DLA SMD-5962-89635 REV B-2010 MICROCIRCUIT LINEAR LOW NOISE OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

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1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. -ro 01-04-09 R. MONNIN B Update boilerplate paragraphs to current MIL-PRF-38535 requirements. -rrp 10-02-16 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET

2、REV STATUS REV B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AP

3、PROVED BY MONICA L. POELKING MICROCIRCUIT, LINEAR, LOW NOISE, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-04-18 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89635 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E431-06 Provided by IHS

4、Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements fo

5、r MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89635 01 G X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1

6、.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HA-5101 Low noise operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive desi

7、gnator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage between +VSand VSterminals 40 V dc Differential inp

8、ut voltage 7.0 V dc Voltage at either input terminal +VSand VSInput current 25 mA Output short circuit current duration Indefinite Maximum power dissipation (PD): 1/ Case G 830 mW Case P . 1.22 W Case 2 . 1.35 W Junction temperature (TJ) . +175C Lead temperature (soldering, 10 seconds) +275C Thermal

9、 resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 121C/W Case P . 82C/W Case 2 . 74C/W 1/ Derate linearly above TA= +75C as follows: case G = 8.3 mW/C, case P = 12.2 mW/C, and case 2 = 13.5 mW/C. Provided by IHSNot for ResaleNo reproduction or

10、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (+VS) +5.0 V dc to +15 V dc N

11、egative supply voltage range (-VS) . -5.0 V dc to 15 V dc Common mode input voltage (VCM) (+VS- -VS) / 2 Load resistance (RL) . 500 Ambient operating temperature (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standard

12、s, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. D

13、EPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of thes

14、e documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited he

15、rein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A

16、for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product

17、in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function

18、 of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dim

19、ensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise s

20、pecified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each su

21、bgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Mark

22、ing shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the opt

23、ion of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance w

24、ith MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA

25、prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with e

26、ach lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facil

27、ity and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in

28、 accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufa

29、cturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) T

30、A= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in a

31、ccordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTE

32、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOVCM= 0.0 V 1 01 3.0 mV 2,3

33、 4.0 Input bias current +IBVCM= 0.0 V, -RS= 100 , 1 01 200 nA +RS= 100 k 2,3 325 -IBVCM= 0.0 V, +RS= 100 , 1 200 -RS= 100 k 2,3 325 Input offset current IIOVCM= 0.0 V, -RS= 10 k, 1 01 75 nA +RS= 100 k 2,3 125 Common mode voltage range +VCM+VS= 3.0 V, -VS= -27 V 1,2,3 01 12 V -VCM+VS= 27 V, -VS= -3.0

34、 V -12 Large signal voltage gain +AVOLVOUT= 0.0 V and 10 V, RL= 2.0 k 4,5,6 01 100 kV/V -AVOLVOUT= 0.0 V and -10 V, RL= 2.0 k 100 Common mode rejection ratio +CMRR VCM= 10 V, +VS= 5.0 V, -VS= -25 V, VOUT= -10 V 1,2,3 01 80 dB -CMRR VCM= -10 V, +VS= 25 V, -VS= -5.0 V, VOUT= 10 V 80 Output current +IO

35、UTVOUT= -15 V, +VS= 18 V, -VS= -18 V 1,2,3 01 25 mA -IOUTVOUT= 15 V, +VS= 18 V, -VS= -18 V -25 Output voltage swing +VOUT1RL= 2.0 k 1,2,3 01 12 V -VOUT1-12 +VOUT2+VS= 18 V, -VS= -18 V, 15 -VOUT2RL= 600 -15 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking perm

36、itted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwi

37、se specified Group A subgroups Device type Limits Unit Min Max Quiescent power supply +ICCVOUT= 0.0 V, IOUT= 0 mA 1,2,3 01 6.0 mA -ICC-6.0 Power supply rejection ratio +PSRR +VS= +10 V and +20 V, -VS= -15 V 1,2,3 01 80 dB -PSRR -VS= -10 V and -20 V, +VS= +15 V 80 Offset voltage 2/ adjustment +VIOadj

38、 RL= 2.0 k, CL= 50 pF, AV= 1.0 V/V 1,2,3 01 VIO-1.0 mV -VIOadj VIO+1.0 Differential input 3/ resistance RINVCM= 0.0 V, TA= +25C 4 01 250 k Input noise voltage 3/ EnRS= 20 , fO= 1.0 kHz, TA= +25C 4 01 7.0 nV / Hz Input noise current 3/ InRS= 2.0 M, fO= 1.0 kHz, TA= +25C 4 01 3.0 pA / Hz Low frequency

39、 3/ peak-to-peak noise Enp-p 0.1 Hz to 10 Hz, TA= +25C 4 01 4.5 VP-PSlew rate +SR VOUT= -3.0 V to 3.0 V, TA= +25C 4 01 6.0 V/s -SR VOUT= 3.0 V to -3.0 V, TA= +25C 6.0 Unity gain bandwidth UGBW VOUT= 100 mV, TA= +25C 4 01 10 MHz Full power bandwidth 3/ 4/ FPBW VPK= 10 V, TA= +25C 4 01 95 kHz Closed l

40、oop stable 3/ gain CLSG RL= 2.0 k, CL= 50 pF 4,5,6 01 1.0 V/V Rise time 5/ trVOUT= 0.0 V to +200 mV 9 01 200 ns 10,11 400 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 D

41、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Fall time 5/ trVOUT=

42、0.0 V to -200 mV 9 01 200 ns 10,11 400 Overshoot +OS VOUT= 0.0 V to +200 mV 9,10,11 01 35 % -OS VOUT= 0.0 V to -200 mV 35 Output resistance 3/ ROUTOpen loop, TA= +25C 4 01 150 Quiescent power 6/ consumption PC VOUT= 0.0 V, IOUT= 0 mA 1,2,3 01 180 mW 1/ Unless otherwise specified, +VS= +15 V, -VS= -1

43、5 V, RS= 100 , RL= 500 k, CL= 50 pF, VOUT= 0.0 V, and AV= 1.0 V/V. 2/ Offset adjustment range is VIO(measured) 1.0 mV minimum referred to output. This test is for functionality only to assure adjustment through 0.0 V. 3/ If not tested, shall be guaranteed to the limits specified in table I herein. 4

44、/ Full power bandwidth = SR / (2 x VPK). 5/ Rise and fall times measured between 10 % and 90 % point. 6/ Quiescent power consumption based on quiescent supply current test maximum (no load outputs). 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7 and 8 in

45、table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintaine

46、d by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL

47、-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89635 DEFENSE SUPPLY CENTER COLUMBUS COLUMB

48、US, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines G and P 2 Terminal number Terminal symbol 1 BALANCE NC 2 -INPUT BALANCE 3 +INPUT NC 4 -VSNC 5 BALANCE -INPUT 6 OUTPUT NC 7 +VS+INPUT 8 NC NC 9 - NC 10 - -VS11 - NC 12 - BALANCE 13 - NC 14 - NC 15 - OUTPUT 16 - NC 17 - +VS18 - NC 19 - NC 20 - NC NC = No connection FIGURE 1. Terminal connections. Provided by IHS

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