DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

上传人:lawfemale396 文档编号:699708 上传时间:2019-01-01 格式:PDF 页数:10 大小:95.06KB
下载 相关 举报
DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf_第1页
第1页 / 共10页
DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf_第2页
第2页 / 共10页
DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf_第3页
第3页 / 共10页
DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf_第4页
第4页 / 共10页
DLA SMD-5962-89969 REV B-2008 MICROCIRCUIT LINEAR SINGLE SUPPLY QUAD OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf_第5页
第5页 / 共10页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R053-91. 91-11-15 M. A. FRYE B Update drawing as part of 5 year review. -rrp 08-10-15 R. HEBER THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHET REV STATUS REV B B B B B B B B B OF S

2、HEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY RICK C. OFFICER DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY CHARLES E. BESORE COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY MICHAEL A. FRYE MICROCIRCUIT,

3、 LINEAR, SINGLE SUPPLY, QUAD, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 90-02-05 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-89969 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E305-07 Provided by IHSNot for ResaleNo reproduction or

4、 networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN

5、 class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89969 01 C X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The dev

6、ice type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 35074 Quad operational amplifier 02 35074A Quad operational amplifier 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designato

7、r Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Power supply voltage (VCC) (from V+ to V-) - +44 Input differential range - 1/

8、 Input voltage range - - 1/ Power dissipation (PD) - - 250 mW Output short circuit duration (TS) - Indefinite Ambient operating temperature range (TA) - -55C to +125C Storage temperature (TSTG) - -65C to +150C Junction temperature (TJ) - +160C Thermal resistance, junction-to-case (JC) - See MIL-STD-

9、1835 Thermal resistance, junction-to-ambient (JA) - 120C/W 1.4 Recommended operating conditions. Single supply - V- = GND, V+ = 3.0 V to 44 V Dual supply (from V+ to V-) - 44 V Ambient operating temperature range (TA) - -55C to +125C 1/ Either or both voltages must not exceed the magnitude of the V+

10、 or V-. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government spe

11、cification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-P

12、RF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircu

13、it Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event

14、of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individua

15、l item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted tr

16、ansitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requir

17、ements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, constru

18、ction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified o

19、n figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shal

20、l be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. Fo

21、r packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SI

22、ZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA+125C V+ = +15 V, V- = -15 V, and RLconnected to ground unless otherwise specified Device type

23、 Group A subgroups Min Max Unit Source current IO+ From output to GND, TA= +25C All 1 -10.0 mA Sink current IO- From output to GND, TA= +25C All 1 20 mA Supply current at 5 V I+ V+ = 5 V, V- = 0 V TA= +25C All 1 8 mA 01 1 5.0 Input offset voltage VIOV+ = 5 V, V- = 0 V VO= 1.4 V TA= +25C 02 1 3.5 mV

24、1 4.5 01 2, 3 6.5 1 3.0 Input offset voltage VIO02 2, 3 5.0 mV 1 75 01 2, 3 300 1 50 Input offset current IIOVO= 0 V 02 2, 3 300 nA 1 500 Input bias current IIBVO= 0 V All 2, 3 700 nA 1 10 Positive supply current I+ VO= 0, RL= no load All 2, 3 11 mA 1 -10 Negative supply current I- VO= 0, RL= no loa

25、d All 2, 3 -11 mA Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance

26、characteristics - Continued. Limits Test Symbol Conditions -55C TA+125C V+ = +15 V, V- = -15 V, and RLconnected to ground unless otherwise specified Device type Group A subgroups Min Max Unit 01 4 70 PSRR+ V = 13.5 V to 16.5 V 02 4 80 01 4 70 Power supply rejection ratio PSRR- V = -13.5 V to -16.5 V

27、 02 4 80 dB 01 70 Common mode rejection ratio CMRR+ RS 10 k VICR= 13.2 V 02 4 80 dB 01 70 RS= 10 k VICR= 12.8 V 02 5, 6 80 RS= 10 k, VCM= 0 V to 15 V VICR= -15 V 01 70 Common mode rejection ratio CMRR- RS 10 k VICR= -15 V 02 4, 5, 6 80 dB 4 25 VO = 0 V to +10 V RL= 2 k 01 5, 6 20 4 50 Large signal v

28、oltage gain AVOLVO = 0 V to +10 V RL= 2 k 02 5, 6 25 V/mV 4 13.5 Output voltage swing VOH1RL= 2 k All 5, 6 13.5 V 4 -13.8 Output voltage swing VOL1RL= 2 k All 5, 6 -13.8 V Output voltage swing VOH2RL= 10 k, TA= +25C All 4 13.7 V Output voltage swing VOL2RL= 10 k, TA= +25C All 4 -14.4 V Output voltag

29、e swing VOL3V+ = 5 V, V- = 0 V RL= 2 k, TA= +25C All 1 0.2 V Output voltage swing VOH3V+ = 5 V, V- = 0 V RL= 2 k, TA= +25C All 1 3.7 V Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENT

30、ER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA+125C V+ = +15 V, V- = -15 V, and RLconnected to ground unless otherwise specified Device type Group A subgroups Min

31、Max Unit Slew rate SR Delta V = -10 V to 10 V RL= 2 k, AV= 1 CL= 500 pF, TA= +25C All 4 8 V/s Gain bandwith product GBW f = 100 kHz, TA= +25C All 4 3.5 MHz 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, app

32、endix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an a

33、pproved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate

34、of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification

35、 and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and ins

36、pection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, me

37、thod 1015 of MIL-STD-883. (1) Test condition A. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissip

38、ation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of

39、the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device types 01 and 02 Case outl

40、ines C 2 Terminal number Terminal symbol 1 Output 1 NC 2 Input 1- Output 1 3 Input 1+ Input 1- 4 V+ Input 1+ 5 Input 2+ NC 6 Input 2- V+ 7 Output 2 NC 8 Output 3 Input 2+ 9 Input 3- Input 2- 10 Input 3+ Output 2 11 V-/GND NC 12 Input 4+ Output 3 13 Input 4- Input 3- 14 Output 4 Input 3+ 15 - NC 16 -

41、 V-/GND 17 - NC 18 - Input 4+ 19 - Input 4- 20 - Output 4 FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-89969 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISIO

42、N LEVEL B SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 4, 5, 6 Group A test r

43、equirements (method 5005) 1, 2, 3, 4, 5, 6 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspe

44、ctions. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be

45、as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The

46、 test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 标准规范 > 国际标准 > 其他

copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
备案/许可证编号:苏ICP备17064731号-1