1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. - gap 10-01-20 Charles F. Saffle The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8
2、9 PMIC N/A PREPARED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Ray Monnin APPROVED BY Michael A. Frye MIC
3、ROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 8-BIT IDENTITY COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 88-08-17 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-88710 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E433-09 Provided by IHSNot for ResaleNo reproduction or networking perm
4、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B m
5、icrocircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-88710 01 R X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) iden
6、tify the circuit function as follows: Device type Generic number Circuit function 01 54F518 8-bit identity comparator with open-collector outputs and pull-up resistors on Q inputs 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive
7、designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 dual-in-line package S GDFP2-F20 or CDFP3-F20 20 flat package 2 CQCC1-N20 20 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -0.5 V d
8、c minimum to +7.0 V dc maximum Input voltage range . -1.2 V at -18 mA to +7.0 V dc Input current range -30 mA to 5.0 mA Voltage applied to any output in the high state . -0.5 V dc to 5.5 V dc Current into any output in the low state . 40 mA Storage temperature range . -65C to +150C Maximum power dis
9、sipation (PD) 1/ 214.5 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature(TJ) . +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5 V minimum to +5.5 V maximum Minimum high level input voltage (V
10、IH) 2.0 V dc Maximum low level input voltage (VIL) . 0.8 V dc Maximum high level output voltage (VOH) . 5.5 V dc Maximum low level output current (IOL) . 20 mA Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation, PD, is defined as VCCx ICC. Provided by IHSNot for Resal
11、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks
12、. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manu
13、facturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard
14、 Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of t
15、his drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in acc
16、ordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF
17、-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications
18、shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The
19、 design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. Th
20、e truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as sp
21、ecified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reprodu
22、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shal
23、l be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compli
24、ance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Cert
25、ificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the m
26、anufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of
27、change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall
28、be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on a
29、ll devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the
30、 preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as
31、specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPL
32、Y CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Limits Unit Min Max High level output current IOHVCC= 4.5 V, VIH= 2.0 V, VI
33、L= 0.8 V, VOH= 5.5 V 1, 2, 3 0.1 mA Low level output voltage VOLVCC= 4.5 V, VIH= 2.0 V, VIL= 0.8 V, IOL= 20 mA 2/ 1, 2, 3 0.5 V Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 -1.2 V Low level input current IILVCC= 5.5 V, VIN= 0.5 V, Unused inputs = 4.5 V Gnulland P inputs 1, 2, 3 -0.6 mA Q i
34、nputs -1.0 High level input current IIH1VCC= 5.5 V, VIN= 2.7 V, Unused inputs = 0.0 V Gnulland P inputs 1, 2, 3 20 A Q inputs -0.3 mA IIH2VCC= 5.5 V, Unused inputs = 0.0 V VIN= 7 V, Gnulland P inputs 1, 2, 3 0.1 mA VIN= 5.5 V, Q inputs 0.1 Supply current ICCVCC= 5.5 V, VIN= 4.5 V (All inputs) 1, 2,
35、3 39 mA Functional tests See 4.3.1c 3/ 7, 8 Propagation delay time, P or Q to P = Q tPLH VCC= 4.5 V to 5.5 V, CL= 50 pF, RL= 500 , See figure 3 4/ 9, 10, 11 4 15.5 ns tPHL 9, 10, 11 2 11.5 ns Propagation delay time, Gnullto P = Q tPLH 9, 10, 11 4.5 15.5 ns tPHL 9, 10, 11 2 9.5 ns 1/ Unused inputs th
36、at do not directly control the pin under test must be 2.5 V or 0.5 V, and shall not exceed 5.5 V or go less than 0.0 V. No inputs shall be floated. 2/ In the case where only one input at VILmaximum or VIHminimum produces the proper output state, the test must be performed with each input being selec
37、ted as the VILmaximum or VIHminimum input. 3/ Functional tests shall be conducted at input test conditions of GND VIL VOLand VOH VIH VCC. 4/ Propagation delay limits are based on single output switching. Unused inputs = 0.0 V or 3.0 V. Provided by IHSNot for ResaleNo reproduction or networking permi
38、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Case outlines R, S, and 2 Terminal number Terminal symbol 1 Gnull2 P0 3 Q0 4 P1 5 Q1 6 P2 7 Q2 8 P3 9 Q3 10 GND 11
39、 P4 12 Q4 13 P5 14 Q5 15 P6 16 Q6 17 P7 18 Q7 19 P = Q 20 VCCFIGURE 1. Terminal connections. Inputs Output Data P, Q Enable GnullP = Q P = Q L H P =/ Q X L X H L H = High level voltage L = Low level voltage X = Irrelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or network
40、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 PROPAGATION DELAY TIMES NOTES: 1. CLincludes probe and jig capacitance. 2. All input pulses have the foll
41、owing characteristics: PRR 10 MHz, tr= tf= 2.5 ns, duty cycle = 50%. 3. The outputs are measured one at a time with one transition per measurement. FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA
42、RD MICROCIRCUIT DRAWING SIZE A 5962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical
43、parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspectio
44、n. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, metho
45、d 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condit
46、ion A or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
47、with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5
48、962-88710 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a c
