DLA SMD-5962-89436 REV B-2012 MICROCIRCUIT DIGITAL HIGH-SPEED CMOS 8-BIT UNIVERSAL SHIFT REGISTER WITH THREE-STATE OUTPUTS TTL COMPATIBLE INPUTS MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Redraw the test circuit and add notes to figure 4, switching waveforms and test circuit. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. jak 06-11-06 Thomas M. Hess B Update the boilerpl

2、ate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout. jak 12-12-03 Thomas M. Hess REV SHEET REV B B B SHEET 15 16 17 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Wanda L. Meadows DLA LAND AND MARIT

3、IME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING CHECKED BY Tim H. Noh THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH THREE-STATE OUTPUTS, TTL

4、 COMPATIBLE INPUTS, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 93-02-19 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89436 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E098-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without li

5、cense from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes M and Q) and space app

6、lication (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 -

7、 89436 01 M R A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified R

8、HA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the cir

9、cuit function as follows: Device type Generic number Circuit function 01 54HCT299 8-bit universal shift register with three-state outputs, TTL compatible inputs 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device cl

10、ass Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q, or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as

11、 designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q, and V or MIL-PRF-38535, appendix A for device class M. Provided

12、 by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ Supply voltage range (VCC) . -0

13、.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT) -0.5 V dc to VCC+ 0.5 V dc Clamp diode current (IIK, IOK) 20 mA DC output current (per pin) (IOUT): Q0, Q7 25 mA I/O0, I/O1I/O7 35 mA DC VCCor GND current (per pin) (ICC, IGND) 70 mA Storag

14、e temperature range (TSTG) -65C to +150C Maximum power dissipation (PD) 500 mW 3/ Lead temperature (soldering, 10 seconds) . +265C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. 2/ 4/ Supply voltage range (VCC) . +4.

15、5 V dc to +5.5 V dc Input voltage range (VIN) . 0.0 V dc to VCCOutput voltage range (VOUT) . 0.0 V dc to VCCCase operating temperature range (TC) . -55C to +125C Input rise or fall time (tr, tf): VCC= 4.5 V 0 to 500 ns Minimum setup time, data DS0, DS7, I/On to clock (ts1): VCC= 4.5 V . 30 ns Minimu

16、m setup time, select S1, S0 to clock (ts2): VCC= 4.5 V . 41 ns Minimum clock pulse width (tw1): VCC= 4.5 V . 30 ns Minimum MR pulse width (tw2): VCC= 4.5 V . 22 ns Minimum hold time, DS0, DS7, I/On, S0, S1 to clock (th): VCC= 4.5 V . 0 ns Minimum recovery time, MR to clock (tREC): VCC= 4.5 V . 5 ns

17、Maximum clock frequency (fMAX): VCC= 4.5 V . 16 MHz 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise specified, all voltages are referenced to ground. 3

18、 For TC= +100C to +125C, derate linearly at 8 mW/C to 300 mW. 4/ Unless otherwise specified, values shall apply over the full VCCand TCrecommended operating range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5

19、962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. U

20、nless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuit

21、s. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from

22、 the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited i

23、n the solicitation or contract. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JEDEC Standard No. 7-A - Standard for Description of 54/74HCXXXX and 54/74HCTXXXX High-Speed CMOS Devices. (Copies of these documents are available online at http:/www.jedec.org/ or from JEDEC Solid State Technology Ass

24、ociation, 3103 North 10th Street, Suite 240S, Arlington, VA 22201-2107.) 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and

25、regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The

26、 modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical di

27、mensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connectio

28、ns. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall

29、 be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Electrical performance ch

30、aracteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The ele

31、ctrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the ent

32、ire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking fo

33、r device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, app

34、endix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a m

35、anufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device cl

36、asses Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, ap

37、pendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any chang

38、e that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall

39、 be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitt

40、ed without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method Symbol Test conditions -55C TC +125C 4.5 V

41、VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits Unit Min Max High level output voltage 3006 VOH11/ For all inputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -20 A All 4.5 V 1, 2, 3 4.4 V VOH21/ For all inputs

42、affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -4.0 mA All 4.5 V 1, 2, 3 3.7 Low level output voltage 3007 VOL11/ For all inputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 20 A All

43、 4.5 V 1, 2, 3 0.1 V VOL21/ For all inputs affecting output under test VIN= VIHor VILVIH= 2.0 V VIL= 0.8 V For all other inputs VIN= VCCor GND IOL= 4.0 mA All 4.5 V 1, 2, 3 0.4 High level input voltage VIH2/ All 4.5 V 1, 2, 3 2.0 V Low level input voltage VIL 2/ All 4.5 V 1, 2, 3 0.8 Input current l

44、ow 3009 IILFor input under test, VIN= GND For all other inputs VIN= VCCor GND All 4.5 V 1 -0.1 A 2, 3 -1.0 Input current high 3010 IIHFor input under test, VIN= VCCFor all other inputs VIN= VCCor GND All 4.5 V 1 0.1 2, 3 1.0 See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction

45、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89436 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method Symbol Tes

46、t conditions -55C TC +125C 4.5 V VCC 5.5 V unless otherwise specified Device type VCCGroup A subgroups Limits Unit Min Max Quiescent supply current, output three-state 3005 ICCZFor all inputs VIN= VCCor GND All 5.5 V 1 8 A 2, 3 160 Quiescent supply current, output high 3005 ICCHFor all inputs VIN= V

47、CCor GND All 5.5 V 1 8 A 2, 3 160 Quiescent supply current, output low 3005 ICCLFor all inputs VIN= VCCor GND All 5.5 V 1 8 A 2, 3 160 Additional quiescent supply current ICC2/ For input under test VIN= 2.4 V or 0.5 V For all other inputs VIN= VCCor GND All 5.5 V 1, 2, 3 3.0 mA Three-state output le

48、akage current, low 3020 IOZLFor output under test VOUT= GND All 5.5 V 1 -0.5 A 2, 3 -10.0 Three-state output leakage current, high 3021 IOZHFor output under test VOUT= VCCAll 5.5 V 1 0.5 A 2, 3 10.0 Input capacitance 3012 CINVIN= 0.0 V See 4.4.1c TC= +25C All GND 4 10.0 pF Output three-state capacitance 3012 COUTSee 4.4.1c TC= +25C VOUT= 0 V All 5.5 V 4 20.0 pF Power dissipation capacitance 3012 CPD3/ See 4.4.1c TC= +25C All 4 215 pF Functional tests See 4.4.1b All 7, 8 See footnotes at end of table. Provided by IHSNot for Resal

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