1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add case outline E. Editorial and technical changes throughout. 97-04-10 R. MONNIN B Changes made to JC, JA, and dropout voltage test. Update boilerplate. 99-08-03 R. MONNIN C Drawing updated to reflect current requirements. - ro 03-03-18 R. MONN
2、IN D Update drawing as part of 5 year review. - jt. 11-10-03 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV D D D D D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY JOSEPH A. KERBY DLA LAND AND MARITIME COLUMBUS
3、 OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY CHARLES E. BESORE APPROVED BY MICHAEL A. FRYE MICROCIRCUIT, LINEAR, 8-VOLT REGULATOR, MONOLITHIC SILICON DRAWING
4、 APPROVAL DATE 91-12-18 AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 67268 5962-90883 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E530-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME
5、 COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are avai
6、lable and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 90883 01 Q E A Federal stock class designator RHA designator (see 1.2.1) Devic
7、e type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RH
8、A marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circuit function 01 LM2940-8.0 1
9、0 A, low dropout, 8-volt regulator 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN clas
10、s level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 1
11、6 Dual-in-line Y See figure 1 2 Flange mount 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICR
12、OCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Input voltage (VIN): Survival voltage ( 100 ms ) . 60 V dc Operational voltage . 26 V dc Storage temperature range . -65C to +150C Intern
13、al power dissipation (PD) . Internally limited Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case ( JC): Case E . 3C/W Case Y . 5C/W Thermal resistance, junction-to-ambient ( JA): Case E 73C/W Case Y 40C/W 1.4 Recommended operating
14、 conditions. Ambient operating temperature range (TA) -55C to +125C Output current (IO) 1 A Input voltage (VIN) 13 V dc 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent spec
15、ified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standa
16、rd Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/
17、quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliabili
18、ty. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict bet
19、ween the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requiremen
20、ts for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
21、device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q
22、and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics and postirr
23、adiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requireme
24、nts shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is
25、not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall
26、 be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certifica
27、te of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order t
28、o be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the req
29、uirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be prov
30、ided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this dr
31、awing. 3.9 Verification and review for device class M. For device class M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onsh
32、ore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 52 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from
33、 IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TA +125C VIN= 13 V, IO= 1 A, Group A subgroups Device type Limits Unit
34、COUT= 22 F unless otherwise specified Min Max Output voltage VOUTVIN= 13 V, IOUT= 5 mA 1 01 7.76 8.24 V 2, 3 7.60 8.40 VIN= 9.4 V, IOUT= 5 mA 1 7.76 8.24 2, 3 7.60 8.40 VIN= 10 V, IOUT= 5 mA 1 7.76 8.24 2, 3 7.60 8.40 VIN= 26 V, IOUT= 5 mA 1 7.76 8.24 2, 3 7.60 8.40 VIN= 13 V, IOUT= 1 A 1 7.76 8.24
35、2, 3 7.60 8.40 VIN= 9.4 V, IOUT= 1 A 1 7.76 8.24 2, 3 7.60 8.40 VIN= 9.4 V, IOUT= 50 mA 1 7.76 8.24 2, 3 7.60 8.40 VIN= 13 V, IOUT= 50 mA 1 7.76 8.24 2, 3 7.60 8.40 Maximum line transient VLTVO 9 V, RO= 100 , t = 20 ms 1, 2, 3 01 40 V Reverse polarity input voltage dc VRINRO= 100 1, 2, 3 01 -15 V Re
36、verse polarity input voltage transient VRITRO= 100 , t = 20 ms 1, 2, 3 01 -45 V Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 D
37、SCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA +125C VIN= 13 V, IO= 1 A, Group A subgroups Device type Limits Unit COUT= 22 F unless otherwise specified Min Max Quiescent current IQVIN= 13 V, IOUT= 5 mA 1 01 0 15 mA 2, 3 0 20 VIN= 10
38、V, IOUT= 5 mA 1 0 15 2, 3 0 20 VIN= 26 V, IOUT= 5 mA 1 0 15 2, 3 0 20 VIN= 13 V, IOUT= 1 A 1 0 50 2, 3 0 60 Line regulation VRLINE10 V VIN 26 V, 1 01 -50 +50 mV IO= 5 mA 2, 3 -80 +80 Load regulation VRLOADVIN= 13 V, 1 01 -80 +80 mV 50 mA IO 1 A 2, 3 -130 +130 Dropout voltage VDOIO= 1 A 1 01 0 0.7 V
39、2, 3 0 1 IO= 100 mA 1 0 200 mV 2, 3 0 300 Output noise voltage VONVIN= 13 V, IO= 5 mA, 10 Hz - 100 kHz 1, 2, 3 01 0 1000 V rms Output impedance ROVIN= 13 V, IO= 100 mA dc and 20 mA ac, fo= 120 Hz 1, 2, 3 01 1 Short circuit current IOSVIN= 13 V 1 01 1.6 A 2, 3 1.3 Ripple rejection RRVIN= 13 V, 1 V rm
40、s, 4 01 54 dB f = 1 kHz, IO= 5 mA 5, 6 48 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 Case outline Y FI
41、GURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 Case outline Y SYMBOL DIMENSION INCHE
42、S MILLIMETERS MIN MAX MIN MAX A .250 .450 6.35 11.43 b .038 .043 0.97 1.09 D - .875 - 22.22 e .420 .440 10.67 11.18 e1.205 .225 5.21 5.72 F .060 .135 1.52 3.43 L .312 .500 7.92 12.70 L1- .050 - 1.27 p .151 .161 3.84 4.09 q 1.177 1.197 29.90 30.40 R .495 .525 12.57 13.34 R1.131 .188 3.33 4.78 S .655
43、675 16.64 17.15 NOTE: The US government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-pound units of measurement. In the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. FIGURE 1.
44、Case outline Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 9 DSCC FORM 2234 APR 97 Device type 01 Case outlines E Y Te
45、rminal number Terminal symbol 1 NC VIN2 NC VOUT3 VOUT- 4 NC - 5 GND - 6 NC - 7 NC - 8 NC - 9 NC - 10 NC - 11 GND - 12 GND - 13 GND - 14 GND - 15 NC - 16 VIN- NC = No connection FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from I
46、HS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90883 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535
47、 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For
48、device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, m
