1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing. 06-05-17 Raymond Monnin REV SHEET REV SHEET REV STATUS REV A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Michael C. Jones
2、 POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, LINEAR, +10 VOLT / +1 VOLT PRECISION VOLTAGE REFERENCE AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 94
3、-11-30 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-90943 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E386-05Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS,
4、 OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Numb
5、er (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 90943 01 H 3 X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.
6、2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device
7、type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 HC9172 +10 V / +1 V precision voltage reference 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All level
8、s are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level i
9、s intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Proc
10、ess Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with excepti
11、on(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Qu
12、ality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBU
13、S COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style 3 CQCC1-N28 28 Leadless chip carrier 1.2.5 Lead finish. The lead finis
14、h shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (+VCC) +20 V dc Output short circuit duration (TOS) Infinite Total power dissipation (PD), TA= +25C. 250 mW Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resista
15、nce, junction-to-case (JC). See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. Supply voltage (+VCC) +15 V dc Ambient operating temperature range (TA) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following speci
16、fication, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification fo
17、r. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies
18、 of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this
19、 drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. E
20、xtended operation at the maximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION
21、LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated i
22、n the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class
23、. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case
24、 outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specifie
25、d in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of devic
26、e(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
27、 herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data
28、 shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate
29、of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits de
30、livered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as d
31、escribed herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance c
32、haracteristics. Limits Test Symbol Conditions -55C TA +125C VIN= +15 V unless otherwise specified Group A subgroups Device type Min Max Unit RL= 5 k on +10 V output, TA= +25C 4 01 -3.5 +3.5 mV RL= 5 k on +10 V output, -55C TA -25C 6 01 -5.5 +5.5 mV RL= 5 k on +10 V output, -25C TA +85C 12 1/ 01 -3.5
33、 +3.5 mV +VR(10) RL= 5 k on +10 V output, +85C TA +125C 5 01 -5.5 +5.5 mV RL= 5 k on +10 V output, TA= +25C 4 01 -200 +200 V RL= 5 k on +10 V output, -55C TA -25C 6 01 -700 +700 V RL= 5 k on +10 V output, -25C TA +85C 12 1/ 01 -530 +530 V Output voltage errors +VR(1) RL= 5 k on +10 V output, +85C TA
34、 +125C 5 01 -700 +700 V VRL(10) (line) RL= 5 k on +10 V output, +13 V VIN +18 V 1,2,3 01 300 V/V Line regulation VRL(1) (line) RL= 5 k on +10 V output, +13 V VIN +18 V 1,2,3 01 30 V/V Load regulation VR(10) (load) 0 mA IL 10 mA, RL= 1 k on +10 V output, RL= infinity for +1 V output 1,2,3 01 50 V/mA
35、See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical
36、 performance characteristics- -Continued. Limits Test Symbol Conditions -55C TA +125C VIN= +15 V unless otherwise specified Group A subgroups Device type Min Max Unit IO(10) 1,2,3 01 10 mA Output current IO(1) 1,2,3 01 0.1 A enp-p (10) 0.1 Hz BW 10 Hz, RL= 5 k on +10 V output, TA= +25C 4 01 50 Vp-p
37、Output noise 2/ enp-p (1) 0.1 Hz BW 10 Hz, RL= infinity for +10 V output, TA= +25C 4 01 50 Vp-p Long term stability 2/ VR/VTTA= +25C, both +10 V and +1 V outputs 1 01 25 ppm/ 1000 hours Quiescent current IINRL= infinity for both +10 V and +1 V outputs 1,2,3 01 14 mA 1/ Subgroup 12 is a special subgr
38、oup added to the group A subgroups. 2/ Parameter is guaranteed to specified limits and shall be tested as part of device initial characterization and after design and/or process changes. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROC
39、IRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline 3 Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 +10 V sense -VIN(test poin
40、t) Ground Ground No connection No connection No connection No connection No connection +1 V output No connection No connection No connection +1 V output No connection No connection No connection VZ(test point) Ground +10 V output (high impedance) +10 V output (high impedance) No connection No connec
41、tion Ground +15 V supply +VIN(test point) +10 V force +10 V sense NOTES: 1. Ground pins 3, 4, 19, and 24 are not internally tied to each other. External connection must be made to each ground pin. 2. Pins 1, 27, and 28 must be tied together. FIGURE 1. Terminal connections. Provided by IHSNot for Res
42、aleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-90943 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subg
43、roups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 4, 5, 6, 12 Group A test requirements 1, 2, 3, 4, 5, 6, 12 Group C end-point electrical Parameters 1 End-point electrical parameters for Radiation Hardness Assurance (RH
44、A) devices Not applicable * PDA applies to subgroup 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Preseal burn-in test, method 1030 of MIL-STD-883. (1) Test condition C or D. The test circuit shall be maintained by the manufa
45、cturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1030 of MIL-STD
46、-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-
47、VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. c. In
48、terim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. Provided by IHSNot f
