1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added one vendor, CAGE 1ES66. Made change to table I and figure 1. Editorial changes throughout. 91-10-29 M. A. FRYE B Add device class V and radiation hardness requirements. Make change to footnote six as specified in table I. Make change to gro
2、ups C and D endpoints as specified in table IIA and add table IIB. Delete CAGE 07933. Replace CAGE 06665 with CAGE 24355. - ro 00-05-31 R. MONNIN C Add device types 03 and 04. Make changes to 1.2.2 and to output voltage noise test as specified in table I. - ro 01-02-06 R. MONNIN D Add case outline H
3、. - ro 02-04-15 R. MONNIN E Drawing updated to reflect current requirements. -rrp 09-04-01 J. D. RODENBECK F Add device type 05 tested at low dose rate. Make change to paragraphs 1.2.2, 1.5, and 3.2.3. Make changes to footnotes 2/ and 3/ as specified under Table I. Removed figure 2. Make change to T
4、able IIB and paragraph 4.4.4.1. -rrp 11-11-29 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV F F F F F F F F F F OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.
5、landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAY MONNIN APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, POSITIVE 10-VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON DRA
6、WING APPROVAL DATE 89-07-17 AMSC N/A REVISION LEVEL F SIZE A CAGE CODE 67268 5962-89581 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E019-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89581 DLA LAND AND MARI
7、TIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are
8、available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes M and Q: 5962 - 89581 01 G A Federal stock class designator R
9、HA designator (see 1.2.1) Device type (see 1.2.2) Case outline (see 1.2.4) Lead finish (see 1.2.5) / / Drawing number For device class V: 5962 - 89581 01 V G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead fini
10、sh (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and
11、are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Output voltage noise 01 REF01A Precision reference +10-volt 30 VP-Padjustable output 0
12、2 REF01 Precision reference +10-volt 30 VP-Padjustable output 03 REF01A Precision reference +10-volt 150 VP-Padjustable output 04 REF01 Precision reference +10-volt 150 VP-Padjustable output 05 REF01A Radiation hardened, 30 VP-Pprecision reference +10-volt adjustable output Provided by IHSNot for Re
13、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89581 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 3 DSCC FORM 2234 APR 97 1.2.3 Device class designator. The device class designator is a single letter identi
14、fying the product assurance level as listed below. Since the device class designator has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class Device requirements documentation M V
15、endor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows
16、: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or M
17、IL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) . 40 V dc Power dissipation (PD) 500 mW 2/ Output short circuit duration . Indefinite Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Junction temperature (TJ) +15
18、0C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features: Device type 01: Maximum total dose available (dose rate = 50 300 rads(Si)/s) . 100 krads (Si) 3/ Device type 05: Maximu
19、m total dose available (dose rate 10 mrads(Si)/s) 50 krads (Si) 4/ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate above +80C, 7.1 mW/C for case outline G. Derat
20、e above +75C, 6.6 mW/C for case outline P. Derate above +72C, 7.8 mW/C for case outline 2. Derate above +85C, 5.6 mW/C for case outline H. 3/ For device type 01, this part may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits
21、 for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. 4/ For device type 05, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. Provided by IHSNot for
22、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89581 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. T
23、he following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufac
24、turing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Mi
25、crocircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this
26、drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes
27、Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shal
28、l be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38
29、535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained
30、 by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics
31、and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in
32、table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the
33、 device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networ
34、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89581 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise s
35、pecified Group A subgroups Device type Limits Unit Min Max Quiescent supply current ISYNo load 1 All 1.4 mA 2,3 2.0 M,D,P,L,R 1 01 1.4 M,D,P,L 1 05 1.4 Output adjustment range VTRIMRP= 10 k, 4/ TA= +25C 1 All 3.0 % Output voltage VOUTIL= 0 mA 1 01,03,05 9.97 10.03 V 02,04 9.95 10.05 2,3 01,03,05 9.9
36、55 10.045 02,04 9.905 10.095 M,D,P,L,R 1 01 9.94 10.06 M,D,P,L 1 05 9.94 10.06 Short circuit current IOSVO= 0 V, TA= +25C 4/ 1 01,03,05 +15 +60 mA Sink current ISTA= +25C 4/ 1 All -0.3 mA Load regulation LD reg IL= 0 mA to 10 mA 5/ 6/ 1 01,03, 05 0.008 %/mA 02,04 0.010 M,D,P,L,R 1 01 0.015 M,D,P,L 1
37、 05 0.015 IL= 0 mA to 8 mA 5/ 6/ 2,3 01,03, 05 0.012 02,04 0.015 Line regulation LN reg VIN= 13 V to 33 V 5/ 1 All 0.01 %/V 2,3 0.015 M,D,P,L,R 1 01 0.03 M,D,P,L 1 05 0.03 Load current ILTA= +25C 4/ 7/ 1 All 10 mA 2,3 8 Output voltage noise enp-p 0.1 Hz to 10 Hz 4/ 4 01,02, 05 30 Vp-p 03,04 150 See
38、footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89581 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL F SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance
39、characteristics Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage temperature coefficient TCVO-55C TA +125C 4/ 8/ 5,6 01,03, 05 8.5 ppm/C 02,04 25 1/ VIN= 15 V, unless otherwise specified. 2/ Device ty
40、pe 01 supplied to this drawing meets all levels M, D, P, L, and R of irradiation however this device is only tested at the R level. Device type 05 supplied to this drawing meets all all levels P & L of irradiation however this device is only tested at the L level. Pre and post irradiation values are
41、 identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted par
42、ameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device type 01. Device type 05 has been tested at the low dose rate. 4/ Not tested post irradiation. 5/ Line and load regulation specifications include the effect of self-heating. 6/ LDreg= (VOUT/ I
43、OUT) / VOUTx 100 = % / mA. 7/ Minimum load current guaranteed by load regulation test. 8/ TCVO= ABS ( VMAX VMIN) / 10 V) x (1/180C) x (106) where 55C TA +125C. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535.
44、 The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6
45、.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of
46、supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as require
47、d for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of produc
48、t (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Mic
