1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with N.O.R. 5962-R163-92. 92-03-26 M. A. FRYE B Changes in accordance with N.O.R. 5962-R228-94. 94-07-27 M. A. FRYE C Drawing updated to reflect current requirements. - ro 01-04-11 R. MONNIN D Update boilerplate paragraphs t
2、o current MIL-PRF-38535 requirements. -rrp 10-02-16 C. SAFFLE THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY CHARLES E. BESORE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT
3、DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, BUFFER AMPLIFIER, WIDEBAND, HIGH SLEW RATE / OUTPUT CURRENT, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT
4、OF DEFENSE DRAWING APPROVAL DATE 90-04-16 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89636 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E432-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFE
5、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Numb
6、er (PIN). The complete PIN is as shown in the following example: 5962-89636 01 G X Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01
7、 HA-5002 Wideband, high output current buffer 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier
8、1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Voltage between +VSand VSterminals 44 V dc Input voltage Equal to supplies Peak output current (50 ms on 1.0 second off) . 400 mA Continuous output current . 200 mA RMS Storage temperature
9、range . -65C to +150C Maximum power dissipation (PD): 1/ Case G 0.93 W Case P . 0.88 W Case 2 . 1.20 W Lead temperature (soldering, 10 seconds) +275C Junction temperature (TJ) . +175C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Thermal resistance, junction-to-ambient (JA): Case G 10
10、8C/W Case P . 114C/W Case 2 . 83C/W 1/ Derate linearly above TA= +75C as follows: case G = 9.3 mW/C, case P = 8.8 mW/C, and case 2 = 12.0 mW/C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SU
11、PPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Positive supply voltage range (+VS) +12 V dc to +15 V dc Negative supply voltage range (-VS) . -12 V dc to 15 V dc Load resistance (RL) . 100 Ambient operating temperat
12、ure (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
13、solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTM
14、ENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
15、Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has
16、 been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified
17、and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in t
18、he Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is requir
19、ed to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Te
20、rminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4
21、 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI
22、NG SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may
23、also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in
24、compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufactur
25、er in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requi
26、rements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affect
27、s this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling
28、and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria
29、shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify t
30、he inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior t
31、o burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. Provided by IHSNot for R
32、esaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/
33、 -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIOVIN= 0.0 V 1 01 20 mV 2,3 30 Input bias current IBRS= 1.0 k 1 01 7 A 2,3 10 Voltage gain +AVVIN= 10 V, RL= 1.0 k 1,2,3 01 0.98 V/V VIN= 10 V, RL= 100 1 0.96 -AVVIN= -10 V, RL= 1.0 k 1,
34、2,3 0.98 VIN= -10 V, RL= 100 1 0.96 Output voltage swing +VOUTVIN= 15 V, VS= 15 V, RL= 1.0 k 1,2,3 01 10 V VIN= 15 V, VS= 15 V, RL= 100 10 VIN= 12 V, VS= 12 V, RL= 1.0 k 10 -VOUTVIN= -15 V, VS= 15 V, RL= 1.0 k -10 VIN= -15 V, VS= 15 V, RL= 100 -10 VIN= -12 V, VS= 12 V, RL= 1.0 k -10 Output current +
35、IOUTVOUT= 10 V 1,2,3 01 100 mA -IOUTVOUT= -10 V -100 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
36、L D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Power supply rejection ratio +PSRR1+VS= +20 V and +10 V, -VS= -15 V 1,2,3 01 54 dB -PSRR1-
37、VS= -20 V and -10 V, +VS= +15 V 54 +PSRR2+VS= +17 V and +7.0 V, -VS= -12 V 54 -PSRR2-VS= -17 V and 7.0 V, +VS= +12 V 54 Power supply current +ICCVIN= 0.0 V 1,2,3 01 10 mA -ICC-10 Input resistance 2/ RINVIN= -10 V, 0 V, 10 V TA= +25C 1 01 1.5 M Slew rate 2/ +SR VOUT= -5.0 V to +5.0 V 4 01 1.0 V/ns -S
38、R VOUT= +5 V to -5 V 1.0 Rise time 2/ 3/ trVOUT= 0.0 mV to +500 mV 9,10,11 01 10 ns Fall time 2/ 3/ tfVOUT= 0.0 mV to -500 mV 9,10,11 01 10 ns Quiescent power 4/ consumption PC1VIN= 0.0 V, IOUT= 0 mA, VS= 15 V 1,2,3 01 300 mW PC2VIN= 0.0 V, IOUT= 0 mA, VS= 12 V 240 Overshoot 2/ +OS VOUT= 0.0 mV to 5
39、00 mV 9,10,11 01 30 % -OS VOUT= 0.0 mV to -500 mV 30 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVE
40、L D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output resistance 2/ ROUTVIN= 10 V, VS= 15 V, IOUT= -100 mA and 10 mA, TA= +25C 1 01 5 VIN
41、= -10 V, VS= 15 V, IOUT= 100 mA and 10 mA, TA= +25C 5 1/ Unless otherwise specified, measurements apply at both +VS= 12 V, VS= 15 V, RS= 50 , RL= 1.0 k, CL= 10 pF, and VOUT= 0.0 V. 2/ If not tested, shall be guaranteed to the limits specified in table I herein. 3/ Rise and fall times measured betwee
42、n 10 % and 90 % points. 4/ Quiescent power consumption based on quiescent supply current test maximum (no load outputs). 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, 7, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C an
43、d D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall b
44、e made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, excep
45、t as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Devi
46、ce type 01 Case outlines P G 2 Terminal number Terminal symbol 1 +V1+V1NC 2 -V2+V2+V13 NC NC NC 4 INPUT OUTPUT NC 5 -V1NC -V26 NC -V2NC 7 +V2-V1NC 8 OUTPUT INPUT NC 9 - - NC 10 - - INPUT 11 - - NC 12 - - -V113 - - NC 14 - - NC 15 - - NC 16 - - NC 17 - - +V218 - - NC 19 - - NC 20 - - OUTPUT NC = No c
47、onnection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89636 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 TABLE II
48、. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 4 Group A test requirements (method 5005) 1, 2, 3, 4, 9*, 10*, 11* Groups C and D end-point electrical parameters (method 5005
