1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Drawing updated to reflect current requirements. - ro 01-10-23 R. Monnin B Redrawn. Paragraphs updated to MIL-PRF-38535 requirements. - drw 13-03-19 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B OF SHEETS SHEET 1 2 3
2、4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Sandra Rooney DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY Sandra Rooney APPROVED BY Mic
3、hael A. Frye MICROCIRCUIT, LINEAR, ANALOG SWITCH, SPST, 4-CHANNEL, WB/VIDEO, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-10-11 AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90764 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E322-13 Provided by IHSNot for ResaleNo reproduction or networking permi
4、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classe
5、s Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the f
6、ollowing example: 5962 - 90764 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the M
7、IL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device typ
8、e identifies the circuit function as follows: Device type Generic number Circuit function 01 DG541A Quad SPST wideband/video “T” switch 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements d
9、ocumentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline is as designated in MIL-STD-1835 as fo
10、llows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction o
11、r networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ V+ to V- -0.3 V dc to 21 V dc Ground to V- . -0.3 V dc to 10 V dc Digita
12、l inputs . (V-) -0.3 V dc to (V+) +0.3 V dc 2/ VS, VDto V- (V-) -0.3 V dc to (V-) +14 V dc 2/ Current (any terminal), continuous . 20 mA Current, S or D, pulsed 1 ms, 10% duty cycle 40 mA Power dissipation (PD) . 900 mW 3/ Maximum junction temperature (TJ) . +150C Lead temperature (soldering, 10 sec
13、onds max) . +300C Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 1.4 Recommended operating conditions. Positive supply voltage (V+) . 15 V dc Negative supply voltage (V-) . -3 V dc Ground (GND) 0 V dc Bandwidth (RL= 50) 350 MHz OFF isolation (TA=
14、 25C) -58 dB (typical) Crosstalk (TA= 25C) . -85 db (typical) Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specifi
15、ed herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard
16、Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksea
17、rch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this docume
18、nt, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Signals on Sx,
19、Dx, or INx exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current to maximum current ratings. 3/ Device mounted with all leads soldered or welded to PC board. Derate 12 mW/C above +75C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license f
20、rom IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as s
21、pecified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non
22、-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case
23、 outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
24、 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Elec
25、trical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For
26、packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordan
27、ce with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“
28、as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of comp
29、liance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufactu
30、rers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for de
31、vice class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this
32、drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentati
33、on. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 82 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo re
34、production or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unle
35、ss otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Analog signal range 3/ VANALOGV- = -5 V 1, 2, 3 01 -5 8 V Drain-source ON resistance rDS(ON) IS= -10 mA, VD= 0 V, VIN= 2 V 1, 3 01 5 60 2 5 100 Resistance match between channels rDS(ON) IS= -10 mA, VD= 0 V, VIN= 2 V 1 01 6 S
36、ource OFF leakage current IS(OFF) VS= 0 V, VD= 10 V, VIN= 0.8 V 1 01 10 nA 2, 3 500 Drain OFF leakage current ID(OFF) VS= 10 V, VD= 0 V, VIN= 0.8 V 1 01 10 nA 2, 3 500 Total switch ON leakage current ID(ON) + VS= 0 V, VD= 0 V, VIN= 2 V 1 01 10 nA IS(ON) 2, 3 1000 Input voltage high VINH7, 8 01 2 V I
37、nput voltage low VINL7, 8 01 0.8 V Input current IINVIN= 0.8 V, 2.0 V 1 01 1 A 2, 3 20 Positive supply current I+ All channels ON or OFF, VIN= 0.8 V, 2.0 V 1, 2 01 0.5 5 mA 3 0.5 7 Negative supply current I- All channels ON or OFF, VIN= 0.8 V, 2.0 V 1, 2 01 -5 -0.5 mA 3 -7 -0.5 See footnotes at end
38、of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics c
39、ontinued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits 2/ Unit Min Max Functional tests (See 4.4.1c) 7, 8 01 Turn ON time tONRL= 1 k, CL= 35 pF, 50 % to 90 % 9 01 10 70 ns 10, 11 10 140 Turn OFF time tOFFRL= 1 k, CL= 35 pF, 50 % to 90 % 9 01
40、 10 50 ns 10, 11 10 85 1/ Unless otherwise specified, V+ = 15 V, V- = -3 V, VINH= 2 V, VINL= 0.8 V, and GND = 0 V. 2/ The limiting terms “min” (minimum) and “max” (maximum) shall be considered to apply to magnitudes only. Negative current shall be defined as conventional current flow out of a device
41、 terminal. 3/ Guaranteed by design, but not tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 Device
42、type 01 Case outline E Terminal number Terminal symbol 1 IN12 D13 S14 V- 5 GND 6 S47 D48 IN49 IN310 D311 S312 GND 13 V+ 14 S215 D216 IN2FIGURE 1. Terminal connections. Logic Switch 0 Off 1 On Logic “0” 0.8 V Logic “1” 2.0 V FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or netwo
43、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license fr
44、om IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90764 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38
45、535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. F
46、or device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devi
47、ces prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the
48、preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature,
