1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add RHA criteria and limits. Editorial changes throughout. - jak 99-05-06 Monica L. Poelking B Update the boilerplate paragraphs to current requirements as specified in MIL-PRF-38535. - jak 09-03-20 Thomas M Hess REV SHET REV B B B SHEET 15 16 17
2、 REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Marcia B. Kelleher STANDARD MICROCIRCUIT DRAWING CHECKED BY Monica L. Poelking DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE F
3、OR USE BY ALL DEPARTMENTS APPROVED BY Michael A. Frye AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 92-03-18 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD 2-PORT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 67268 5962-90934 SHEET 1 OF
4、17 DSCC FORM 2233 APR 97 5962-E161-09 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1
5、 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a cho
6、ice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 R 90934 01 V E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2
7、.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked
8、with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54ACT399 Quad 2-port register, TTL compatible inputs 1.2.3 Device class designator. The device
9、 class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V C
10、ertification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 pr CDIP2 T-16 16 Dual-in-line F GDFP2-F16 pr CDFP3 F-16 16 Flat pack 2 CQCC1-N20 20 S
11、quare leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING
12、SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) . -0.5 V dc to +7.0 V dc DC input voltage range (VIN) . -0.5 V dc to VCC+0.5 V dc DC output voltage range (VOUT)
13、 -0.5 V dc to VCC+0.5 V dc DC input diode current (IIK) 20 mA DC output diode current (IOK) . 20 mA DC output source or sink current (per pin) (IOUT). 50 mA DC VCCor GND current 200 mA Maximum power dissipation (PD) 500 mW Storage temperature range (TSTG) -65C to +150C Lead temperature (soldering, 1
14、0 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 4/ 1.4 Recommended operating conditions. 2/ 3/ Supply voltage range (VCC) . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . +0.0 V dc to VCCOutput voltage range (VOUT) +0.0 V dc to VCC
15、Case operating temperature range (TC) -55C to +125C Input rise or fall rate *( VCC= +4.5 V to 5.5 V). 0 to 8 ns/V 1.5 Radiation features. Maximum total dose available (dose rate = 50 300 rads (Si)/s) (MIL-STD-883, method 1019, condition A, followed by extended room temperature anneal; effective dose
16、 rate 165 mrads(Si)/s. 100 krads (Si) 1/ Stresses above the absolute maximum rating may cause permanent damage to the device, Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the
17、parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in screening conditions in accordance with method 5004 of MIL-STD-883. Provided by IHSN
18、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, a
19、nd handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Ci
20、rcuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-78
21、0 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Non-Government publications. The following document(s) for
22、m a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. ELECTRONIC INDUSTRIES ALLIANCE (EIA) JESD-20 - Standard for Description of 54/74ACXXXX and 54/74ACTXXXX Advanced High-Speed CMOS Device
23、s. (Copies of this document is available online at www.eia.org/ or from the Electronics Industries Alliance, 2500 Wilson Boulevard, Arlington, VA 22201-3834). 2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawin
24、g takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specifi
25、ed herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN cl
26、ass level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlin
27、es. The case outlines shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.
28、5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. 3.2.6 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the prepar
29、ing and acquiring activity upon request. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 3.3 Elect
30、rical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test r
31、equirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages wher
32、e marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-P
33、RF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required i
34、n MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall
35、be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device
36、 classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535,
37、 appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects
38、this drawing. 3.9 Verification and review for device class M. For device class M, DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the re
39、viewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC
40、UIT DRAWING SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol VCCGroup A subgroups Limits 4/ Unit Test conditions 2/ 3/ -55C TC+125C +4.
41、5 V VCC +5.5 V unless otherwise specified Device type and device class Min Max Positive input clamp voltage 3022 VIC+For input under test, IIN= +1.0 mA All V 0.0 V 1 0.4 1.5 V Negative input clamp voltage 3022 VIC-For input under test, IIN= -1.0 mA All V Open 1 -0.4 -1.5 V All All 4.5 V 1, 2, 3 2.0
42、High level input voltage VIH5/ All All 5.5 V 1, 2, 3 2.0 V All All 4.5 V 1, 2, 3 0.8 Low level input voltage VIL5/ All All 5.5 V 1, 2, 3 0.8 V All All 4.5 V 1, 2, 3 4.4 VIH= 2.0 V or VIL= 0.8 V IOH= -50 A All All 5.5 V 1, 2, 3 5.4 All All 4.5 V 1, 2, 3 3.7 VIH= 2.0 V or VIL= 0.8 V IOH = -24 mA All A
43、ll 5.5 V 1, 2, 3 4.7 High level output voltage 3006 VOH6/ VIH= 2.0 V or VIL= 0.8 V IOH= -50 mA All All 5.5 V 1, 2, 3 3.85 V All All 4.5 V 1, 2, 3 0.10 VIH= 2.0 V or VIL= 0.8 V IOL= +50 A All All 5.5 V 1, 2, 3 0.10 All All 4.5 V 1, 2, 3 0.50 VIH= 2.0 V or VIL= 0.8 V IOL= +24 mA All All 5.5 V 1, 2, 3
44、0.50 Low level output voltage 3007 VOL6/ VIH= 2.0 V or VIL= 0.8 V IOL= +50 mA All All 5.5 V 1, 2, 3 1.65 V Input leakage current high 3010 IIHVIN= 5.5 V All All 5.5 V 1, 2, 3 1.0 A Input leakage current low 3009 IILVIN= 0.0 V All All 5.5 V 1, 2, 3 -1.0 A See footnote at end of table.Provided by IHSN
45、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90934 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test an
46、d MIL-STD-883 test method 1/ Symbol VCCGroup A subgroups Limits 4/ Unit Test conditions 2/ 3/ -55C TC+125C +4.5 V VCC +5.5 V unless otherwise specified Device type and device class Min Max All All 5.5 V 1, 2, 3 1.6 M, D All All 5.5 V 1 1.6 mA Quiescent supply current delta, TTL input levels 3005 ICC
47、7/ For input under test, VIN= VCC-2.1 V For all other inputs, VIN= VCC or GND P, L, R All All 5.5 V 1 3.5 mA All All 5.5 V 1, 2, 3 80.0 M, D 300.0 A D 1.0 Quiescent supply current outputs high 3005 ICCHVIN= VCCor GND IOUT= 0.0 A P, L, R All All 5.5 V 1 3.5 mA All All 5.5 V 1, 2, 3 80.0 M, D 300.0 A
48、D 1.0 Quiescent supply current outputs low 3005 ICCLVIN= VCCor GND IOUT= 0.0 A P, L, R All All 5.5 V 1 3.5 mA Input capacitance 3012 CINSee 4.4.1c TC= +25C All All GND 4 10.0 pF Power dissipation capacitance CPD8/ See 4.4.1c TC= +25C f = 1 MHz All All 5.0 V 4 40.0 pF 4.5 V 7, 8 L H Functional tests 3014 9/ See 4.4.1b VIN= VILor VIHVerify output VOUTAll All 5.5 V 7, 8 L H All All 4.5 V 9 1.0 9.0 ns Propagation delay time, CP to Qn 3003 tPHL, tPLH 10/ CL= 50 pF minimum RL= 500 See figure 4 All All 4.5 V 10, 11 1.0 10.0 ns See footnotes a
