1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing. 06-08-14 Raymond Monnin THE FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve L. Duncan DEFENSE SUPPLY CENTER
2、COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Gregory Lude MICROCIRCUIT, HYBRID, LINEAR, TRACK AND HOLD AMPLIFIER, 16-BIT AND AGENCIES OF THE DE
3、PARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-02-03 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90630 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E596-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-
4、90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and
5、 are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90630 01 H X X Federal RHA Device Device Case Lead stock class designator type class o
6、utline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash
7、 (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SP9760 16-bit track and hold amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying t
8、he product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reli
9、ability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level u
10、ses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the ot
11、her classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Man
12、ufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Termina
13、ls Package style X See figure 1 24 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS
14、COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC). +16 V dc Negative supply voltage (VEE) . -16 V dc Analog input -16 V dc to +16 V dc Digital input . -1.0 V dc to +6.0 V dc Power dissipation (PD). 825 mW Thermal r
15、esistance, junction-to-case (JC) See MIL-STD-1835 Lead temperature (soldering, 10 seconds) +300C Storage temperature range . -65C to +150C Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Positive supply voltage range (VCC). +14.55 V dc to +15.45 V dc Negative supply voltage ran
16、ge (VEE) . -14.55 V dc to -15.45 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherw
17、ise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interfac
18、e Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.
19、mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this documen
20、t, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shal
21、l include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defin
22、ed in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended
23、operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A
24、SHEET 4 DSCC FORM 2234 APR 97 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal conne
25、ctions. The terminal connections shall be as specified on figure 2. 3.2.3 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shal
26、l apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in acco
27、rdance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintai
28、n the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained
29、under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (origin
30、al copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawi
31、ng. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2
32、Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be ma
33、de available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of metho
34、d 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without
35、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TA +125C VCC= +15 V dc, VEE= -15 V dc, unl
36、ess otherwise specified Group A subgroups Device type Min Max Unit ANALOG INPUTS/OUTPUTS Input voltage range VISample mode, DC voltage input 1,2,3 01 10 +10 V Output voltage range VOSample mode, DC voltage input 1,2,3 01 10 +10 V DIGITAL INPUTS Input voltage high VIHIIH= 40 A 1,2,3 01 +2.0 V Input v
37、oltage low VILIIL= 1.6 A1,2,3 01 +0.8 V SAMPLE MODE DC TRANSFER CHARACTERISTICS Offset error VOFFSample mode, VIN= 0 V, no external adjustments 1,2,3 01 -20 +20 mV Offset drift dV/dt Sample mode, VIN= 0 V, no external adjustments 1,2,3 01 -200 +200 V/C Gain error 1/ AeAe= (VOUT- VIN), sample mode 1,
38、2,3 01 0.2 +0.2 %FSR Gain drift 1/ dA/dt dA/dt = (VOUT- VIN), sample mode 1,2,3 01 20 +20 ppm/C Linearity 1/ LE +20 V range, LE = % variation of gain errors 1,2,3 01 +.002%FSR SAMPLE MODE DYNAMICS Slew rate SR Sample mode, 20 V step 4,5,6 01 +40 V/sec Acquisition time TAQ20 V step to .005% FSR 4,5,6
39、 01 +700 nsec See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE
40、 I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions -55C TA +125C VCC= +15 V dc, VEE= -15 V dc, unless otherwise specified Group A subgroups Device type Min Max Unit HOLD MODE DYNAMICS Pedestal offset error PEDVOFF VIN= 0 V, hold mode, 2/ PEDVOFF= Vsample - Vhold 4,
41、5,6 01 -5 +5 mV Pedestal offset drift PEDdv dt VIN= 0 V, hold mode, 2/ PEDdv/dt = Vsample - Vhold 4,5,6 01 -50 +50 V/C Pedestal gain error PEDAeHold mode, 1/ 2/ PEDAe= Vsample - Vhold 4,5,6 01 -0.01 +0.01 %FSR Pedestal linearity 1/ PEDLINPEDLIN= % variation of pedestal gain error 4,5,6 01 -0.002 +0.
42、002%FSR Droop rate DrateVIN= 20 V step, hold mode 4,5,6 01 -1000 +1000 V/s Feedthrough rejection FEEDth 20 V step 4,5,6 01 -90 dB POWER SUPPLY Supply current: +15 V supply (VCC) ICCVCC= +15.75 V 40 -15 V supply (VEE) IEEVEE= -15.75 V 1,2,3 01 30 mA Power supply rejection ratio +15 V supply (VCC) PSR
43、R1 VCC= +15 V 5% 200 -15 V supply (VEE) PSRR2 VEE= -15 V 5% 1,2,3 01 -200 V/V 1/ All gain and linearity errors are measured with VIN= +10 V, +5 V, 0 V, -5 V, -10 V. 2/ Vsample is the voltage at the input during the sample mode and Vhold is the output voltage during the hold mode. Provided by IHSNot
44、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Inches mm Inches mm .010 0.25 .230 5.84 .018 0.46 .25
45、0 6.35 .030 0.76 .600 15.24 .100 2.54 .795 20.20 .185 4.70 1.370 34.80 NOTES: 1. Dimensions are in inches. 2. Metric equivalents are given for general information only. 3. Unless otherwise specified, tolerance is .005 (0.13mm). 4. Standoffs are optional at the discretion of the manufacturer. FIGURE
46、1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Device type 01
47、Case outline X Case outline X Terminal number Terminal symbol Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 -In VOSIn Gain VCCVINVEETP VCCTP VOUTVEE+Out VOSOut VOSC 13 14 15 16 17 18 19 20 21 22 23 24 -Out VOSOut Gain VCCTP NC Buffer Out Ground +5 V Ref S/H In VEE +In VOSIn VOSC FIGURE
48、2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90630 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,
