1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I: Exclude VIOand VIO/ temp from PDA. Guarantee, if not tested, enand inat fO= 100 Hz. Delete subgroups 2 and 3 for IOS. Change ZOto ROand maximum limit to PD, subgroup 1. Update format and editorial changes throughout. 89-11-15 M. A. FRYE
2、B Add vendor CAGE number 01295 and case 2. Make changes to JA. Add footnote 3/ to VIO/ temp, en, and intests as specified under Table I. Make change to the first sentence of footnote 4/ as specified under Table I. Changes in accordance with N.O.R. 5962-R321-92. 92-12-08 M. A. FRYE C Drawing updated
3、to reflect current requirements. Redrawn. - ro 09-02-04 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY JOSEPH A. KIRBY CHECKED BY RAY MONNIN DEFENSE SUPPLY CENTER COLUMBUS COLU
4、MBUS, OHIO 43218-3990 http:/www.dscc.dla.mil APPROVED BY MICHAEL A. FRYE STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 88-06-15 MICROCIRCUIT, LINEAR, LOW NOISE HIGH SPEED PRECISION OPERATIONAL AMPLIF
5、IER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-88567 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E031-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER
6、COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The comp
7、lete PIN is as shown in the following example: 5962-88567 01 G A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 LT1037A Low noise, h
8、igh speed precision operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.
9、3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VS) 22.0 V dc Input voltage . Equal to supply voltage Differential input current 25 mA 1/ Lead temperature (soldering, 10 seconds) . +300C Storage temperature range . -65C to +1
10、50C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 150C/W Case P 110C/W Case 2 . 65C/W 1.4 Recommended operating conditions. Supply voltage (VS) 15.0 V dc Ambient operating temperature range (TA) . -
11、55C to +125C _ 1/ Inputs are protected by back-to-back diodes. If differential input voltage exceeds 0.7 V, the current should be limited to 25 mA. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENS
12、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless o
13、therwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-
14、STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from th
15、e Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, su
16、persedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawi
17、ng that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity app
18、roval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q
19、“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outl
20、ines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in tabl
21、e I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MI
22、L-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on
23、the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when
24、 the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical
25、performance characteristics. Test Symbol Conditions -55C TA+125C VS= 15 V, VCM= 0 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Input offset voltage VIO1/ 1, 2, 3 01 60 V Long term input offset voltage stability VIO/ time 2/ 3/ 1, 2, 3 01 1.0 V/Mo Average input offse
26、t drift VIO/ temp 1/ 3/ 1, 2, 3 01 0.6 V/C Input offset current IIO1, 2, 3 01 50 nA Input bias current IIB1, 2, 3 01 60 nA Input noise voltage 3/ enp-p0.1 Hz to 10 Hz, TA= +25C 4 01 0.13 Vp-p Input noise voltage 4/ density enfO= 10 Hz, 3/ TA= +25C 4 01 4.5 nV / Hz fO= 1000 Hz, 3/ TA= +25C 3.8 Input
27、noise current 4/ density infO= 10 Hz, 3/ TA= +25C 4 01 4.0 pA / Hz fO= 1000 Hz, 3/ TA= +25C 0.6 Input voltage range VIN1 01 11.0 V 2,3 10.3 Common mode rejection ratio CMRR VCM= 10.3 V 1, 2, 3 01 112 dB Power supply rejection ratio PSRR 4.5 V VS 18 V 1, 2, 3 01 104 dB Large signal voltage gain AVOLR
28、L 1 k, VO= 10 V dc 4, 5, 6 01 2.0 V/V Maximum output voltage swing VOUTRL 2 k 1, 2, 3 01 12.5 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER COLUM
29、BUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C VS= 15 V, VCM= 0 V Group A subgroups Device type Limits Unit unless otherwise specified Min Max Slew rate SR AVCL 5, RL= 2 k, TA
30、= +25C 4 01 11 V/s Output short circuit current IOSt 25 ms, TA= +25C 1 01 80 mA Gain bandwidth product 3/ GBW fO= 10 kHz, AVCL 5, TA= +25C 4 01 45 MHz Open loop output 3/ resistance ROVO= 0 V, TA= +25C, IO= 0 mA 4 01 2000 Power dissipation PD1 01 130 mW2, 3 150 1/ Input offset voltage is guaranteed
31、fully warmed up. The VIOand VIO/ temp tests are not included in the PDA calculation. 2/ Long term input offset voltage stability refers to the average trend line of offset voltage versus time over extend periods after the first 30 days of operation. Excluding the first hour of operation, changes in
32、VIOduring the first 30 days are normally 2.5 V. 3/ This parameter is guaranteed, if not tested, to the limits specified. 4/ Noise voltage density is guaranteed if not tested. Tested in the applications information section. 3.6 Certificate of compliance. A certificate of compliance shall be required
33、from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendi
34、x A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any c
35、hange that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by
36、IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines G P 2 Terminal number Terminal sy
37、mbol 1 VOSTRIM VOSTRIM NC 2 -INPUT -INPUT VOSTRIM 3 +INPUT +INPUT NC 4 -VS(CASE) -VSNC 5 NC NC -INPUT 6 OUTPUT OUTPUT NC 7 +VS+VS+INPUT 8 VOSTRIM VOSTRIM NC 9 - - NC 10 - - -VS11 - - NC 12 - - NC 13 - - NC 14 - - NC 15 - - OUTPUT 16 - - NC 17 - - +VS18 - - NC 19 - - NC 20 - - VOSTRIM FIGURE 1. Termi
38、nal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and
39、inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shal
40、l apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the i
41、nputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to bu
42、rn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a.
43、 Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005
44、of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power diss
45、ipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance wit
46、h MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88567 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical
47、test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point
48、 electrical parameters (method 5005) 1 * PDA applies to subgroup 1. VIOand VIO/ temp tests are not included in the PDA calculation. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by
