1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add vendor CAGE S7631. Update drawing to current requirements of MIL-PRF-38534. Editorial corrections throughout. 03-05-30 Raymond Monnin B Rewrite paragraphs 4.2.a.2. and 4.3.3.b.2 to add TC. 04-04-23 Raymond Monnin C Updated drawing paragraphs.
2、 -sld 11-12-09 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Mich
3、ael Jones THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE APPROVED BY Kendall A.Cottongim MICROCIRCUIT, HYBRID, LINEAR, 16-BIT, 7 VOLT, AMP OUTPUT DRIVE, DIGITAL TO SYNCHRO CONVERTER DRAWING APPROVAL DATE 95-04-14 AMSC N/A REVISION LEVEL C SIZE A CAGE C
4、ODE 67268 5962-90760 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E045-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2
5、234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardn
6、ess assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90760 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) /
7、 Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit func
8、tion as follows: Device type Generic number Circuit function Accuracy 01 DSC-10510-113 D/S converter, 16-bit 4 minutes 02 DSC-10510-114 D/S converter, 16-bit 2 minutes 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All le
9、vels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This leve
10、l is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-P
11、rocess Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exc
12、eption(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class
13、. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COL
14、UMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 40 Dual-in-line 1.2.5 Lead finish. The lead finish shall be
15、as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. Positive supply voltage (VCC) . +18 V dc Negative supply voltage (VEE) 18 V dc Power stage supply voltage (V) . 25 Vpk Reference input voltage (RH, RL). 75 V rms Reference input voltage (RH, RL) 10 V rms Digital input voltage (BITS 1-16) -
16、0.3 V dc to +6.5 V dc Power dissipation, TC= +125C (PD) . 25 W Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance junction-to-case (JC) 6C/W Thermal resistance junction-to-ambient (JA) . 17.6C/W 1.4 Recommended operating conditions. Positive sup
17、ply voltage range (VCC) . +14.25 V dc to +15.75 V dc Negative supply voltage range (VEE) 14.25 V dc to -15.75 V dc Power stage supply voltage (V) . 15 V dc or pulsating supply (20 V peak, 3 V minimum, see figure 5) Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Gov
18、ernment specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFIC
19、ATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcir
20、cuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the eve
21、nt of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings ma
22、y cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COL
23、UMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all
24、 tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met
25、 for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-
26、PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Timing diagr
27、am. The timing diagram shall be as specified on figure 4. 3.2.5 Pulsating power source diagram. The pulsating power source diagram shall be as specified on figure 5. 3.2.6 Pin functions. The pin functions shall be as specified on table III. 3.3 Electrical performance characteristics. Unless otherwis
28、e specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for ea
29、ch subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general perfo
30、rmance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all para
31、meters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compl
32、iance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conforma
33、nce. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufactur
34、ers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test
35、condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power
36、dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical paramete
37、r tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC
38、 FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Resolution, 16-bit RES MSB = 180 degrees LSB = .0055 degrees 7,8 All .33 arc min Output accuracy AOUT7,8 01 -4 +4 mi
39、n 02 -2 +2 Differential linearity 2/ DL 7,8 All -1 +1 LSB Radius accuracy 2/ RA 3/ 7,8 All -.1 +.1 % Output settling time tSFor any digital input step change (passive loads) 9,10,11 All 40 s Logic 0 digital input voltage VIL1,2,3 All 0.0 1.25 V dc Logic 1 digital input voltage VIH1,2,3 All 2.0 5.0 V
40、 dc Digital input load current 2/ IINBits 1 through 16, VIL= 0 V dc 1,2,3 All -20 A LL, LH, and LA, VIH= 5.0 V dc 1,2,3 All +20 A Standard reference input voltage VINRH and RL 4,5,6 All 23.4 28.6 V rms VIN1RH and RL 3.06 3.74 Reference input frequency fIN4,5,6 All dc 1.0 kHz Standard reference input
41、 impedance 2/ ZINRH and RL single ended 4,5,6 All 99.5 100.5 k differential 4,5,6 All 199 201 k ZIN1RH and RL differential 4,5,6 All 25.87 26.13 k single ended 4,5,6 All 12.94 13.07 k Analog output current IOUTShort circuit protected 4,5,6 All 2 mA rms Analog output voltage VOUT Synchro, 26 V refere
42、nce input 4,5,6 All 11.74 11.86 V rms L-L See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FOR
43、M 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Analog output transformation ratio 2/ AOTR 4,5,6 All -0.5 +0.5 % TR load 2/ ZSSmaximum load 4,5,6 All 2 ohm
44、CT or CDX load 2/ ZSO4,5,6 All 7 VA Analog output offset voltage 2/ VOSEach line to ground, (varies with angle) 1,2,3 All -15 +15 mV Analog output scale factor variation 2/ SFV 7,8 All -0.1 +0.1 % Register latch control Logic 0 LL, LM, LA; data latched 7,8 All Pass/ Fail Logic 1 LL, LM, LA; data tra
45、nsparent 7,8 All Register control pulse width tPWFor data transfer, see figure 4 9,10,11 All 200 ns Register control data setup time tsuBefore data transfer, see figure 4 9,10,11 All 50 ns Register control data hold time thHold time after low edge of LL, LM, LA, see figure 4 9,10,11 All 100 ns Posit
46、ive supply current (VCC) ICCVCC= +15 V dc, no load 1,2,3 All +25 mA Negative supply current (VEE) IEEVEE= -15 V dc, no load 1,2,3 All -25 mA Power stage supply current +V Full load 1,2,3 All +700 mA rms -V -700 Digital BITE output BIT Logic 1 at rated synchro load, I = 0, -0.4 mA 9,10,11 All 2.8 5.5
47、 V Logic 0 at short circuit at 45.000, I = 1.6 mA 9,10,11 All 0.0 0.4 V 1/ Unless otherwise specified, +14.25 V dc VCC +15.75 V dc, -14.25 V dc VEE -15.75 V dc. 2/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed
48、 to the limits specified in table I for all lots not specifically tested. 3/ Radius accuracy is defined as the simultaneous amplitude variation in both outputs as a function of digital angle. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90760 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbo
