1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements . Editorial changes throughout. - gap 10-02-10 Charles F. Saffle The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6
2、 7 8 9 10 11 PMIC N/A PREPARED BY Tim H. Noh DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Tim H. Noh APPROVED BY William K. Heckm
3、an MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY, TTL, OCTAL 30-OHM TRANSMISSION LINE DRIVER/BACKPLANE TRANSCEIVERS NINV, (OPEN COLLECTOR WITH ENABLE WITH THREE STATE), MONOLITHIC SILICON DRAWING APPROVAL DATE 89-08-11 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-89722 SHEET 1 OF 11 DSCC FORM 22
4、33 APR 97 5962-E487-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This dr
5、awing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89722 01 K X Drawing number Device type (see 1.2.1) Case
6、outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54F30245 Octal 30 transmission line/backplane transceivers, noninverting (open collector with enable with three state) 1.2.2 Case
7、 outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style K GDFP2-F24 or CDFP3-F24 24 dual-in-line package L GDIP3-T24 or CDIP4-T24 24 flat package 3 CQCC1-N28 28 square chip carrier 1.2.3 Lead finish. The lead fi
8、nish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range -0.5 V dc minimum to +7.0 V dc maximum Input voltage range . -0.5 V dc to +7.0 V dc Input current range -30 mA to +5.0 mA Voltage applied to output in HIGH output state . -0.5 V to +VCCCurrent appli
9、ed to output in LOW output state: B0-B7 +260 mA A0-A7 40 mA Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Maximum power dissipation (PD) 1/ . +743 mW Junction temperature (TJ) . +150C 1.4 Recommen
10、ded operating conditions. Minimum high level input voltage (VIH) 2.0 V dc Case operating temperature range (TC) -55C to +125C Maximum low level input voltage (VIL) . 0.8 V dc Supply voltage (VCC) . +4.5 V dc minimum to +5.5 V dc maximum _ 1/ Maximum power dissipation is defined as VCCx ICC, and must
11、 withstand the added PDdue to short circuit test; e.g., IOS. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2
12、234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation o
13、r contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE
14、 HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia,
15、PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained
16、. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified
17、manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Man
18、agement (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify
19、 when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal conne
20、ctions. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. Test circuit and switching waveforms shall be as specified on figure 3. 3.3 Electrical performance characteristics. Un
21、less otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical test
22、s for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3.5
23、Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacture
24、r has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in
25、 accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitte
26、d to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be pr
27、ovided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufa
28、cturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screenin
29、g shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained
30、by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-S
31、TD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitte
32、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Grou
33、p A subgroups Limits Unit Min Max High level output current B0-B7 IOHVCC= 4.5 V, VIL= 0.8 V VIH= 2.0 V, VOH= 4.5 V 1, 2, 3 250 A High level output voltage A0-A7, R/Tnull, OEnullnullnullnullnullVOHVCC= 4.5 V, VIL= 0.8 V, VIH= 2.0 V IOH= -3 mA 1, 2, 3 2.4 V IOL= -1 mA 2.5 Low level output voltage VOLV
34、CC= 4.5 V, VIL= 0.8 V, VIH= 2.0 V IOL= 20 mA A0-A7, R/Tnull, OEnullnullnullnullnull1, 2, 3 .50 V IOL= 100 mA B0-B7 .50 IOL= 130 mA 1/ .80 Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA 1, 2, 3 -1.2 V High level input current IIH1VCC= 5.5 V, VIN= 2.7 V R/Tnull, OEnullnullnullnullnull1, 2, 3 20 A B0-B
35、7 70 IIH2 VCC= 0.0 V, VIN= 7.0 V R/Tnull, OEnullnullnullnullnull100 CC= 5.5 V, VIN= 5.5 V An, Bn 1.0 mA Low level input current IILVCC= 5.5 V, VIN= 0.5 V R/Tnull, OEnullnullnullnullnull1, 2, 3 -20 A B0-B7 -600 Off state output current IOZHVCC= 5.5 V, VOUT= 2.7 V 1, 2, 3 70 A IOZLVCC= 5.5 V, VOUT= 0.
36、5 V -70 Short circuit output current IOSVCC= 5.5 V 2/ 1, 2, 3 -60 -150 mA Supply current ICCHVCC= 5.5 V 1, 2, 3 70 mA ICCL135 ICCZ75 Functional test See 4.3.1c 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA
37、RD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Limits Unit
38、 Min Max Propagation delay time, An to Bn tPLH1RL= 500 5% CL= 50 pF 10% See figure 3 VCC= 5.0 V 9 7.5 13.5 ns VCC= 4.5 V to 5.5 V 10, 11 7.0 13.5 tPHL1VCC= 5.0 V 9 3.0 8.5 VCC= 4.5 V to 5.5 V 10, 11 3.0 9.5 Propagation delay time, Bn to An tPLH2VCC= 5.0 V 9 2.0 6.5 ns VCC= 4.5 V to 5.5 V 10, 11 1.5
39、7.0 tPHL2VCC= 5.0 V 9 1.0 5.5 VCC= 4.5 V to 5.5 V 10, 11 1.0 5.5 Propagation delay time, OEnullnullnullnullnullto Bn tPLH3VCC= 5.0 V 9 7.0 12.5 ns VCC= 4.5 V to 5.5 V 10, 11 7.0 13.0 tPHL3VCC= 5.0 V 9 3.5 8.5 VCC= 4.5 V to 5.5 V 10, 11 3.5 9.5 Output enable time, OEnullnullnullnullnullto An tPZHVCC=
40、 5.0 V 9 2.5 7.5 ns VCC= 4.5 V to 5.5 V 10, 11 2.0 8.5 tPZLVCC= 5.0 V 9 2.0 8.0 VCC= 4.5 V to 5.5 V 10, 11 1.5 8.5 Output disable time, OEnullnullnullnullnullto An tPHZVCC= 5.0 V 9 1.5 6.5 ns VCC= 4.5 V to 5.5 V 10, 11 1.0 7.5 tPLZVCC= 5.0 V 9 1.0 6.5 VCC= 4.5 V to 5.5 V 10, 11 1.0 7.0 1/ IOLis the
41、current necessary to guarantee the high to low transition in a 30 transmission line on the incident wave. 2/ Not more than one output should be shorted at a time, and the duration of the short circuit condition should not exceed 1 second. Provided by IHSNot for ResaleNo reproduction or networking pe
42、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outlines L and K 3 Terminal number Terminal symbols 1 B0 NC 2 B1 B0 3 B2 B1 4 B3 B2 5 GND B3 6 GND GND 7 G
43、ND GND Inputs Intputs/outputs 8 GND NC OEnullnullnullnullnullR/TnullAn Bn 9 B4 GND L H A = B inputs 10 B5 GND L L inputs B = A 11 B6 B4 H X Z Z 12 B7 B5 H = High level voltage 13 A7 B6 L = Low level voltage 14 A6 B7 X = Irrelevant 15 A5 NC Z = High impedence 16 A4 A7 17 OEnullnullnullnullnullA6 FIGU
44、RE 2. Truth table. 18 VCCA5 19 VCCA4 20 R/TnullOEnullnullnullnullnull21 A3 VCC22 A2 NC 23 A1 VCC24 A0 R/Tnull25 A3 26 A2 27 A1 28 A0 FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A
45、5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Test Switch tPLZClosed tPZLClosed All others Open FIGURE 3. Test circuit and switching waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
46、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 NOTES: 1. CLincludes probe and jig capacitance. 2. RT= Termination resistance should be equal to ZOUTof pulse generators. 3. VX= Unclocke
47、d pins must be held at 0.8 V, 2.7 V or open. 4. All input pulses have the following characteristics: PRR = 1 MHz, tr= tf= 2.5 ns, duty cycle = 50%. 5. When measuring propagation delay times of three-state outputs, switch 1 is open. 6. The outputs are measured one at a time with one input transition
48、per measurement. FIGURE 3. Test circuit and switching waveforms - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89722 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical paramete
