1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing boilerplate. Figure 1, convert to current format. 02-03-28 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N
2、/A PREPARED BY Donald Osborne DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Gary Zahn POST OFFICE BOX 3990 COLUMBUS, OHIO 43216-5000 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY William K. Heckman MICROCIRCUIT, HYBRID, LINEAR, HIGH
3、-VOLTAGE, POWER OPERATIONAL AMPLIFIER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 91-07-12 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90736 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E315-02 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited
4、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five
5、product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The
6、 PIN shall be as shown in the following example: 5962 - 90736 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) de
7、signator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit functio
8、n 01 PA84M High voltage, operational amplifier 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K,
9、 and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in a
10、pplications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer
11、guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition documen
12、t; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature
13、 range. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flange mount (TO-3) 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. Provided by IHSNot for Re
14、saleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. Supply voltage (VS). 150 V dc Output current
15、(IO) 50 mA Power dissipation (PD) 17.5 W 1/ Input voltage (differential) 2/. 300 V dc Input voltage (common mode) 2/. 150 V dc Lead temperature (soldering, 10 seconds). +300C Junction temperature (TJ). +200C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Supply voltage
16、 (VS). 150 V dc Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issu
17、es of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT
18、 OF DEFENSE MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. HANDBOOKS DEPARTMENT OF DEFENSE MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, c
19、opies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the te
20、xt of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Derate at 6.5C/W above case temperature (TC) of +25C. 2/ Signal slew rates at pins 5 and 6 must be limited to less than 1 V/ns to avoid
21、 damage. When faster waveforms are unavoidable, resistors in series with those pins, limiting current to 150 mA will protect the amplifier from damage. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DE
22、FENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may
23、include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Furthermore, t
24、he manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, constr
25、uction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance char
26、acteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II.
27、 The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked as listed. 3.6
28、Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the dat
29、a should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A
30、certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of confor
31、mance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the
32、 device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-
33、STD-883. (1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation,
34、 as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
35、 prior to burn-in are optional at the discretion of the manufacturer. c. Constant acceleration may be performed after burn-in upon approval by the qualifying activity. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE
36、 A 5962-90736 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C VS= 150 V dc Group A subgroups Device type Limits Unit unless otherwise specified Min Max 1 +
37、7.5 +IS 2,3 +9.5 1 -7.5 Quiescent supply current -IS VIN= 0 V dc, G = 100, VCM= 0 V dc 2,3 01 -9.5 mA 1 -5.7 +5.7 2 -8.2 +8.2 VIN= 0 V dc, G = 100, VS= 15V dc 3 -7.7 +7.7 mV 1 -3.0 +3.0 2 -5.5 +5.5 Input offset voltage VOSVIN= 0 V dc, G = 100, VS= 150 V dc 3 01 -5.7 +5.0 mV 1,3 50.0 pA Input bias cu
38、rrent, +IN +IBVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA 1,3 50.0 pA Input bias current, -IN -IBVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA 1,3 50.0 pA Input offset currentIOSVIN= 0 V dc, RBIAS 100 M 2 01 10.0 nA VS= 80 V dc, IO= 15 mA, RL= 5 k 4,5,6 75 V VS= 150 V dc, IO= 28.6 mA, RL= 5 k 4,5,6 143 V VS= 47 V
39、 dc, IO= 40 mA, RL= 1 k, TC= +25C, -55C 4,6 40 V Output voltage VOVS= 37 V dc, IO= 30 mA, RL= 1 k, TC= +125C 5 01 30 V See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFE
40、NSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C VS= 150 V dc Group A subgroups Device type Limits Unit unless otherwise specified Min Max Current l
41、imits ICLRL= 100 , VS= 20 V dc, TC= +25C 4 01 36 70 mA Stability/noise ENG = 1, CL= 10 nF 4,5,6 01 1.0 mV Slew rate SRRL= 5 k, VIN 4 VP-P, CL= 50 pF 4,6 01 100 600 V/s Open loop gain AOLRL= 5 k, f = 15 Hz, VIN 0.4 VP-P 4,5,6 01 100 dB Common mode rejection CMR VS= 32.5 V dc, f = DC, VCM= 22.5 V dc 4
42、,5,6 01 90 dB 1/ During all group A testing, terminal connections BAL (pins 3 and 4) are left open. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-50
43、00 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Millimeters Inches Symbol Min Max Min Max A 38.35 39.37 1.510 1.550 B 19.30 19.81 0.760 0.780 C 7.37 0.290 D 0.97 1.07 0.038 0.042 E 2.03 2.54 0.080 0.100 F 40 BSC 40 BSC G 12.7 BSC 0.500 BSC H 30.15 BSC 1.187 BSC J 15.06 BSC 0.593 BS
44、C K 11.68 12.70 0.460 0.500 Q 3.84 4.09 0.151 0.161 R 25.15 25.650.990 1.010 NOTES: 1. The U. S. preferred system of measurement is the metric SI. This case outline was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch-pound units, the in
45、ch-pound shall take precedence. 2. Pin numbers are for reference and may not be marked on package. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFENSE SUPPLY CENTER COLUMB
46、US COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 Output +VSBalance (BAL)Balance (BAL) -IN +IN-VSCOMP FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking per
47、mitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90736 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 REVISION LEVEL A SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38
48、534, group A test table) Interim electrical parameters Final electrical parameters 1*, 2, 3, 4, 5, 6 Group A test requirements 1, 2, 3, 4, 5, 6 Group C end-point electrical parameters 1, 4 End-point electrical parameters for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shal
