1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added device type 02 and vendor cage 51651. Redrew entire document. 94-09-01 K. A. Cottongim B Made changes to table I. Made corrections to figure 1, terminal connections. 99-02-18 K. A. Cottongim C Update drawing to the latest requirements. -sld
2、 05-11-04 Raymond Monnin D 1.3: Supply voltage (VCC) change 20 V dc to 18 V dc. Differential input voltage for device type 02 change VCCto 6 V dc. Table I: Input bias current for device type 02, change subgroup 1 min/max limits from 5 A to 8 A, change subgroups 2 and 3 min/max limits from 10 A to 12
3、 A. Power supply rejection ratio, conditions column, change +VCC +20 V dc to +VCC +18 V dc and -VCC -20 V dc to -VCC -18 V dc. -gz 08-06-02 Robert M. Heber THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8
4、9 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Robert M. Heber COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil/ APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, FAST SETTLING, WIDEBAND, OPERATIONAL AMPLIFIER THIS DRAWING IS AV
5、AILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-08-20 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-89813 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E340-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license
6、 from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to be processed in accordance with MIL
7、-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). 1.2 PIN. The PIN shall be as shown in the following example: 5962-89813 01 G C Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1
8、.2.1 Device type(s). The device type(s) shall identify the circuit function as follows: Device type Generic number Circuit function 01 HC1437, MSK 437B Wideband operational amplifier 02 MSK 438B Wideband operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-18
9、35 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can 3 CQCC1-N28 28 Leadless chip carrier 1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VCC). 18 V dc Differential input voltage:
10、 Device type 01 . VCCDevice type 02 . 6 V dc Common mode input voltage (VCM) VCC Power dissipation (PD) 500 mW 2/ Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC): Case G. 200C/W Case 3 . 75C/W Lead temperature (soldering, 10 seconds). +300C Storage temperature range -65C
11、to +150C 1.4 Recommended operating conditions. Supply voltage (VCC). 15 V dc Ambient operating temperature range (TA). -55C to +125C 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect re
12、liability. 2/ TC=+25C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1
13、 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPEC
14、IFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcir
15、cuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the even
16、t of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individ
17、ual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for applicable device class. The ma
18、nufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the
19、 applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal
20、connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements.
21、The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In add
22、ition, the manufacturers vendor similar PIN may also be marked. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FOR
23、M 2234 APR 97 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed her
24、ein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate
25、 of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Cer
26、tificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in t
27、he device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Preseal burn-in test, method 10
28、30 of MIL-STD-883. (optional for class H) (1) Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, o
29、utputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1030 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit sh
30、all be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent spec
31、ified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the
32、 manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance cha
33、racteristics. Limits Test Symbol Conditions -55C TC +125C VCC= 15 V dc unless otherwise specified Group A subgroups Device type Min Max Unit Input offset voltage VIOTA= +25C, no external trim resistor 1 All -2 +2 mV Input offset voltage drift 1/ DVIO DT RL= infinity, TA= -55C and +125C 2,3 All -50 +
34、50 V/C 1 -200 +200 pA 2,3 01 -200 +200 nA 1 -8 +8 Input bias current IIB2,3 02 -12 +12 A 1 -100 +100 pA 2,3 01 -100 +100 nA 1 -2.5 +2.5 Input offset current IIO2,3 02 -5 +5 A 1 -200 +200 +PSRR +15 V dc +VCC +18 V dc, -VCC= -15 V dc 2,3 All -400 +400 V/V 1 -200 +200 Power supply rejection ratio 1/ -P
35、SRR -15 V dc -VCC -18 V dc, +VCC= +15 V dc 2,3 All -400 +400 V/V 4 60 Common mode rejection ratio 1/ CMRR VCM= 10 V dc, f = 10 Hz 5,6 All 40 dB 01 -15 +15 Supply current ICC VCM= 0 V, no load 1,2,3 02 -17 +17 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networkin
36、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TC +125C VC
37、C= 15 V dc unless otherwise specified Group A subgroups Device type Min Max Unit IO= 0.020 A(peak), RL= 500 4 10 Output voltage (peak) VOPRL= 1 k 5,6 2/ All 10 V RL= 500 4 All 20 Output current (peak) IOPRL= 1 k, VOUT= 10 V 5,6 2/ All 10 mA 4 All 88 Voltage gain 1/ AVSRL= 1 k, f = 10 Hz 5,6 2/ 60 dB
38、 RL= 1 k, TA= +25C 4 01 200 Slew rate SR RL= 1 k, TA= +25C 3/ 4 02 200 V/s 1/ Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 2/ Subgroups 5 and 6 shall be tested as part of device initial characterization and after design and process changes. P
39、arameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 3/ Device type 02 is tested at a gain of 2 V/V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFE
40、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Device types 01and 02 01 (only) Case outlines G 3 Terminal number Terminal symbol 1/ 1 2 3 4 5 6 7 8 2/ 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 2/ 26 27 28 Offset trim Inverting input Noninv
41、erting input -VCCOffset trim Output +VCCCompensation - - - - - - - - - - - - - - - - - - - - NC NC NC Inverting input NC Noninverting input NC Offset trim NC -VCCNC NC NC NC NC NC NC Output NC NC +VCCNC NC NC Compensation NC Offset trim NC 1/. NC is no internal connection. 2/. Device types supplied
42、by CAGE code 51651, pins 8 and 25 are NC. The amplifier is unity gain stable without external compensation. FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89813 DEFENSE SUPPLY
43、 CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4,
44、5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic insp
45、ection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group
46、 B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method
47、 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biase
48、s, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) ins
