 Propagation delay time, data inputs to output Y tPLL1,tPHH1RL= 100 See figure 3 11 1.3 4.8 ns 9 2.0 6.2 10 1.9 6.2 Propagation delay time, A, B, C to output Y
38、 tPLL2,tPHH211 1.8 6.3 ns 9 1.0 3.1 10 0.9 3.1 Propagation delay time, ENABLE to output Y tPLH,tPHL11 0.9 3.2 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55
39、C (as applicable) air blowing on the unit in a transverse direction with power applied for at least four minutes before the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be used after an increased ambie
40、nt temperature has been stabilized by external thermal sources. This adjusted temperature simulates the quiescent method by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal characteristics of the devi
41、ce and package used. 3/ The high and low level output current varies with temperature, and can be calculated using the following formula: IOH= (- 2 V -VOH)/100 and IOL= (- 2 V -VOL)/100 . 4/ The IEElimits, although specified in the minimum column, shall not be exceeded, in magnitude, as a maximum va
42、lue. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Case outlines E F 2 Address inputs Terminal n
43、umber Terminal symbol ENABLE A B C Output Y 1 VCC2 D6 NC L L L L D0 2 ENABLE D7 VCC2 L H L L D1 3 D3 Y ENABLEL L H L D2 4 D2 VCC1D3 L H H L D3 5 D1 VCC2 D2 L L L H D4 6 D0 ENABLENC L H L H D5 7 A D3 D1 L L H H D6 8 VEED2 D0 L H H H D7 9 B D1 A H X X X L 10 C D0 VEE11 D4 A NC 12 D5 VEEB 13 D6 B C L =
44、 Low level voltage H = High level voltage X = Irrelevant 14 D7 C D4 15 Y D4 D5 FIGURE 2. Truth table. 16 VCC1D5 NC 17 D6 18 D7 19 Y 20 VCC1NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC
45、ROCIRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 NOTES: 1. Pulse generator characteristics: PRR = 1MHz, tTHL= tTLH= 2.0 .2 ns (20% to 80%), duty cycle = 50%. 2. The 50 resistor in series with the 50 coax const
46、itutes the 100 load. FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88527 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 9 DSC
47、C FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7*, 8, 9 Group A test requirements (met
48、hod 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1 and 7. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005
