1、REVISIONSLTR DESCRIPTION DATE (YR-MO-DA) APPROVEDA Drawing updated to reflect current requirements. - lgt 01-08-03 Raymond MonninTHE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.REVSHEETREVSHEETREV STATUS REV AAAAAAAAAAAAOF SHETS SHET 12345678910112PMIC N/A PREPARED BY Rick C. OfficerDEFEN
2、SE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUITDRAWINGCHECKED BYCharles ReusingCOLUMBUS, OHIO 43216http:/www.dscc.dla.milTHIS DRAWING IS AVAILABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYMichael FryeMICROCIRCUIT, LINEAR, QUAD 8-BITMULTIPLYING CMOS, DIGITAL-TO-ANALOGCONVERTER WITH MEMORY, MONOLITHICSILICONA
3、ND AGENCIES OF THEDEPARTMENT OF DEFENSEDRAWING APPROVAL DATE03 November 1989AMSC N/AREVISION LEVELASIZEACAGE CODE672685962-89678SHEET1 OF 12DSCC FORM 2233APR 97 5962-E543-01DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction o
4、r networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level
5、B microcircuits inaccordance with MIL-PRF-38535, appendix A.1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:5962-89678 01 X XDrawing number Device type(see 1.2.1)Case outline(see 1.2.2)Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify
6、 the circuit function as follows:Device type Generic number Circuit function01 DAC-8408A Quad 8-bit multiplying CMOS, digital-to-analog converter with memory02 DAC-8408B Quad 8-bit multiplying CMOS, digital-to-analog converter with memory1.2.2 Case outline(s). The case outline(s) are as designated i
7、n MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX GDIP1-T28 or CDIP2-T28 28 Dual-in-line1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.1.3 Absolute maximum ratings. VDD to IOUT2 (pins 5, 24) 0 V dc to +7.0 V dcVDD to DGND 0
8、V dc to +7.0 V dcIOUT2 (pins 5, 24) to DGND . -0.3 V dc to VDD +0.3 V dcDigital input voltage to DGND -0.3 V dc to VDD +0.3 V dcOutput voltage (pins 4, 6, 23, 25) to DGND -0.3 V dc to VDD +0.3 V dcVREFA, VREFB, VREFC, VREFD to DGND G0125 V dcVoltage from RFBA, RFBB, RFBC, RFBD to DGND. G0125 V dcPow
9、er dissipation (PD) to +75G02C. 45 mW 1/Storage temperature range -65G02C to +150G02CLead temperature (soldering, 60 seconds). +300G02CThermal resistance, junction-to-case (G03JC) . See MIL-STD-1835Thermal resistance, junction-to-ambient (G03JA) 120G02C/W1.4 Recommended operating conditions.Ambient
10、operating temperature range (TA) -55G02C to +125G02CReference voltage (VREF) +10 VVOUT1 and VOUT2 0 VVDD +5 V G0110%Source resistance (RS) 50G041/ Derate above +75G02C at 6.0 mW/G02C.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUI
11、T DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET3DSCC FORM 2234APR 972. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form apart of this drawing to the extent specif
12、ied herein. Unless otherwise specified, the issues of these documents are those listedin the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited inthe solicitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38535 - Integrated Circuits, Manuf
13、acturing, General Specification for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings.MIL-HDBK-780 - Standard Microcir
14、cuit Drawings.(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence. In the event of a conflict between the text of this drawi
15、ng and the references cited herein, the textof this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless aspecific exemption has been obtained.3. REQUIREMENTS3.1 Item requirements. The individual item requirements shall be in accordance with
16、MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified ManufacturerListing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be
17、processed as QML product in accordance with the manufacturers approved program plan and qualifyingactivity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) planmay make modifications to the requirements herein. These modifications shall not affect
18、 form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, constru
19、ction, and physical dimensions shall be asspecified in MIL-PRF-38535, appendix A and herein.3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.3.2.2 Truth table. The truth table shall be as specified on figure 2.3.2.3 Functional diagram. The functional diagram sha
20、ll be as specified on figure 3.3.2.4 Case outline. The case outline shall be in accordance with 1.2.2 herein.3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics areas specified in table I and shall apply over the full ambient oper
21、ating temperature range.3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electricaltests for each subgroup are described in table I.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST
22、ANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET4DSCC FORM 2234APR 973.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PINlisted in 1.2 herein. In addition, the manufacture
23、rs PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). Forpackages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has theoption of not marking the “5962-“ on the device.3.5.1 Certification/compliance mark. A compliance indicator “
24、C” shall be marked on all non-JAN devices built in complianceto MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark inaccordance with MIL-PRF-38535 to identify when the QML flow option is used.3.6 Certificate of compliance. A certificate o
25、f compliance shall be required from a manufacturer in order to be listed as anapproved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior tolisting as an approved source of supply shall affirm that the manufacturers product meets the requireme
26、nts of MIL-PRF-38535, appendix A and the requirements herein.3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be providedwith each lot of microcircuits delivered to this drawing.3.8 Notification of change. Notification of change to DSCC-VA s
27、hall be required in accordance with MIL-PRF-38535,appendix A.3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturersfacility and applicable required documentation. Offshore documentation shall be made available onshore at the option of
28、 thereviewer.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,appendix A.4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devicesprior to quality conf
29、ormance inspection. The following additional criteria shall apply:a. Burn-in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to the preparing or acquiring acti
30、vity upon request. The test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified intest method 1015 of MIL-STD-883.(2) TA = +125G02C, minimum.b. Interim and final electrical test parameters shall be as specified in table II h
31、erein, except interim electrical parametertests prior to burn-in are optional at the discretion of the manufacturer.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHI
32、O 43216-5000REVISION LEVELASHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics.Test SymbolConditions-55G02C G05 TA G05+125G02CVOUT1 = VOUT2 = 0 VVDD = +5 V;VREF = G0110 Vunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxRelative accuracy INL 1, 2, 3 01 G010.
33、25 LSB02 G010.50DifferentialnonlinearityDNL 1, 2, 3 01 G010.50 LSB02 G011.0Gain error GFSE1, 2, 3 All G011.0 LSBDC power supplyrejection DDVGainG06G061/PSRR 1, 2, 3 All 0.001%Output leakagecurrent 2/ILKG 1Al G0130 nA2, 3 G01100Input resistance RREF1, 2, 3 All 6 14 kG04Input resistancematchG06RREF Me
34、asuring at VREFA, B, C, Dpins1, 2, 3 All G011.0 %Digital input high VIH1, 2, 3 All 2.4 VDigital input low VIL1, 2, 3 All 0.8 VInput current IIN VIN = 0 V or VDD1Al G011.0 G07A2, 3 G0110.0Digital output low VOL ISINK = 1.6 mA1, 2, 3 All 0.4 VDigital output high VOH ISOURCE = 400 G07A1, 2, 3 All 4 VDi
35、gital inputs = VIL or VIH 1.0Supply current IDDDigital inputs = 0 V or VDD1Al0.05mADigital inputs = VIL or VIH 1.5Digital inputs = 0 V or VDD2, 30.05Input capacitance CINSee 4.3.1c 4 All 8 pFFunctional test See 4.3.1d 7, 8 AllWrite to data strobetime 4/tDS1ortDS23/ 9, 10, 11 All 90 nsData valid to s
36、trobeset-up time 4/tDSU 3/ 9, 10, 11 All 150 nsData valid to strobehold time tDH 3/ 9 All 10 ns10, 114/10See footnotes at end of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER CO
37、LUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET6DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics - Continued.Test SymbolConditions-55G02C G05 TA G05+125G02CVOUT1 = VOUT2 = 0 VVDD = +5 V;VREF = G0110 Vunless otherwise specifiedGroup AsubgroupsDevicetypeLimits UnitMin MaxDAC sel
38、ect to strobeset-up timetAS 3/ 9Al0 ns10, 114/0DAC select to strobehold timetAH 3/ 9Al0 ns10, 114/0Write select to strobeset-up timetWSU 3/ 9Al0 ns10, 114/0Write select to strobehold timetWH 3/ 9Al0 ns10, 114/0Read to data strobewidthtRDS 3/ 9 All 220 ns10, 114/350Data strobe to outputvalid timetC0
39、3/ 9 All 320 ns10, 114/430Output data todeselect timet0TD 3/ 9 All 200 ns10, 114/270Read select to strobesetup timetRSU 3/ 9Al0 ns10, 114/0Read select to strobehold timetRH 3/ 9Al0 ns10, 114/01/ G06VDD = G0110%.2/ All digital inputs = 0 V.3/ See figure 4.4/ Subgroups 10 and 11, if not tested, shall
40、be guaranteed to the limits specified in table I.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET7DSCC FORM 2234APR 97Device type 01
41、 and 02Case outline XTerminal number Terminal symbol1 VDD2 VREFA3 RFBA4 IOUT1A5 OUT2BOUT2A I I6 IOUT1B7 RFBB8 VREFB9 DB0(LSB)10 DB111 DB212 DB313 DB414 DB515 DB616 DB7(LSB)17B A 18W R19DS120DS221 VREFD22 RFBD23 IOUT1D24 OUT2DOUT2C I I25 IOUT1C26 RFBC27 VREFC28 DGNDFIGURE 1. Terminal connections.Prov
42、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET8DSCC FORM 2234APR 97CONTROL LOGICDS1 DS2 B A W RMODE DACLH H LWRITE AL BHL H LWRITE CL
43、DL H H H READ AL H L H READ BH L H H READ CH L L H READ DL L H L WRITE A & CL L L L WRITE B & DH H X X HOLD A/B/C/DL L H H HOLD A/B/C/DL L L H HOLD A/B/C/DL = LowH = HighX = Dont careFIGURE 2. Truth table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
44、-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET9DSCC FORM 2234APR 97FIGURE 3. Functional diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZ
45、EA5962-89678DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET10DSCC FORM 2234APR 97FIGURE 4. Timing diagram.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA5962-89678DEFENSE SUPPLY CENTER COL
46、UMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELASHEET11DSCC FORM 2234APR 97TABLE II. Electrical test requirements.MIL-STD-883 test requirements Subgroups(in accordance withMIL-STD-883, method 5005,table I)Interim electrical parameters(method 5004)1Final electrical test parameters(method 5004)1*, 2, 3,
47、7, 8Group A test requirements(method 5005)1, 2, 3, 4, 7, 8, 9, 10*, 11*Groups C and D end-pointelectrical parameters(method 5005)1* PDA applies to subgroup 1.* Subgroups 10, and 11, if not tested shall beguaranteed to the limits specified in table I herein.4.3 Quality conformance inspection. Quality
48、 conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply.4.3.1 Group A inspection.a. Tests shall be as specified in table II herein.b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.c. Subgroup 4 (CIN measurement) shall be measured only for the initial test and after process or design changes whichmay affect input capacitance.d. Subgroups 7 and 8 shall include verification of the truth table.4.3.2 Groups C and D inspections.a. End-point electrical
