1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDABCDAdd device type 02. Add package Y. Correct table I, I . EditorialCCchanges throughout.Changes in accordance with NOR 5962-R058-94Changes in accordance with NOR 5962-R025-95Add device 03. Editorial changes throughout.92-01-1693-12-0294-11-1595-09-2
2、6Monica PoelkingTim NohThomas M. HessMonica PoelkingREV SHEETREV DDDDDDDDDDDSHEET 15 16 17 18 19 20 21 22 23 24 25REV STATUSOF SHEETSREV DD DDDDDDDD DDD DSHET 123456789101121314PMIC N/APREPARED BY Todd D. Creek DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 STANDARDMICROCIRCUITDRAWINGTHIS DRAW
3、ING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAND AGENCIES OF THEDEPARTMENT OF DEFENSEAMSC N/A CHECKED BYRay MonninMICROCIRCUIT, DIGITAL, CMOS, 32-BIT DMACONTROLLER WITH INTEGRATED SYSTEM SUPPORTPERIPHERALS, MONOLITHIC SILICONAPPROVED BYMichael FryeDRAWING APPROVAL DATE89-06-23SIZEACAGE CODE672685962-895
4、93REVISION LEVELDSHEET 1 OF 25DESC FORM 193JUL 94 5962-E258-95DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENT
5、ERDAYTON, OHIO 45444SIZEA5962-89593REVISION LEVELDSHEET2DESC FORM 193AJUL 941. SCOPE1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883,“Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“.1.2 Part o
6、r Identifying Number (PIN). The complete PIN shall be as shown in the following example:5962-89593 01 X X G0D G0D G0D G0D G0D G0D G0D G0D G0D G0D G0D G0DG0D G0D G0D G0D Drawing number Device type Case outline Lead finish(see 1.2.1) (see 1.2.2) (see 1.2.3)1.2.1 Device type(s). The device type(s) shal
7、l identify the circuit function as follows:Device type Generic number Circuit function Frequency01 82380 32-bit DMA controller with integrated 16 MHzsystem support peripherals02 82380 32-bit DMA controller with integrated 20 MHzsystem support peripherals03 82380 32-bit DMA controller with integrated
8、 25 MHzsystem support peripherals1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleY See figure 1 164 Leaded chip carrier leadsZ CMGA6-P132 132 Pin grid array package1.2.3 Lead finish. The lea
9、d finish shall be as specified in MIL-STD-883 (see 3.1 herein). Finish letter “X“ shall not be marked on themicrocircuit or its packaging. The “X“ designation is for use in specifications when lead finishes A, B, and C are considered acceptableand interchangeable without preference.1.3 Absolute maxi
10、mum ratings. Storage temperature range- -65G28C to +150G28CVoltage on any pin with respect to ground - -0.5 V dc to +6.5 V dcPower dissipation (P )- 2.0 WDLead temperature (soldering, 10 seconds) - +300G28CThermal resistance, junction-to-case (G14 ):JCCase Z - See MIL-STD-1835Case Y - +8G28C/WJuncti
11、on temperature (T ) - +175G28CJ1.4 Recommended operating conditions.Case operating temperature range (T ) - -55G28C to +125G28CCSupply voltage range (V ) - +4.75 V dc to +5.25 V dcCC2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and bulletin. Unless otherwise specified, the followin
12、g specification, standards, and bulletinof the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, forma part of this drawing to the extent specified herein.SPECIFICATIONMILITARYMIL-I-38535 - Integrated Circuits (Microcircuits)
13、 Manufacturing, General Specification for.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89593REVISION LEVELDSHEET3DESC FORM 193AJUL 94STANDARDSMILITARYMIL-STD-
14、883 - Test Methods and Procedures for Microelectronics.MIL-STD-1835 - Microcircuit Case Outlines.BULLETIN MILITARYMIL-BUL-103 - List of Standardized Military Drawings (SMDs).(Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acquisition functi
15、ons shouldbe obtained from the contracting activity or as directed by the contracting activity.)2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of thisdrawing shall take precedence.3. REQUIREMENTS3.1 Item requirements. Th
16、e individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the useof MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. Product built to this drawing that is producedby a Qualified Manufacturer Listing (QML) certified and qualifi
17、ed manufacturer or a manufacturer who has been granted transitionalcertification to MIL-I-38535 may be processed as QML product in accordance with the manufacturers approved program plan andqualifying activity approval in accordance with MIL-I-38535. This QML flow as documented in the Quality Manage
18、ment (QM) plan maymake modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. Thesemodifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-I-38535 is requiredto identify when th
19、e QML flow option is used.3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-STD-883 (see 3.1 herein) and herein.3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1.3.2.2 Termi
20、nal connections. The terminal connections shall be as specified on figure 2.3.2.3 Functional block diagram. The functional block diagram shall be as specified on figure 3.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are ass
21、pecified in table I and shall apply over the full (case or ambient) operating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests foreach subgroup are described in table I.3.5 Marking. Marking shall b
22、e in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed in 1.2herein. In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103 (see 6.6 herein).3.6 Certificate of compliance. A certificate of compliance shall be required from a manufactur
23、er in order to be listed as an approvedsource of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-EC prior to listing as an approvedsource of supply shall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and therequir
24、ements herein.3.7 Certificate of conformance. A certificate of conformance as required in MIL-STD-883 (see 3.1 herein) shall be provided with eachlot of microcircuits delivered to this drawing.3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-
25、883 (see 3.1 herein).3.9 Verification and review. DESC, DESCs agent, and the acquiring activity retain the option to review the manufacturers facilityand applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer.Provided by IHSNot for Res
26、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89593REVISION LEVELDSHEET4DESC FORM 193AJUL 94TABLE I. Electrical performance characteristics. G0DG0D G0D G0DG0D G0DTest G0D Symbol G0D Con
27、ditions G0D Group A G0DDevic G0D Limits G0D UnitG0DG0D -55G28C G06 T G06 +125G28C G0D subgroups G0D type G0D G0DCG0DG0D unless otherwise specified G0DG0DG0DG0DG0DG0DG0D G0DG0DG0D Min G0D Max G0DG0DG0D G0D G0DG0DG0DG0DG0DG0D G0D G0DG0DG0DG0DInput low voltage G0DV G0DG0D 1,2,3 G0D All G0D -0.3 G0D 0.8
28、 G0D VILG0DG0D G0D G0DG0D 1/ G0DG0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0D 1/ G0DInput high voltage G0DV G0DG0D 1,2,3 G0DG0D 2.0 G0DV G0D VIH CCG0DG0D G0D G0DG0DG0D +0.3 G0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 input low voltage G0DV G0DG0D 1,2,3 G0DG0D -0.3 G0D 0.8 G0D VILCG0DG0D G0D G0D
29、G0D 1/ G0DG0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 input high voltage G0DV G0DG0D 1,2,3 G0DG0DV-G0DV G0D VIHC CC CCG0DG0D G0D G0DG0D 0.8 G0D +0.3 G0DG0DG0D G0D G0DG0DG0D 1/ G0DG0DG0D G0D G0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DOutput low voltage G0DV G0DI = 4 mA: A -A , D -D , G0D 1,2,3 G0DG0D
30、G0D 0.45 G0D VOL OL 2 31 0 31G0DG0DI = 5 mA: all others G0DG0DG0DG0D G0DOLG0DG0D G0D G0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DOutput high voltage G0DV G0DI = -1 mA: A -A , D -D , G0D 1,2,3 G0DG0D 2.4 G0DG0D VOH OH 2 31 0 31G0DG0DI = -0.9 mA: all others G0DG0DG0DG0DG0DOHG0DG0D G0D G0DG0DG0DG0D G0DG0D G0DG
31、0DG0DG0DG0DInput leakage current G0DI G0DAll inputs except: IRQ11- G0D 1,2,3 G0DG0D-15 G0D +15 G0D ALIG0DG0D-IRQ23, EOP, TOUT2/IRQ3 G0DG0DG0DG0DG0DG0DG0DDREQ4, 0 V V G0DG0DG0DG0DG0DIN CCG0DG0D G0D G0DG0DG0DG0D G0DG0D G0DG0DG0DG0DG0DInput leakage current G0DI G0DInputs: IRQ11 - IRQ23 G0D 1,2,3 G0DG0D
32、G0D -325 G0D ALI1G0DG0DEOP, TOUT2/IRQ3, DREQ4 G0DG0DG0DG0DG0DG0DG0D0 V V 2/ G0DG0DG0DG0DG0DIN CCG0DG0D G0D G0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DOutput leakage current G0DI G0D0 V V G0D 1,2,3 G0DG0D -15 G0D +15 G0D AL0 OUT CCG0DG0D G0D G0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DSupply current G0DI G0DCLK2 =
33、32 MHz G0D 1,2,3 G0D 01 G0DG0D 240 G0D mACCG0DG0D 3/ G0DG0DG0DG0DG0DG0DG0DCLK2 = 40 MHz G0DG0D 02 G0DG0D 248 G0DG0DG0D 3/ G0DG0DG0DG0DG0DG0DG0DCLK2 = 50 Mhz G0DG0D 03 G0DG0D 375 G0D G0DG0D G0D G0DG0DG0DG0DInput capacitance G0DC G0Df = 1 MHz G0D 4 G0D All G0DG0D 12 G0D pFIG0D G0DSee 4.3.1c G0DG0DG0DG
34、0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 input capacitance G0DC G0DG0D 4 G0D All G0DG0D 20 G0D pFCLKG0DG0D G0D G0DG0DG0DG0D G0DG0D4.75 V G06 V G06 5.25 V G0DG0DG0DG0DG0DCCFunctional tests G0DG0DSee 4.3.1d G0D 7,8 G0D All G0DG0DG0DG0DG0D G0D G0DG0DG0DG0D See footnotes at end of table.Provided by IHSNot for
35、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89593REVISION LEVELDSHEET5DESC FORM 193AJUL 94TABLE I. Electrical performance characteristics - Continued.G0DG0D Conditions G0DG0DG0D Li
36、mits G0DTest G0DSymbol G0D -55G28C G06 T G06 +125G28C G0DGroup A G0DDevice G0DG0D UnitCG0DG0D V = 5 V 5% G0Dsubgroups G0D types G0D Min G0D Max G0DCCG0DG0D unless otherwise specified G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DOperating frequency G0Df G0DSee figure 4 G0D 9,10,11 G0D 01 G0D 4 G0D 16 G0D M
37、HzMAXG0DG0D G0DG0D 02 G0D 4 G0D 20 G0D G0DG0D G0D G0DG0DG0DG0DCLK2 period time G0Dt G0DG0D 9,10,11 G0D 01 G0D31.25 G0D 125 G0D ns1G0DG0D G0D G0D 02 G0D25 G0D 125 G0D G0DG0D G0D G0D 03 G0D20 G0D 125 G0D G0DG0D G0D G0DG0DG0DG0DCLK2 high time G0Dt G0DMeasured at 2.0 V G0D 9,10,11 G0D 01 G0D 9 G0DG0D ns
38、2aG0DG0DSee figure 4 G0DG0D 02 G0D 8 G0D G0D G0DG0D G0D G0D 03 G0D 7 G0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 high time 1/ G0Dt G0DMeasured at V -0.8 V G0D 9,10,11 G0D 01 G0D 5 G0DG0D ns2b CCG0DG0DSee figure 4 G0DG0D 02 G0D 5 G0D G0D G0DG0D G0D G0D 03 G0D 4 G0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 low time G0Dt
39、 G0DMeasured at 2.0 V G0D 9,10,11 G0D 01 G0D 9 G0DG0D ns3aG0DG0DSee figure 4 G0DG0D 02 G0D 8 G0D G0D G0DG0D G0D G0D 03 G0D 7 G0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 low time 1/ G0Dt G0DMeasured at 0.8 V G0D 9,10,11 G0D 01 G0D 7 G0DG0D ns3bG0DG0DSee figure 4 G0DG0D 02 G0D 6 G0D G0D G0DG0D G0D G0D 03 G0D 4
40、 G0DG0D G0DG0D G0D G0DG0DG0DG0DCLK2 fall time 1/ G0Dt G0DMeasured from V -0.8 V to G0D 9,10,11 G0D 01 G0DG0D 8 G0D ns4CCG0DG0D0.8 V, see figure 4 G0DG0D 02 G0DG0D 8 G0D G0DG0D G0D G0D 03 G0DG0D 7 G0D G0DG0D G0D G0DG0DG0DG0DCLK2 rise time 1/ G0Dt G0DMeasured from 0.8 V to V G0D 9,10,11 G0D 01 G0DG0D
41、8 G0D ns5CG0DG0D-0.8 V, see figure 4 G0DG0D 02 G0DG0D 8 G0D G0DG0D G0D G0D 03 G0DG0D 7 G0D G0DG0D G0D G0DG0DG0DG0DA-A , BE -BE, G0Dt G0DSee figure 4 G0D 9,10,11 G0D 01 G0D 4 G0D 36 G0D ns231 0 3 6EDACK -EDACK G0DG0D G0D G0DG0DG0DG0D02valid delay G0DG0D G0D G0D 02 G0D 4 G0D 30 G0D G0DG0D G0DG0D 03 G0
42、D 4 G0D 20 G0D G0DG0D G0D G0DG0DG0DG0DA-A , BE -BE, G0Dt G0DG0D 9,10,11 G0D 01 G0D 4 G0D 40 G0D ns231 0 3 7float delay 1/ G0DG0D G0D G0DG0DG0DG0DG0DG0D G0DG0D 02 G0D 4 G0D 32 G0D G0DG0D G0D G0DG0DG0DG0DA-A , BE -BE, G0Dt G0DG0D 9,10,11 G0D All G0D 6 G0DG0D ns231 0 3 8setup times G0DG0D G0D G0DG0DG0D
43、G0DG0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DA-A , BE -BE, G0Dt G0DG0D 9,10,11 G0D All G0D 4 G0DG0D ns231 0 3 9hold time G0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DW/R, M/IO, D/C valid G0Dt G0DG0D 9,10,11 G0D 01 G0D 6 G0D 33 G0D ns10delay G0DG0D G0D G0D 02 G0D 6 G0D 28 G0D G0DG0D G0DG0D 03 G0
44、D 4 G0D 20 G0D G0DG0D G0D G0DG0DG0DG0DW/R, M/IO, D/C float 1/ G0Dt G0DG0D 9,10,11 G0D 01 G0D 4 G0D 35 G0D ns11delay G0DG0D G0D G0D 02 G0D 4 G0D 30 G0D G0DG0D G0DG0D 03 G0D 4 G0D 29 G0D G0DG0D G0D G0DG0DG0DG0DW/R, M/IO, D/C setup G0Dt G0DG0D 9,10,11 G0D All G0D 6 G0DG0D ns12G0DG0D G0D G0DG0DG0DG0D Se
45、e footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGDEFENSE ELECTRONICS SUPPLY CENTERDAYTON, OHIO 45444SIZEA5962-89593REVISION LEVELDSHEET6DESC FORM 193AJUL 94TABLE I. Electrical performance charact
46、eristics - Continued.G0DG0D Conditions G0DG0DG0D Limits G0DTest G0DSymbol G0D -55G28C G06 T G06 +125G28C G0DGroup A G0DDevice G0DG0D UnitCG0DG0D V = 5 V 5% G0Dsubgroups G0D types G0D Min G0D Max G0DCCG0DG0D unless otherwise specified G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DW/R, M/IO, D/C hold G0Dt G0
47、DSee figure 4 G0D 9,10,11 G0D All G0D 4 G0DG0D ns13time G0DG0D G0DG0DG0DG0DG0D G0DG0D G0D G0DG0DG0DG0DADS valid delay G0Dt G0DG0D 9,10,11 G0D 01 G0D 6 G0D 33 G0D ns14G0DG0D G0D G0D 02 G0D 6 G0D 28 G0D G0DG0D G0DG0D 03 G0D 4 G0D 19 G0D G0DG0D G0D G0DG0DG0DG0DADS float delay 1/ G0Dt G0DG0D 9,10,11 G0D 01 G0D 4 G0D 35 G0D ns15
