1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R210-93. 93-08-13 Monica L. Poelking B Redrawn with changes. Update drawing to current requirements. Editorial changes throughout. - gap 09-12-02 Charles F. Saffle REV SHET REV SHET REV STATUS REV B B B B B B B
2、 B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Larry T. Gauder DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DE
3、FENSE CHECKED BY Thanh V. Nguyen APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, ECL, 8-INPUT PRIORITY DECODER, MONOLITHIC SILICON DRAWING APPROVAL DATE 93-03-25 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90561 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E367-09 Provided by IHSNot for
4、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class le
5、vels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected
6、 in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90561 01 M E X Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Leadfinish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Devic
7、e classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a no
8、n-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 10565 8-input priority decoder 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as foll
9、ows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outl
10、ine(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F GDFP2-F16 or CDFP3-F16 16 Flat package 2 CQCC1-N20 20 Square chip carrier package 1.2.5 Lead finish. The lead finish is as specifi
11、ed in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 R
12、EVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage range at VCC= 0 V (VEE) . -8.0 V dc minimum to 0.0 V dc maximum Input voltage range (VIN) 0 V dc to VEEOutput source current, continuous (IO) 50 mA Storage temperature range -65C to +150C Lead temperature (
13、soldering, 10 seconds) +300C Junction temperature (TJ) +165C Maximum power dissipation (PD) . 750 mW Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage range at VCC= 0 V (VEE) . -5.46 V dc minimum to -4.94 V dc maximum Ambient operating te
14、mperature range (TA) . -55C to +125C Minimum high level input voltage (VIH): TA= +25C . -0.780 V dc TA= +125C . -0.630 V dc TA= -55C -0.880 V dc Maximum low level input voltage (VIL): TA= +25C . -1.850 V dc TA= +125C . -1.820 V dc TA= -55C -1.920 V dc 2. APPLICABLE DOCUMENTS 2.1 Government specifica
15、tion, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-385
16、35 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Dra
17、wings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a
18、conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause
19、 permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS C
20、OLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (
21、QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, an
22、d physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Ter
23、minal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching wa
24、veforms shall be as specified on figure 4. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full amb
25、ient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the
26、manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for d
27、evice classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The complian
28、ce mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein).
29、 For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall
30、affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V i
31、n MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired t
32、o this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation
33、shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 32 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking pe
34、rmitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C Group A subgroups Limits
35、Unit unless otherwise specified Min Max Cases E, F, and 2 Quiescent conditions 1/ 2/ VIHVILHigh level output voltage VOHOutputs terminated through 100 to -2.0 V VCC= 0.0 V VEE= -5.2 V 3/ -0.780 -0.630 -0.880 -1.850 -1.820 -1.920 1 2 3 -0.930 -0.825 -1.080 -0.780 -0.630 -0.880 V Low level output volt
36、age VOL-0.7-0.630 -0.880 -1.850 -1.820 -1.920 1 2 3 -1.850 -1.820 -1.920 -1.620 -1.545 -1.655 V High level threshold output voltage VOHA-1.105 -1.000 -1.255 -1.475 -1.400 -1.510 1 2 3 -0.950 -0.845 -1.100 -0.780 -0.630 -0.880 V Low level threshold output voltage VOLA-1.105 -1.000 -1.255 -1.475 -1.40
37、0 -1.510 1 2 3 -1.850 -1.820 -1.920 -1.600 -1.525 -1.635 V Power supply drain current 4/ IEEVEE= -5.2 V VCC= 0.0 V 1 2, 3 -131 -144 mA High level input current IIH1VEE= -5.2 V VCC= 0.0 V VIH= -0.780 V at +25C VIH= -0.630 V at +125C VIH= -0.880 V at -55C D0thru D71 2, 3 220 375 A IIH2Clock 1 2, 3 245
38、 415 Low level input current IILVEE= -5.2 V, VCC= 0.0 V VIL= -1.850 V at +25C VIL= -1.820 V at +125C VIL= -1.920 V at -55C 1, 3 2 0.5 0.3 A Functional tests VEE= -4.94 V, -5.46 V See 4.4.1b 7, 8 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted witho
39、ut license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C Group A subgroups Limits U
40、nit unless otherwise specified Min Max Cases E, F, and 2 AC test conditions Propagation delay time, Data to output tPHL1, tPLH1VEE= -3.2 V VCC= 2.0 V CL 5 pF PS1= 1.11 V at +25C PS1= 1.24 V at +125C PS1= 1.01 V at -55C PS2= 0.31 V at +25 PS2= 0.36 V at +125C PS2= 0.28 V at -55C Load all outputs thro
41、ugh 100 to GND See figure 4 9 10 11 2.0 2.0 2.0 7.0 8.5 7.5 ns Propagation delay time, Clock to output tPHL2, tPLH29 10 11 1.5 1.5 1.5 4.0 5.5 5.0 ns Setup time tSET9 10 11 6.0 6.0 6.0 ns Hold time tHOLD10 11 1.0 1.0 1.0 ns Rise time, output tTLH9 10 11 1.1 1.1 1.1 3.3 4.5 3.8 ns Fall time, output t
42、THL10 11 1.1 1.1 1.1 3.3 4.5 3.8 ns 1/ The quiescent limits are determined after a device has reached thermal equilibrium. This is defined as the reading taken with the device in a socket with 500 LFPM of +25C, +125C or -55C (as applicable) air blowing on the unit in a transverse direction with powe
43、r applied for at least four minutes before the reading is taken. This method was used for theoretical limit establishment only. 2/ The T test method creates the limits and test conditions to be used after an increased ambient temperature has been stabilized by external thermal sources. This adjusted
44、 temperature simulates the quiescent method by increasing the specified case temperature (+25C, +125C, -55C) with a T. The T is theoretically determined based on the power dissipation and thermal characteristics of the device and package used. 3/ The high and low level output current varies with tem
45、perature, and shall be calculated using the following formulas: IOH= (-2 V - VOH)/100 IOL= (-2 V - VOL)/100 4/ The IEElimits, although specified in the minimum column, shall not be exceeded, in magnitude, as a maximum value. Provided by IHSNot for ResaleNo reproduction or networking permitted withou
46、t license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines E F 2 Terminal number Terminal symbol 1 VCC1D2NC 2 Q1Q3VCC13 Q0Q2Q14 Clock VCC2Q05 D0VCC1Clock 6
47、 D7Q1NC 7 D1Q0D08 VEEClock D79 D6D0D110 D3D7VEE11 D4D1NC 12 D5VEED613 D2D6D314 Q3D3D415 Q2D4D516 VCC2D5NC 17 D218 Q319 Q220 VCC2NC = No connection FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT D
48、RAWING SIZE A 5962-90561 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 Data inputs Outputs D0D1D2D3D4D5D6D7Q3Q2Q1Q0H X X X X X X X H L L L L H X X X X X X H L L H L L H X X X X X H L H L L L L H X X X X H L H H L L L L H X X X H H L L L L L L L H X X H H L H L L L L L L H X H H H L L L L L L L L H H H H H L L L L L L L L L L L L H = High voltage level. L = Low voltage level. X = Irrelevant. FIGURE 2. Truth table. Provid
