1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R262-92. sbr 92-07-16 M. A. Frye B Changes in accordance with NOR 5962-R065-93. drw 93-01-11 M. A. Frye C Revise for D certification. Editorial changes throughout. drw 99-10-01 Raymond Monnin D Update to curren
2、t requirements. Editorial changes throughout. drw 04-02-18 Raymond Monnin THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Christopher A. Rauch DEFENSE SUPPLY CENTER COLUMBUS STA
3、NDARD MICROCIRCUIT DRAWING CHECKED BY Raymond Monnin COLUMBUS, OHIO 43216 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye MICROCIRCUIT, LINEAR, AND PERIPHERAL DRIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL
4、 DATE 89-04-28 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-88631 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E144-04 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
5、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with
6、MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88631 01 G A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The device type identify the circuit function as follow
7、s: Device type Generic number Circuit function 01 DS1631 Dual AND peripheral driver, CMOS compatible, open collector 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or C
8、DIP2-T8 8 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage (VCC) 16 V dc Input voltage (VIN) -0.3 V dc to VCC+0.3 V dc Output voltage. 56 V dc Storage temperature range. -65C to +150C Maximum power dissipation:
9、 1/ Case G. 787 mW Case P . 1133 mW Lead temperature (soldering, 10 seconds). +260C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. Case operating temperature range (TC) . -55C to +125C Operating supply voltage rang
10、e (VCC). 4.5 V dc to 15 V dc 1/ For case P, derate 7.6 mW/C above +25C; for case G, derate 5.2 mW/C above +25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, O
11、HIO 43216-5000 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of th
12、ese documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS DEPA
13、RTMENT OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated,
14、 copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the
15、text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JA
16、N class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accorda
17、nce with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the de
18、vice. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. This drawing has been modified to allow the manufacturer to use the alternate die/fabrication requireme
19、nts of paragraph A.3.2.2 of MIL-PRF-38535 or other alternative approved by the qualifying activity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-50
20、00 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2
21、 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuits and switching waveforms. The test circuits and switching waveforms shall be as specified on figure 3. 3.3 Electrical performanc
22、e characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II
23、. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein).
24、 For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to M
25、IL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. For product built in accordance with A.3.2.2 of MIL-PRF-38535, or as modified in the manufacturers QM plan, t
26、he “QD” certification mark shall be used in place of the “Q“ or “QML“ certification mark. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compli
27、ance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix
28、A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to
29、review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8
30、8631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. 1/ Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxHigh level input voltage V
31、IHVCC= 5 V, See figure 3 1, 2, 3 01 3.5 V VCC= 10 V, See figure 3 8.0 VCC= 15 V, See figure 3 12.5 Low level input voltage VILVCC= 5 V, See figure 3 1, 2, 3 01 1.5 V VCC= 10 V, See figure 3 2.0 VCC= 15 V, See figure 3 2.5 High level output current IOHVIN= 15 V (all inputs), 1, 2, 3 01 250 A VCC= 15
32、V, VOUT= 54 V See figure 3 Low level output voltage VOLVIN= 1.5 V, other inputs = 4.5 V 1, 2, 3 01 1.1 V VCC= 4.5 V, IOL= 100 mA See figure 3 VIN= 1.5 V, other inputs = 4.5 V 1.4 VCC= 4.5 V, IOL= 300 mA See figure 3 High level input current IIHVIN= 15 V, VCC= 15 V, 1, 2, 3 01 10 A Other input of dri
33、ver = 0.0 V See figure 3 Low level input current IILVIN= 0.4 V, VCC= 15 V, 1, 2, 3 01 -360 A Other input of driver = 15 V See figure 3 VIN= 0.4 V, VCC= 5 V, -115.5 Other input of driver = 5 V, See figure 3 High level breakdown voltage VOHVCC= 15 V, IOH= 250 A See figure 3 1, 2, 3 01 56 V Functional
34、tests See 4.3.1c 7, 8 01 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 6 DSCC FORM 2234 A
35、PR 97 TABLE I. Electrical performance characteristics - continued. 1/ Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxPower supply current ICCHVIN= 5 V (all inputs), 1, 2, 3 01 3 mA VCC= 5 V, See figure 3 VIN= 15 V (all inputs), 10 VCC
36、= 15 V, See figure 3 ICCLVIN= 0 V (all inputs), 11 VCC= 5 V, See figure 3 VIN= 0 V (all inputs), 20 VCC= 15 V, See figure 3 Propagation delay time tPHLVCC= 5 V, CL= 15 pF, 9 01 .01 1.50 S VL= 10 V, RL= 50 or 10, 11 .01 1.88 tPLHequivalent, See figure 3 9 .01 1.20 2/ 10, 11 . 1.50 1/ Power dissipatio
37、n must be externally controlled at elevated temperatures (+25C and +125C). 2/ The limits specified for subgroups 10 and 11 are guaranteed but not tested. Case outlines G and P Inputs Output Terminal number Pin A B X 1 A1 L L L 2 B1 L H L 3 X1 H L L 4 GND H H H 5 X2 FIGURE 2. Truth table. 6 A2 7 B2 8
38、 VCC FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Test table In
39、put under test Other input Output Apply Measure VIH VIHIOHVOHVILVCCIOLVOLVIH, VIL, test. FIGURE 3. Test circuits and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY C
40、ENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 NOTES: 1. The pulse generator has the following characteristics: PRR = 500 kHz, ZOUT= 50 2. CLincludes probe and jig capacitance. 3. IIHand IILtest, each input is tested separately. 4. ICCtest, both gates are tes
41、ted simultaneously. FIGURE 3. Test circuits and switching waveforms - continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D
42、 SHEET 9 DSCC FORM 2234 APR 97 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
43、 prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the pr
44、eparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be a
45、s specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical par
46、ameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformanc
47、e inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883
48、 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88631 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test conditio
