1、REVISIONSLTR DESCRIPTION DATE (YR -MO -DA) APPROVEDA Changes made in accodance with NOR 5962-R073-93. 93-01-25 Kendall A. CottongimB Changes made in accordance with NOR 5962-R245-97. 97-03-13 Kendall A. CottongimC Added vendor cage 1HBD3. Removed vendor cage 62839. Madecorrections to table I. Editor
2、ial changes throughout. -sld00-06-06 Raymond MonninREVSHEETREVSHEETREV STATUS REV C C C C C C C C C C C COF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUSSTANDARDMICROCIRCUIT DRAWINGCHECKED BYRobert M. HeberCOLUMBUS, OHIO 43216THIS DRAWING ISAVAI
3、LABLEFOR USE BY ALLDEPARTMENTSAPPROVED BYW illiam K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGHSPEED, WIDEBAND, OPERATIONALAMPLIFIERAND AGENCIES OF THEDEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-04-11AMSC N/A REVISION LEVELCSIZEACAGE CODE67268 5962-89911SHEET 1 OF 12DSCC FORM 2233APR 97 5962 -E31
4、5 -00DISTRIBUTION STATEMENT A . Approved for public release; distribution is unlimited.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCS
5、HEET2DSCC FORM 2234APR 971. SCOPE1.1 Scope . This drawing documents one product assurance class, class H (high reliability) and a choice of case outlines andlead finishes are available and are reflected in the Part or Identifying Number (PIN).1.2 PIN . The PIN shall be as shown in the following exam
6、ple:5962 - 89911 01 X X Drawing number Device Case Leadtype outline finish(see 1.2.1) (see 1.2.2) (see 1.2.3)1.2.1 Device type(s) . The device type(s) identify the circuit function as follows:Device type Generic number 1 / Circuit function01 CLC220A, KH220A High speed, wideband, operational amplifie
7、r1.2.2 Case outline(s) . The case outline(s) are as designated in MIL-STD-1835 and as follows:Outline letter Descriptive designator Terminals Package styleX See figure 1 12 Can package1.2.3 Lead finish . The lead finish shall be as specified in MIL-PRF-38534.1.3 Absolute maximum ratings . 2 /Supply
8、voltage ( V CC ) 20 V dcOutput current . 50 mAStorage temperature range -65 C to +150 CLead temperature (soldering, 10 seconds) +300 CJunction temperature (T J ) +175 CPower dissipation (P D ) 3 /Thermal resistance, case-to-ambient ( CA ) 65 C/W 4 /Thermal resistance, junction-to-case:JC (circuit) 3
9、7 C/W 5 /JC (output) . 200 C/W 6 /1 / The CLC220A is not available from an approved source of supply.2 / Stresses above the absolute maximum ratings may cause permanent damage to the devic e. Extended operation at themaximum levels may degrade performance and affect reliability.3 / The power dissipa
10、tion can be determined based on the application and junction temperature verified to T J +175 C andusing the thermal resistance values given.4 / Still air, no heat sink.5 / Thermal resistance of circuit; P CIRCUIT = 2(V CC ) I CC .6 / Thermal resistance of output transistors; P OUTPUT = V CE (I E )
11、x (% duty cycle).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET3DSCC FORM 2234APR 971.4 Recommended operating conditions .Supply
12、voltage range 5 V dc to 15 V dcGain range 1 to 50Ambient operating temperature range (T A ) . -55 C to +125 C2. APPLICABLE DOCUMENTS2.1 Government specification, standards, and handbooks . The following specification, standards, and handbooks form a part ofthis drawing to the extent specified herein
13、. Unless otherwise specified, the issues of these documents are those listed in the issueof the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation.SPECIFICATIONDEPARTMENT OF DEFENSEMIL-PRF-38534 - Hybrid Microcircuits, General Specifi
14、cation for.STANDARDSDEPARTMENT OF DEFENSEMIL-STD-883 - Test Method Standard Microcircuits.MIL-STD-1835 - Interface Standard for Microcircuit Case Outlines.HANDBOOKSDEPARTMENT OF DEFENSEMIL-HDBK-103 - List of Standard Microcircuit Drawings (SMDs).MIL-HDBK-780 - Standard Microcircuit Drawings.(Unless
15、otherwise indicated, copies of the specification, standards, and handbook are available from the StandardizationDocument Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)2.2 Order of precedence . In the event of a conflict between the text of this drawing and the references
16、cited herein, the text ofthis drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specificexemption has been obtained.3. REQUIREMENTS3.1 Item requirements . The individual item performance requirements for device class H shall be in accord
17、ance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the devicemanufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests andinspections herein may not be performed for the ap
18、plicable device class (see MIL-PRF-38534). Furthermore, the manufacturermay take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, theperformance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. 3.2 Design, co
19、nstruction, and physical dimensions . The design, construction, and physical dimensions shall be as specified inMIL-PRF-38534 and herein.3.2.1 Case outline(s) . The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.3.2.2 Terminal connections . The terminal connections shall be as
20、 specified on figure 2.3.3 Electrical performance characteristics . Unless otherwise specified herein, the electrical performance characteristics are asspecified in table I and shall apply over the full specified operating temperature range.Provided by IHSNot for ResaleNo reproduction or networking
21、permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET4DSCC FORM 2234APR 973.4 Electrical test requirements . The electrical test requirements shall be the subgroups specified in table II. The ele
22、ctrical testsfor each subgroup are defined in table I.3.5 Marking of Device(s) . Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked withthe PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked.3.6 Data . In addition to
23、 the general performance requirements of MIL-PRF-38534, the manufacturer of the device describedherein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, foreach device type listed herein. Also, the data should include a sum
24、mary of all parameters manually tested, and for those which, ifany, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be madeavailable to the preparing activity (DSCC-VA) upon request.3.7 Certificate of compliance . A certificate of complianc
25、e shall be required from a manufacturer in order to supply to this drawing.The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets theperformance requirements of MIL-PRF-38534 and herein.3.8 Certificate of conformance . A certificate of co
26、nformance as required in MIL-PRF-38534 shall be provided with each lot ofmicrocircuits delivered to this drawing.4. QUALITY ASSURANCE PROVISIONS4.1 Sampling and inspection . Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modifiedin the device manufacturers Quality
27、 Management (QM) plan. The modification in the QM plan shall not affect the form, fit, orfunction as described herein.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS,
28、OHIO 43216-5000REVISION LEVELCSHEET5DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics .LimitsTest Symbol Conditions 1 /-55 C T A +125 Cunless otherwise specifiedGroup AsubgroupsDevicetypeMin MaxUnit4 1705 150Small signal bandwidth(-3 dB bandwidth)SSBW V OUT 50 MHz6011.5dB4 0.65 0.9
29、Gain flatness rolloff GFR f = 100 MHz6010.4dBLinear phase deviation 2 / LPD f 5.0 MHz 7, 8A,8B 01 -150 dBM (1 Hz)Intergrated noise 2 / INV f = 5.0 MHz to 200 MHz 7, 8A,8B 01 100 VInput offset voltage V IO 1, 2, 3 01 25 mVInput offset voltage 2 /temperature coeffecientV IOT1, 2, 3 01 120 V/ C1 30+ In
30、put bias current +I IB2, 30140A+ Input bias current 2 /temperature coeffecient+I IBT1, 2, 3 01 125 nA/ C1 50- Input bias current -I IB2, 30170A- Input bias current 2 /temperature coeffecient-I IBT1, 2, 3 01 250 nA/ CPower supply rejection ratio PSRR V CC = 0.5 V 1, 2, 3 01 45 dBSee footnotes at end
31、of table.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET7DSCC FORM 2234APR 97TABLE I. Electrical performance characteristics - Con
32、tinued.LimitsTest Symbol Conditions 1 /-55 C T A +125 Cunless otherwise specifiedGroup AsubgroupsDevicetypeMin MaxUnit1 34Supply current I CC No load2, 30136mACommon mode rejection 2 /ratioCMRR 4, 5, 6 01 40 dB1 / Unless otherwise specified, R L = 200 ohms, R F = 1500 ohms, V CC = 15 V, A V = +20.2
33、/ Parameter shall be tested as part of device initial characterization and after design and process changes which mayaffect this parameter. Parameter shall be guaranteed to the limits specified in tabl e I for all lots not specifically tested.3 / dBc is a standard reference for a signal referenced t
34、o a carrier signal level.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET8DSCC FORM 2234APR 97FIGURE 1. Case outline .Provided by I
35、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET9DSCC FORM 2234APR 97Symbol Inches Millimeters NotesMin Max Min MaxA .148 .181 3.76 4.60b .016 .
36、019 0.41 0.48D .595 .608 15.11 15.44D 1 .545 .555 13.84 14.10e .400 BSC 10.16 BSC 5e 1 .200 BSC 5.08 BSC 5e 2 .100 BSC 2.54 BSC 5F .030 0.76k .026 .036 0.66 0.91k 1 .026 .036 0.66 0.91 4L .310 .340 7.87 8.64 45 BSC 45 BSC 5NOTES:1. Dimensions are in inches.2. Metric equivalents are given for general
37、 inf ormation only.3. The produc t may be measured by direct methods or by gauge.4. Measured from the maximum diameter of the product.5. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) +.001 (0.03 mm),-.000 (0.00 mm) below the base plane of t he product shall
38、be within .007 (0.18 mm) of their true position relativeto a maximum width tab.FIGURE 1. Case outline - Continued.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO
39、 43216-5000REVISION LEVELCSHEET10DSCC FORM 2234APR 97Device type 01Case outline XTerminal number Terminal symbol1 +V CC (supply voltage)2 Bias control3 GND (case and bias)4 No connection5 -V IN6 +V IN7 GND (case and bias)8 R f ( internal feedback)9 -V CC (supply voltage)10 -V C (collector supply)11
40、V OUT12 +V C (collector supply)NOTE: Pin 8 provides acces s to a 2 k feedback resistorwhich can be connected to the output or left openif an external feedback resistor is desired.FIGURE 2. Terminal connections .Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
41、 IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET11DSCC FORM 2234APR 97TABLE II. Electrical test requirements .MIL-PRF-38534 test requirements Subgroups(in accordance withMIL-PRF-38534, group A testtable)Interim electrica
42、l parameters 1Final electrical parameters 1*, 2, 3, 4, 7Group A test requirements 1, 2, 3, 4, 5, 6, 7, 8A, 8BGroup C end-point electricalparameters1* PDA applies to subgroup 1. 4.2 Screening . Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:a. Burn-
43、in test, method 1015 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shallspecify the inputs, ou
44、tputs, biases, and power dissipation, as applicable, in accordance with the intent specified in testmethod 1015 of MIL-STD-883.(2) T A as specified in accordance with table I of method 1015 of MIL-STD-883.b. Interim and final electrical test parameters shall be as specifie d in table II herein, exce
45、pt interim electrical parameter testsprior to burn -in are optional at the discretion of the manufacturer.4.3 Conformance and periodic inspections . Conformance inspection (CI) and periodic inspection (PI) shall be in accordancewith MIL-PRF-38534 and as specified herein.4.3.1 Group A inspection (CI)
46、 . Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:a. Tests shall be as specified in table II herein.b. Subgroups 9, 10, and 11 shall be omit ted.4.3.2 Group B inspection (PI) . Group B inspection shall be in accordance with MIL-PRF-38534.Provided by IHSNot for ResaleNo r
47、eproduction or networking permitted without license from IHS-,-,-STANDARDMICROCIRCUIT DRAWINGSIZEA 5962-89911DEFENSE SUPPLY CENTER COLUMBUSCOLUMBUS, OHIO 43216-5000REVISION LEVELCSHEET12DSCC FORM 2234APR 974.3.3 Group C inspection (PI) . Group C inspection shall be in accordance with MIL-PRF-38534 a
48、nd as follows:a. End-point electrical parameters shall be as specified in table II herein.b. Steady-state life test, method 1005 of MIL-STD-883.(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision levelcontrol and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shallspecify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with th
