1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 04-07-29 Raymond Monnin B Update drawing as part of 5 year review. -jt 12-01-17 C. SAFFLE REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF
2、SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Larry T. Gauder DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Tim H. Noh APPROVED
3、 BY Monica L. Poelking MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, 10-NONINVERTING REGISTER, MONOLITHIC SILICON DRAWING APPROVAL DATE 92-02-19 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89438 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E132-12 Provided by IHSNot for ResaleNo repr
4、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-J
5、AN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89438 01 L A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type. The d
6、evice type identify the circuit function as follows: Device type Generic number Circuit function 01 54F821 10-bit noninverting register 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style L GDIP3-T24 o
7、r CDIP4-T24 24 dual-in-line K GDFP2-F24 or CDFP3-F24 24 flat 3 CQCC1-N28 28 square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc Input voltage range . -0.5 V dc to +7.0 V
8、 dc Input current range -30 mA to +5.0 mA Voltage applied to any output in the disabled state . -0.5 V dc to +5.5 V dc Voltage applied to any output in the high state . -0.5 V dc to VCCCurrent into any output in the low state . 40 mA Storage temperature range -65C to +150C Maximum power dissipation
9、(PD) . 550 mW 1/ Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Minimum high level input voltage (VIH) . 2.0 V dc Max
10、imum low level input voltage (VIL) 0.8 V dc Maximum input clamp current (IIC) . -18 mA Maximum high level output Current (IOH) -3 mA Maximum low level output current (IOL) 20 mA Case operating temperature range (TC) . -55C to +125C _ 1/ Maximum power dissipation is defined as VCCX ICC, and must with
11、stand the added PDdue to short circuit test e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4
12、Recommended operating conditions - Continued. tsHigh or Low, Dn to CP (ts): VCC= 5.0 V dc at +25C . 3.0 ns VCC= 4.5 to 5.5 V dc at -55C to +125C . 4.0 ns thHigh or Low, Dn to CP (th): VCC= 5.0 V dc at +25C . 2.5 ns VCC= 4.5 to 5.5 V dc at -55C to +125C . 2.5 ns twHigh or Low, CP, tr= 1.0 ns, tf= 1.0
13、 ns (tw): VCC= 5.0 V dc at +25C . 5.0 ns VCC= 4.5 to 5.5 V dc at -55C to +125C . 6.0 ns fMAX, tr= 1.0 ns, tf= 1.0 ns: VCC= 5.0 V dc at +25C . 100 MHz VCC= 4.5 to 5.5 V dc at -55C to +125C . 60 MHz 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifica
14、tion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specif
15、ication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (
16、Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the refer
17、ences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO
18、CIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spec
19、ified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved
20、 program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not
21、 affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-3853
22、5, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching wa
23、veforms. The test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3
24、.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in
25、 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator
26、“C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certifica
27、te of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers pro
28、duct meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notifica
29、tion of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documen
30、tation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEV
31、EL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max High level output voltage VOHVCC= 4.5 V, VIH= 2.0 V, VIL= 0.8 V IOH= -3 mA 1, 2, 3 All 2.4 V Low level
32、 output voltage VOLIOL= 20 mA 1, 2, 3 All 0.5 V Input clamp voltage VICIIC= -18 mA 1, 2, 3 All -1.2 V High level input current IIH1VCC= 5.5 V VIN= 2.7 V 1, 2, 3 All 20 A IIH2VIN= 7.0 V 1, 2, 3 All 0.1 mA Low level input current IILVCC= 5.5 V VIN= 0.5 V 1, 2, 3 All -0.6 mA Short circuit output curren
33、t IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 All -60 -150 mA Off state output current IOZHVCC= 5.5 V VIN= 2.7 V 1, 2, 3 All 50 A IOZLVIH= 2.0 V VIN= 0.5 V 1, 2, 3 All -50 A Power supply current ICCZVCC= 5.5 V 1, 2, 3 All 100 mA Functional tests See 4.3.1c, VCC= 4.5 V, 5.5 V 7, 8 All Propagation delay tim
34、e, tPLHRL= 500 VCC = 5.0 V 9 All 2.0 9.5 ns CP to Qn tPHL CL= 50 pF see figure 3 VCC= 4.5 V and 5.5 V 10, 11 All 2.0 10.5 Output enable time, tPZLVCC= 5.0 V 9 All 2.0 10.5 ns OE to Qn tPZH VCC= 4.5 V and 5.5 V 10, 11 All 2.0 13.0 Output disable time, tPLZVCC= 5.0 V 9 All 1.5 7.0 ns OE to Qn tPHZ VCC
35、= 4.5 V and 5.5 V 10, 11 All 1.0 7.5 1/ Not more than one output will be shorted at one time and the duration of the short circuit condition shall not exceed one second. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI
36、ZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outlines K and L 3 Terminal number Terminal symbol 1 OE NC 2 D0 OE 3 D1 D0 4 D2 D1 5 D3 D2 6 D4 D3 7 D5 D4 8 D6 NC 9 D7 D5 10 D8 D6 11 D9 D7 12 GND D8 13 CP D9 14 Q9 GND
37、 15 Q8 NC 16 Q7 CP 17 Q6 Q9 18 Q5 Q8 19 Q4 Q7 20 Q3 Q6 21 Q2 Q5 22 Q1 NC 23 Q0 Q4 24 VCCQ3 25 - - - Q2 26 - - - Q1 27 - - - Q0 28 - - - VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING S
38、IZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Input Output Function OE Dn CP Qn H L Z Load H H Z H X H Z Hold H X L Z L L L Data L H H available L X H NC No change L X L NC H = High level voltage L = Low level voltage X = Irrelevant =
39、 Low to high clock transition NC = No change Z = High impedence FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SH
40、EET 8 DSCC FORM 2234 APR 97 FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC
41、FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. All input pulses have the following characteristics: PRR 1 MHz, duty cycle = 50%, tr= tf= 2.5 ns, duty cycle = 50%. 3. When measuring propagation delay times of three-state outputs, switch 1 is open. 4. When measuring pulse widths,
42、tr 1 ns, tf 1 ns. 5. The outputs are measured one at a time with one input transition per measurement. FIGURE 3. Test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 59
43、62-89438 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method
44、5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C or D. The test circuit shall be maintained by the manufacturer under document rev
45、ision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Int
46、erim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-S
47、TD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9, 10, 11 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10, 11 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies
48、 to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. Provided by IHSNot for Re
