1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Correct and add notes to figure 4, switching waveforms and test circuit. Update the boilerplate to current requirements as specified in MIL-PRF-38535. Editorial changes throughout jak. 05-10-03 Thomas M. Hess B Update test condition of high and l
2、ow level voltage to table I. Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 12-01-19 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Marcia B. Kelleher DLA LAND AND MARITIME COLUMBUS,
3、 OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Ray Monnin APPROVED BY Michael A. Frye MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL RETRIGGERABLE MONOST
4、ABLE MULTIVIBRATOR WITH RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON DRAWING APPROVAL DATE 89-07-24 REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89700 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E105-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-
5、,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38
6、535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89700 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function as follows: D
7、evice type Generic number Circuit function 01 54HCT123 Dual retriggerable monostable multivibrator with reset, TTL compatible inputs 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16
8、or CDIP2-T16 16 Dual-in-line 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +7.0 V dc DC input voltage range (VIN) -0.5 V dc to VCC + 0.5 V dc DC output voltage range (VOUT) . -0.5 V dc t
9、o VCC+ 0.5 V dc Clamp diode current (IIK, IOK) . 20 mA DC output current (per pin) (IOUT) . 20 mA DC drain current (per pin) (IDRAIN) 25 mA DC VCCor GND current (per pin) (ICC, IGND) . 50 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) 500 mW 4/ Lead temperature (s
10、oldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +175C 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/
11、 Unless otherwise specified, all voltages are referenced to ground. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ For TC= +100C to +125C, derate linearly at 8 mW/C. Provided by IHSNot for ResaleNo reprod
12、uction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.4 Recommended operating conditions. Supply voltage range (VCC) +4.5 V dc to +5.5 V dc Case oper
13、ating temperature range (TC) . -55C to +125C Input rise or fall time (tr, tf): VCC= 4.5 V (R). 0 to 500 ns VCC= 4.5 V (B and A) 0 to unlimited ns Minimum input pulse width (A, B, R) (tw): TC= +25C, VCC= 4.5 V . 20 ns TC= -55C to +125C VCC= 4.5 V 30 ns Minimum reset removal time (trem): TC= +25C, VCC
14、= 4.5 V . 10 ns TC= -55C to +125C VCC= 4.5 V 15 ns Minimum hold time (A and B) (th): TC= +25C, VCC= 4.5 V . 10 ns TC= -55C to +125C VCC= 4.5 V 15 ns Minimum retrigger time, VCC= 5.0 V, RX= 10 k (trt) 76 ns 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The followi
15、ng specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, Ge
16、neral Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit
17、 Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) form a part of this documen
18、t to the extent specified herein. Unless otherwise specified, the issues of these documents cited in the solicitation or contract. JEDEC SOLID STATE TECHNOLOGY ASSOCIATION (JEDEC) JEDEC Standard No. 7 - Standard for Description of 54/74HCXXXXX and 54/74HCTXXXXX Advanced High-Speed CMOS Devices. (Cop
19、ies of these documents are available online at http:/www.jedec.org or from JEDEC Solid State Technology Association, 3103 North 10thStreet, Suite 240-S Arlington, VA 22201). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
20、 of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 5/ Time to trigger depends on the values of RXand CX. The output pulse width can only be extended when the time between the active going edg
21、es of the trigger input pulses meet the minimum retrigger time requirements. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC
22、 FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certifie
23、d and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in
24、 the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is requ
25、ired to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.
26、2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and
27、test circuit shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The
28、electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufac
29、turers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN de
30、vices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required fr
31、om a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PR
32、F-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Mariti
33、me -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall b
34、e made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TAB
35、LE I. Electrical performance characteristics. Test Symbol Test conditions 1/ -55C TC +125C unless otherwise specified VCCGroup A subgroups Limits Unit Min Max High level output voltage VOHVIN= VIH= 2.0 V or VIL= 0.8 V IOH= -20 A 4.5 V 1, 2, 3 4.4 V IOH= -4 mA 3.7 Low level output voltage VOLVIN= VIH
36、= 2.0 V or VIL= 0.8 V IOL= +20 A 4.5 V 1, 2, 3 0.1 V IOL= +4 mA 0.4 High level input voltage VIH2/ 4.5 V 1, 2, 3 2.0 V Low level input voltage VIL2/ 4.5 V 1, 2, 3 0.8 V Input capacitance CINTC= +25C, VIN= 0 V, see 4.3.1c 4 10 pF Quiescent supply current ICCVIN= VCCor GND, IOUT= 0.0 A 5.5 V 1, 2, 3 1
37、60 A Input leakage current IINVIN= VCCor GND 5.5 V 1, 2, 3 1 A Functional tests See 4.3.1d 7, 8 Additional quiescent supply current ICCAny one input, VIN = 2.4 V Other inputs, VIN= VCCor GND IOUT= 0.0 A 5.5 V 1, 2, 3 490 A Output pulse width, Q or Q twQRX= 10 k, CX= 10 nF 4.5 V 9 40 s 10, 11 38.2 Tr
38、igger propagation delay time, A, B, R to Q tPLH1CL= 50 pF tr, tf= 6 ns RX= 10 k, CX= 0.0 nF See figure 4 4.5 V 9 60 ns 10, 11 90 Trigger propagation delay time, A, B, R, to Q tPHL24.5 V 9 64 ns 10, 11 102 Reset propagation delay time, R to Q or Q tPHL3, tPLH34.5 V 9 48 ns 10, 11 72 Output transition
39、 time tTLH, tTHL3/ 4.5 V 9 15 ns 10, 11 22 1/ For power supply of 5 V 10 percent, the worst case output voltage (VOHand VOL) occur for HCT at 4.5 V. Thus, the 4.5 V values should be used when designing with this supply. Worst case VIHand VILoccur at VCC= 5.5 V and 4.5 V, respectively. 2/ VIHand VILt
40、ests are not required and shall be applied as forcing functions for VOHor VOLtests. 3/ Transition times (tTLH, tTHL), if not tested, shall be guaranteed to the specified limits in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
41、OCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 Device type 01 Case outline E Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 1A 1B 1R 1Q 2Q 2CX2RXCXGND 2A 2B 2R 2Q 1Q 1CX1RXCX VCCFIGURE 1. Termi
42、nal connections. Inputs Outputs A B R Q Q H X H L H X L H L H L H H H X X L L H L H L = Low voltage level H = High voltage level X = Irrelevant = One low level pulse = One high level pulse = Transition of the clock from low to high = Transition of the clock from high to low FIGURE 2. Truth table. Pr
43、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo repr
44、oduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 FIGURE 4. Switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or
45、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 NOTES: Input signal from pulse generator: VIN= 0.0 V to 3.0 V; PRR 1 MHz; ZO= 50; tr = 6.0 ns; tf= 6.0 ns;
46、 trand tfshall be measured from 0.3 V to 2.7 V and from 2.7 V to 0.3 V, respectively; duty cycle = 50 percent. The outputs are measured one at a time with one transition per measurement. FIGURE 4. Switching waveforms and test circuit Continued. Provided by IHSNot for ResaleNo reproduction or network
47、ing permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89700 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-P
48、RF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request.
