DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf

上传人:unhappyhay135 文档编号:699799 上传时间:2019-01-01 格式:PDF 页数:11 大小:78KB
下载 相关 举报
DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf_第1页
第1页 / 共11页
DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf_第2页
第2页 / 共11页
DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf_第3页
第3页 / 共11页
DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf_第4页
第4页 / 共11页
DLA SMD-5962-90638 REV E-2007 MICROCIRCUIT HYBRID LINEAR HIGH POWER OPERATIONAL AMPLIFIER《高功率运算放大器 线性混合微型电路》.pdf_第5页
第5页 / 共11页
点击查看更多>>
资源描述

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changed parameter (AOL) in table I from 92 dB to 89 dB. 91-09-30 Don Cool B Changes in accordance with NOR 5962-R047-94. 93-11-29 K. A. Cottongim C Update drawing requirements to MIL-PRF-38534. 01-02-02 Raymond Monnin D Correct paragraphs 4.2.a (

2、2) and 4.3.3.b (2). Update drawing boilerplate. 07-02-07 Joseph Rodenbeck E Table I, output voltage test, conditions column for subgroup 5 only; correct VS= 31 V dc and IO= 150 mA to VS= 11.3 V dc and IO= 3 A. -gz 07-07-02 Robert M. Heber THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. R

3、EV SHEET REV SHEET REV STATUS REV E E E E E E E E E E OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEP

4、ARTMENTS APPROVED BY Don Cool MICROCIRCUIT, HYBRID, LINEAR, HIGH POWER, OPERATIONAL AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-03-27 AMSC N/A REVISION LEVEL E SIZE A CAGE CODE 67268 5962-90638 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E523-07Provided by IHSNot for Re

5、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes a

6、s defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in t

7、he following example: 5962 - 90638 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked device

8、s shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 PA07M, MIOP42114 Power

9、 operational amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (

10、Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-sp

11、ace high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not

12、test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisit

13、ion document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. 1.2.4 Case outlin

14、e(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

15、 A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 3 DSCC FORM 2234 APR 97 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VS). 50 V dc Output current (IO). 5.0 A Power dissipation

16、(PD) 2/ 67 W Input voltage (differential) . 50 V dc Input voltage (common mode) 50 V dc Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +200C Storage temperature range. -65C to +150C 1.4 Recommended operating conditions. Supply voltage (VS). 35 V dc Case operating temper

17、ature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited i

18、n the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT

19、 OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robb

20、ins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless

21、 a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate at 2.6C/W above case temperature (TC) of +25C. Provided by IHSNot for

22、 ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance r

23、equirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The

24、manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for t

25、he applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connect

26、ions. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical

27、test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in

28、 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality confo

29、rmance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made availa

30、ble to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product me

31、ets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection pro

32、cedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The followin

33、g additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test ci

34、rcuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II he

35、rein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. c. Constant acceleration may be performed after burn-in upon approval by the qualifying activity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license

36、from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C VS= 35 dc Group A subgroups Device type Limits

37、 Unit unless otherwise specified Min Max 1,2 30 Supply current IS VIN= 0 V dc, G = 100, 2/ RCL= 1.0 , VCM= 0 V dc 3 01 46 mA 1 -4.3 +4.3 2 -7.3 +7.3 VIN= 0 V dc, G = 100, 2/ VS= 12V dc , RCL= 1.0 3 -6.7 +6.7 mV 1 -2.0 +2.0 2 -5.0 +5.0 VIN= 0 V dc, G = 100, 2/ VS= 35 V dc , RCL= 1.0 3 -4.4 +4.4 mV 1

38、-3.5 +3.5 2 -6.5 +6.5 Input offset voltage VOSVIN= 0 V dc, G = 100, 2/ VS= 50 V dc , RCL= 1.0 3 01 -5.9 +5.9 mV 1,3 50.0 pA Input bias current, +IN +IBVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA 1,3 50.0 pA Input bias current, -IN -IBVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA 1,3 50.0 pA Input offset currentIO

39、SVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA VS= 50 V dc, IO= 90 mA, RL= 500 4,5,6 45 V VS= 15.3 V dc, IO= 5 A, RL= 2.09 , TC= +25C, -55C 4,6 10.3 V VS= 11.3 V dc, IO= 3 A, RL= 2.07 , TC= +125C 5 6.3 V Output voltage VOVS= 29 V dc, IO= 2 A, RL= 12 4,5,6 01 24 V See footnotes at end of table. Provided by I

40、HSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Te

41、st Symbol Conditions 1/ -55C TC +125C VS= 35 V dc Group A subgroups Device type Limits Unit unless otherwise specified Min Max Current limits ICLRL= 12 , RCL= 1.0 , 2/ VS= 19 V dc, TC= +25C 4 01 0.54 0.86 A Stability/noise ENG = 1, VS= 35 V dc, CL= 10 nF 4,5,6 01 1.0 mV 4,6 2.5 10 Slew rate SRRL= 50

42、0 , VS= 35 V dc, VIN 4 VP-P 5 01 1.25 10 V/s Open loop gain AOLRL= 500 , VS= 35 V dc, f = 15 Hz, VIN 0.4 VP-P 4,5,6 01 89 dB Common mode rejection CMR VS= 34.5 V dc, f = dc, VCM= 2.5 V dc 4,5,6 01 80 dB 1/ During all group A testing, terminal connection BAL (pin 7) is left open. 2/ A current limitin

43、g resistor (RCL) is connected between CL+ to the output CL- to the output during these tests. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REV

44、ISION LEVEL E SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters InchesSymbol Min Max Min MaxA 38.35 39.37 1.510 1.550B 19.30 19.81 .760 .780C 7.37 .290D 0.97 1.07 .038 .042E 2.03 2.54 .080 .100F 40 BSC 40 BSCG 12.7 BSC .500 BSCH 30.12 BSC 1.186 BSCJ 15.06 BSC .593 BSCK 11.68 12.70 .460 .500Q

45、 3.84 4.09 .151 .161R 25.15 25.65 .990 1.010NOTES: 1. The U. S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the inch-pound shall take precedence. 2

46、. Pin numbers are for reference and may not be marked on package. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVI

47、SION LEVEL E SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 Output +Current limit (CL+) +VS +IN -IN -VS Balance (BAL) -Current limit (CL-) FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted

48、 without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90638 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL E SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim elect

展开阅读全文
相关资源
猜你喜欢
  • DIN 43751-1-1987 Measurement and control digital measuring instruments general specifications relating to definitions tests and data sheet details《测量和控制 数字式测量仪表 关于定义、检验和数据单详细内容的通用规.pdf DIN 43751-1-1987 Measurement and control digital measuring instruments general specifications relating to definitions tests and data sheet details《测量和控制 数字式测量仪表 关于定义、检验和数据单详细内容的通用规.pdf
  • DIN 43751-2-1987 Measurement and control digital measuring instruments instruments for measuring analogue quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量模拟量的仪表.pdf DIN 43751-2-1987 Measurement and control digital measuring instruments instruments for measuring analogue quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量模拟量的仪表.pdf
  • DIN 43751-3-1987 Measurement and control digital measuring instruments instruments for measuring digital quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量数字量的仪表 .pdf DIN 43751-3-1987 Measurement and control digital measuring instruments instruments for measuring digital quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量数字量的仪表 .pdf
  • DIN 43751-4-1990 Measurement and control digital measuring instruments instruments for measuring time reference quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量.pdf DIN 43751-4-1990 Measurement and control digital measuring instruments instruments for measuring time reference quantities definitions tests and data sheet details《测量和控制 数字式测量仪表 测量.pdf
  • DIN 43764-1986 Measurement and control electrical temperature sensors straight thermometers with interchangeable sensor units《测量和控制 电温度传感器 带有可互换传感元件的直观温度计》.pdf DIN 43764-1986 Measurement and control electrical temperature sensors straight thermometers with interchangeable sensor units《测量和控制 电温度传感器 带有可互换传感元件的直观温度计》.pdf
  • DIN 43765-1986 Measurement and control electrical temperature sensors threaded-stem thermometers with G 1 2 mounting thread《测量和控制 电温度传感器 带有G1 2安装螺纹的旋入式温度计》.pdf DIN 43765-1986 Measurement and control electrical temperature sensors threaded-stem thermometers with G 1 2 mounting thread《测量和控制 电温度传感器 带有G1 2安装螺纹的旋入式温度计》.pdf
  • DIN 43766-1986 Measurement and control electrical temperature sensors threaded-stem thermometers with G 1 mounting thread《测量和控制 电温度传感器 带有G1安装螺纹的旋入式温度计》.pdf DIN 43766-1986 Measurement and control electrical temperature sensors threaded-stem thermometers with G 1 mounting thread《测量和控制 电温度传感器 带有G1安装螺纹的旋入式温度计》.pdf
  • DIN 43767-1986 Measurement and control electrical temperature sensors welded-stem thermometers《测量和控制 电温度传感器 焊接杆式温度计》.pdf DIN 43767-1986 Measurement and control electrical temperature sensors welded-stem thermometers《测量和控制 电温度传感器 焊接杆式温度计》.pdf
  • DIN 43769-1986 Measurement and control electrical temperature sensors thermometers not fitted with protecting tubes《测量和控制 电温度传感器 无附加保护管的温度计》.pdf DIN 43769-1986 Measurement and control electrical temperature sensors thermometers not fitted with protecting tubes《测量和控制 电温度传感器 无附加保护管的温度计》.pdf
  • 相关搜索

    当前位置:首页 > 标准规范 > 国际标准 > 其他

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1